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Mfp 3d

Manufactured by Bruker
Sourced in United States

The MFP-3D is a high-resolution atomic force microscope (AFM) designed for advanced surface characterization. It offers precise and accurate measurements of surface topography, mechanical properties, and other material characteristics at the nanoscale level. The MFP-3D provides a versatile platform for a wide range of applications in materials science, biology, and nanotechnology research.

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7 protocols using mfp 3d

1

Time-lapse Imaging of Protein Aggregation

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Time-lapse imaging was carried out in Asylum MFP3D instrument using the MSNL probe (Bruker Corporation). First the functionalized mica surface was imaged in 10 mM sodium phosphate buffer (pH 7.0) to obtain a clean surface, then the desired amount of protein solution was added (100 nM) and imaging was carried out. On-surface aggregation was monitored by scanning the surface at one hour time intervals. The results shown in Supplementary Fig. 6B have been obtained using Nanoscope Multimode VIII system (Bruker, Santa Barbara, CA) in Peakforce mode. A small droplet of 10 nM alpha-synuclein was created under the fluid cell, then the cell was inserted into scanner head and imaging was being continued after proper alignment of the laser. The imaging was continued in the same area to monitor the changes in morphology of the aggregates.
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2

Characterization of BSO-based FTJs

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The TEM images of the BSO-based FTJs were obtained by scanning the specimens using the Titan G2 60–300 instrument, where the specimens were prepared by a focused ion beam tool (FEI Helios NanoLab 600i) operated at the voltage of 2–30 kV. The polarization−electric field (P − E) loops were measured using the ferroelectric measurement system (aixACCT TF-Analyzer 3000) at the frequency of 0.01 − 1 MHz. Atomic force microscopy machines from both Asylum Research (MFP3D) and Bruker (Dimension Icon) were used to obtain the piezoresponse force microscopy images. The box-in-box patterns were written on the BSO film by applying the voltage of +7 V or −7 V to the corresponding regions, respectively. The X-ray diffraction (XRD) pattern of the BSO film was collected by an X-ray diffractometer (PW 3040-X’Pert Pro, PANalytical, Cu Kα, λ = 1.54 Å).
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3

Supported Lipid Bilayer Imaging by Liquid AFM

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Liquid AFM was performed on an Asylum MFP-3D or Bruker Dimension Icon. In the former, the as provided fluid-cell light was utilised with an 18 mm glass backing to allow for inverted microscopy. The cantilever (DNP-10) was calibrated against a bare glass substrate before sample imaging. The samples were imaged in AC mode, maintaining a maximal setpoint to reduce force during imaging. In the latter, a home-built fluid chamber was constructed atop of a silicon wafer. The cantilever (ScanAsyst-Fluid+) was calibrated against a bare glass substrate in water phase before sample imaging. The samples were imaged in peak force mode with quantitative nanomechanical mapping (PF-QNM). In both cases, the supported lipid bilayers were formed by mimicking the solvent exchange process manually with micropipettes.
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4

AFM Characterization of EV Subpopulations

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Resuspended HPA‐derived EVs from the 2000, 10,000, 100,000, and 167,000 × g centrifugation were further characterized using atomic force microscopy. Uniform concentrations of particles were added to 500 μM 1‐(3‐aminopropyl) silatrane (APS) mica and allowed to incubate for 20 min at room temperature with a wet cap. The sample surface was then washed with 200 μL of filtered 1× PBS solution and imaged using Asylum Research MFP3D (Santa Barbara, CA, USA) in tapping mode utilizing MSNL “E” cantilevers (Bruker Corporation, Billerica, MA) at a spring constant of 0.1 N/m.
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5

Polarization Hysteresis and PFM Characterization

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Room temperature polarization hysteresis loops were obtained by Radiant Precision Premier LC II, in air at measurement frequencies of 5, 10, and 20 kHz. PFM was conducted using Asylum Research MFP-3D and Bruker Multimode 8 atomic force microscopes equipped with a conductive cantilever having a spring constant of 2 N/m. The PFM mappings were obtained with a 400-mV ac voltage excitation. A dc voltage was superimposed to switch the polarization. The square wave output, 2 V and 41 kHz, of a conductive AFM tip (MESP-RC, Co/Cr coating, 35-nm tip radius) was used to observe phase and amplitude variations.
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6

Polycrystalline Film Characterization

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Post-deposition atomic force microscopy (Asylum MFP-3D) and X-ray diffraction (Bruker D8 Discover) was used to confirm that the films are polycrystalline with (111) orientation in all cases.
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7

Characterization of Bi2Se3 Nanostructures

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Morphology, thickness, structure and composition of obtained Bi2Se3 nanostructures and nanostructured layers were inspected using field emission scanning electron microscope (SEM) Hitachi S-4800 equipped with an energy-dispersive X-ray (EDX) analyser Bruker XFLASH 5010 and atomic force microscopes Asylum Research MFP-3D and Bruker Dimension ICON.
For the statistical analysis, 5 to 9 AFM scans of size 20 × 20 μm each were obtained at different locations on the sample. The number of measured nanoplates was 110–150 for each type of the substrate with an exclusion of exfoliated graphene substrate. Due to the technical difficulties, 6 nanoplates were measured on the surface of exfoliated graphene.
XRD characterization of the thin films was performed by a Philips X’Pert MRD with a Cu Kα radiation source.
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