Escalab 250xi x ray photoelectron spectroscopy
The ESCALAB 250XI is an X-ray photoelectron spectroscopy (XPS) instrument designed for surface analysis. It provides high-resolution data on the chemical composition and electronic structure of materials. The system features advanced optics, a high-performance analyzer, and a versatile sample handling system to enable in-depth characterization of a wide range of samples.
Lab products found in correlation
14 protocols using escalab 250xi x ray photoelectron spectroscopy
Hydrogel Microstructure and Composition Analysis
Structural Characterization of N-PGO
Comprehensive Nanoparticle Characterization
Advanced Material Characterization Techniques
a JEM-2100F high-resolution transmission emission microscope (JEOL,
Japan). XRD spectrum was measured on a Bruker D-8 Advance Powder X-ray
diffractometer (Bruker, Germany). XPS spectra were taken with ESCALAB
250Xi X-ray photoelectron spectroscopy (Thermo Fisher Scientific).
FT-IR spectrum was recorded on a Thermo Nicolet iS10 spectrometer
(Thermo Fisher Scientific). Elemental analysis was carried out on
a Vario EL/Micro Cube organic element analyzer (Elementar Analysensysteme
GmbH, Germany). Magnetic property was recorded by using a VersaLab
Vibration Sample Magnetometer (Quantum Design). UV–vis absorption
spectra were recorded on a Shimadzu UV-3600 Plus UV–vis–NIR
spectrophotometer (Shimadzu, Japan). Fluorescence spectra were recorded
on a Thermo Scientific Lumina fluorescence spectrometer (Thermo Fisher
Scientific). Time-resolved fluorescence spectra were measured on a
Horiba Scientific QM-8075 high sensitivity steady-state transient
fluorescence spectrometer (HORIBA, Japan). ζ-Potential was recorded
on a Zetasizer Nano ZS (Malvern, U.K.). CV curves were obtained from
a Chenhua CHI-760E electrochemical workstation (Shanghai, China).
The pH values were mediated using a Sartorius PB-10 pH meter (Sartorius,
China).
Comprehensive Polymer Characterization Protocol
Comprehensive Structural and Magnetic Analysis
Comprehensive Nanomaterial Characterization Techniques
XPS Analysis of Huadian Oil Shale Kerogen
of the Huadian oil shale kerogen sample was performed
with ESCALAB 250XI X-ray photoelectron spectroscopy (Thermo Fisher
Scientific Inc.), equipped with a microfocusing monochromator and
a charge compensation system. The monochromatic Al Kα radiation
was used, which was operated at 150 W, and the spot size was 500 μm.
The correction for binding energy was made to account for kerogen
sample charging based on the carbon (1s) peak at 284.8 eV. Pass energies
of the survey and narrow spectra were fixed at 100 and 30 eV, respectively.
The oxygen species and corresponding contents can be calculated on
the basis of the XPS carbon (1s) signal of adjacent carbon atoms.
Four peaks at 284.8, 286.3, 287.5, and 289.0 eV were used to curve-resolve
the XPS carbon (1s) signal. Nitrogen forms and sulfur speciation in
the kerogen sample were defined and quantified referring to the parameters
reported by Kelemen et al.29 (link) These signals
were simultaneously curve-resolved using components with fixed binding
energy positions and the full width at half-maximum values.
Comprehensive Characterization of Aerogels
Comprehensive Characterization of Nanostructured Materials
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