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Escalab 250xi x ray photoelectron spectroscopy

Manufactured by Thermo Fisher Scientific
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The ESCALAB 250XI is an X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides high-resolution data on the chemical composition and electronic structure of materials. The system features advanced optics, a high-performance analyzer, and a versatile sample handling system to enable in-depth characterization of a wide range of samples.

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14 protocols using escalab 250xi x ray photoelectron spectroscopy

1

Hydrogel Microstructure and Composition Analysis

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The micro morphology observations of the hydrogels were conducted on a thermo APREO S(A5-112) high resolution scanning electron microscope (SEM) with an acceleration voltage of 5 kV. FTIR spectra were obtained via a Fourier transform infrared spectroscopy (ATR-FTIR, PerkinElmer Spectrum 3) scanned in the wavenumber range of 4000–450 cm−1 with 64 scans and a nominal resolution of 4 cm−1 at room temperature. The surface chemical composition of the hydrogels was analyzed via a Thermo ESCALAB 250XI X-ray photoelectron spectroscopy.
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2

Structural Characterization of N-PGO

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The functional groups of N-PGO were analyzed by a Nicolet 380 Fourier transform infrared spectroscopy (FTIR) (Thermo-Fisher Scientific, Waltham, MA, USA) and an ESCALAB 250Xi X-ray photoelectron spectroscopy (XPS) (Thermo-Fisher scientific, Waltham, MA, USA). The interlayer spacing was investigated by X-ray diffraction (XRD) (D/MAX 2500V, Rigaku Industrial Corporation, Takatsuki-shi, Osaka, Japan). The particle size was obtained by a nanosizer (Nano ZS90, Malvern Instruments, Malvern, UK). The morphologies of N-PGO were characterized by high-resolution transmission electron microscopy (HR-TEM), selected area electron diffraction (SAED), and energy-dispersive spectroscopy (EDS) on a JEOL 200CX transmission electron microscope (Akishima-shi, Tokyo, Japan).
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3

Comprehensive Nanoparticle Characterization

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The cross-section of films and the morphology of the particles were tested by scanning electron microscopy (FESEM, SU-70, Hitachi Ltd., Tokyo, Japan) and transmission electron microscopy (TEM, Tecnai G2 F20, FEI, Hillsboro, OR, USA). The crystal structure of nanoparticles and composites were performed by x-ray diffraction (XRD, EMPYREAN, PANalytical Co., Almelo, Netherlands). Escalab 250Xi x-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, Inc., Hampton, NH, USA) was used to measure the elemental composition of nanoparticles. A Perkin–Elmer DSC-7 analyzer (Perkin–Elmer, Waltham, MA, USA) at 80–180 °C (10 °C/min) was used to measure differential scanning calorimetry (DSC). The dielectric properties were obtained by Agilent 4294A LCR Meter (Agilent, Palo Alto, CA, USA) from 102–106 Hz. The DC breakdown was tested at room temperature under a direct-current voltage ramp of 400 V/s (CS2674AX, Nanjing Changsheng, Nanjing, China).
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4

Advanced Material Characterization Techniques

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TEM and HRTEM images were taken with
a JEM-2100F high-resolution transmission emission microscope (JEOL,
Japan). XRD spectrum was measured on a Bruker D-8 Advance Powder X-ray
diffractometer (Bruker, Germany). XPS spectra were taken with ESCALAB
250Xi X-ray photoelectron spectroscopy (Thermo Fisher Scientific).
FT-IR spectrum was recorded on a Thermo Nicolet iS10 spectrometer
(Thermo Fisher Scientific). Elemental analysis was carried out on
a Vario EL/Micro Cube organic element analyzer (Elementar Analysensysteme
GmbH, Germany). Magnetic property was recorded by using a VersaLab
Vibration Sample Magnetometer (Quantum Design). UV–vis absorption
spectra were recorded on a Shimadzu UV-3600 Plus UV–vis–NIR
spectrophotometer (Shimadzu, Japan). Fluorescence spectra were recorded
on a Thermo Scientific Lumina fluorescence spectrometer (Thermo Fisher
Scientific). Time-resolved fluorescence spectra were measured on a
Horiba Scientific QM-8075 high sensitivity steady-state transient
fluorescence spectrometer (HORIBA, Japan). ζ-Potential was recorded
on a Zetasizer Nano ZS (Malvern, U.K.). CV curves were obtained from
a Chenhua CHI-760E electrochemical workstation (Shanghai, China).
The pH values were mediated using a Sartorius PB-10 pH meter (Sartorius,
China).
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5

Comprehensive Polymer Characterization Protocol

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1H NMR spectra were recorded on a Bruker AVANCE III 400 MHz superconducting Fourier (Bruker, Billerica, MA, USA) in deuterium generation reagent with tetramethyl silane (TMS) as the internal standard for structure characterization of polymers. The number average molecular weight (Mn) was detected by gel permeation chromatography (GPC) (Waters 1515/2414, Waters, Milford, MA, USA), using THF as the mobile phase with a flow rate of 1.0 mL/min and polystyrene (PS) as the standard for calibration. The morphological characterization of the polymeric micelles was characterized with a HT7700 transmission electron microscopy (TEM, Hitachi, Japan). The sizes and zeta potential of the block polymers were measured by dynamic light scattering (DLS) with a Zeta PALS zeta potential and granularity analyzer (Brookhaven, New York, NY, USA). The fluorescence spectra were examined on a FluoroMax-4 fluorescence spectrometer (HORIBA Jobin Yvon, Clifton Park, NY, USA). UV–Vis spectra were performed on a UV2450 spectrophotometer (Shimadzu, Kyoto, Japan). The copper residues in the polymer were characterized by an Escalab 250Xi X-ray photoelectron spectroscopy (XPS, Thermo Fisher, West Sussex, UK).
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6

Comprehensive Structural and Magnetic Analysis

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Structure characterization of the as-synthesized samples was carried out on a Rigaku D/Max-2500 copper rotating-anode X-ray diffractometer (XRD) using CuKα radiation (40 kV, 200 mA). The Mössbauer spectrum was collected on a FAST Comtec Mössbauer system at room temperature, using a source of 57Co(Pd) and a conventional constant acceleration mode. The isomer shift and velocity were given relative to that of α-Fe and the spectrum was fitted with Lorentzian lines via the least square method. Detailed structure of the obtained samples were characterized by a JEOL JSM-7800F field-emission scanning electron microscopy (FESEM) at an acceleration voltage of 20 kV and a JEOL 2100 transmission electron microscope (TEM) operating at 200 kV. X-ray photoelectron spectrum was measured with Thermo Scientific ESCALAB 250Xi X-ray photoelectron spectroscopy (XPS). Magnetic properties were taken by a Quantum Design MPMS3 superconducting quantum interference device (SQUID) magnetometer. Ultraviolet-visible spectroscopy (UV-Vis) absorbance spectra were recorded on a Shimadzu UV 3600 spectrophotometer in the range of 350–800 nm.
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7

Comprehensive Nanomaterial Characterization Techniques

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Nicolet 710 FT-IR spectrometer (Thermo Nicolet, USA) was employed to analyze the FTIR results. The metal content was determined by IRIS Advantage OPTIMA 7000DV Inductively Coupled Plasma-Atomic Emission Spectrometer (Thermo PerkinElmer). The surface morphology observation, particle size measurement analysis, and scanning electron microscope images of the NPs were determined by SUPRA™ 55 Thermal Field Emission Scanning Electron Microscopy (Carl Zeiss, Germany). The transmission electron microscope images of NPs were studied by JEM-2100F Transmission Electron Microscopy (JEOL, Japan). X-ray diffraction studies were carried out on EMPYREAN X-ray diffractometer (PANalytical, Netherlands). Genesys 10S UV-Vis spectrometer (Thermo Fisher) was used for the ultra-violet and visible spectral analysis. For XPS analysis, Escalab 250xi X-ray photoelectron spectroscopy (Thermo, USA), and for DLS and Zeta potential analysis, NanoBrook Omni (Brookhaven Instruments, USA) were used.
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8

XPS Analysis of Huadian Oil Shale Kerogen

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XPS analysis
of the Huadian oil shale kerogen sample was performed
with ESCALAB 250XI X-ray photoelectron spectroscopy (Thermo Fisher
Scientific Inc.), equipped with a microfocusing monochromator and
a charge compensation system. The monochromatic Al Kα radiation
was used, which was operated at 150 W, and the spot size was 500 μm.
The correction for binding energy was made to account for kerogen
sample charging based on the carbon (1s) peak at 284.8 eV. Pass energies
of the survey and narrow spectra were fixed at 100 and 30 eV, respectively.
The oxygen species and corresponding contents can be calculated on
the basis of the XPS carbon (1s) signal of adjacent carbon atoms.
Four peaks at 284.8, 286.3, 287.5, and 289.0 eV were used to curve-resolve
the XPS carbon (1s) signal. Nitrogen forms and sulfur speciation in
the kerogen sample were defined and quantified referring to the parameters
reported by Kelemen et al.29 (link) These signals
were simultaneously curve-resolved using components with fixed binding
energy positions and the full width at half-maximum values.
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9

Comprehensive Characterization of Aerogels

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Fourier Transform infrared spectroscopy (FT-IR) analysis was performed on a Nicolet iS 10 spectrophotometer (Thermofisher Scientific, Waltham, MA, USA) with the scan range of 4000−400 cm−1. The surface morphologies and surface elements of the aerogels were characterized by using an S-3400N scanning electron microscopy (SEM, Hitachi, Tokyo, Japan) equipped energy dispersive X-ray spectroscopy (EDX) operated at 5.0 kV without sputtered Au. Thermogravimetric analyses (TGA, Netzsch, Bavaria, Germany) of the aerogels were carried out on a STA409PC thermogravimetry analyzer. Chemical compositions were evaluated by using an ESCALAB250Xi X-ray photoelectron spectroscopy (XPS, Thermofisher Scientific, Waltham, MA, USA). Water contact angle (WCA) was recorded on a contact angle meter (CV-705B, CVOK, Dongguan, China) using 2 μL of water.
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10

Comprehensive Characterization of Nanostructured Materials

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X-ray diffraction (XRD) analysis was implemented on a Shimadzu XRD-6000 diffractometer (Shimadzu, Shimadzu, Japan). High resolution transmission electron microscopy (HRTEM) characterization was completed on a JEM-2100F microscope (JEOL, Tokyo, Japan). The characterization of elements was carried out by a Thermo Scientific Escalab 250Xi X-ray photoelectron spectroscopy (Thermo, MMAS, USA). The UV–vis absorption spectra were tested on a UV-5500PC UV–visible spectrophotometer (Metash, Shanghai, China). F-4700 spectrophotometer was used to perform the fluorescence spectra (Hitachi, Tokyo, Japan). The zeta potential was estimated by NanoBrook Omni Brookhaven Instruments (BIC, Brookhaven, USA). The FT-IR characteristic measurement was carried out by L1600400 Spectrum Two infrared spectrometer (PerkinEImer, LIantrisant, UK). Electrochemical impedance spectroscopy (EIS) and cyclic voltammetry (CV) were carried out at the CHI 660E electrochemical workstation (Shanghai Chenhua Instrument, Shanghai, China).
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