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Mpc 3100

Manufactured by Shimadzu
Sourced in Japan

The MPC-3100 is a mass spectrometer produced by Shimadzu. It is designed for use in analytical laboratories. The MPC-3100 is capable of performing mass analysis of various chemical compounds.

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7 protocols using mpc 3100

1

Comprehensive Characterization of Materials

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Powder X-ray diffraction (XRD) patterns were created with RigakuUltima VI diffractometer using Cu-Kα radiation. Fourier transform infrared spectra (FT-IR) were recorded on Perkin Elmer Frontier spectrometer. Scanning electron microscopy (SEM) was analyzed by means of a JEM-6701F and equipped with an Oxford INCA PentaFET-x3 EDS system. Thermogravimetric analysis (TG) was performed by NETZSCH STA 409PC. Photoluminescence (PL) spectra were analyzed using a PerkinElmer LS55 fluorescence spectrophotometer for solid samples. UV-vis diffuse reflectance spectroscopy was analyzed using a Shimadzu UV-3600 with MPC-3100. X-ray photoelectron spectroscopy (XPS) was performed with Thermo Scientific ESCALAB 250Xi XPS. N2 adsorption-desorption isotherms were operated on V-Sorb 2800TP.
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2

Optical Transmission Measurements

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The layer, solution, and glass transmissions were measured using a Shimadzu MPC-3100. The layer transmission was measured using an empty glass substrate as reference.
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3

Comprehensive Characterization of SnS2 Exfoliated Flakes

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The phases of the crystals were characterized by X-ray diffraction (XRD) on a Rigaku Miniflex 600x powder diffractometer. XPS measurements were performed using a Thermo ESCALAB 250XI X-ray photoelectron spectrometer. The thicknesses of the exfoliated SnS2 samples were measured by atomic force microscopy (AFM, Agilent 5500). A home-built Raman spectroscope/microscope (iHR320, Horiba) was utilized to acquire Raman spectra and spatially resolved Raman maps with an incident laser of 532 nm while employing a 405 nm light for photoluminescence (PL) measurements. A transmission electron microscope (TEM, JEM-2100F) was employed to evaluate the morphologies and crystal structure of thin SnS2 flakes. The UV-vis spectrum was measured using a spectrophotometer (MPC-3100, Shimadzu).
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4

Comprehensive Optical Characterization of Samples

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To characterize the total spectral absorptions of our samples, we carried out absolute hemispherical measurements using a ultraviolet–visible–near-infrared spectrophotometer system (UV3600, Shimadzu Scientific Instruments) with a 60-mm diameter integrating sphere (MPC-3100) by scanning a monochromator coupled to a halogen lamp. The reflected (transmitted) beam including both specular and diffuse reflections (transmissions) from the sample were scattered and collected in an integrating sphere and measured using a photomultiplier tube detector. The reflection was normalized to a BaSO4 reference. From Kirchhoff's law, the sample's total absorption can be obtained as A=1−(T+R), using the measured total reflection/transmission, including both specular and diffuse reflections/transmissions. Infrared spectra were collected by FTIR spectrometer (Bruker IFS-66/S), which combined with a × 15 cassegrain objective lens (NA=0.58). Spectra were acquired in the 4,000–600 cm−1 range with a resolution of 0.1 cm−1 and calibrated with a gold mirror reference (ref. 41 (link)).
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5

Optical Characterization of Aerogels

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To measure the transmittance and reflectance of the aerogels in the wavelength range of 300–1,000 nm, we used a ultraviolet–visble–NIR spectrometer (UV3600, Shimadzu Scientific Instruments) with a 60-mm-diameter integrating sphere (MPC-3100) by scanning a monochromator coupled to a halogen lamp. The transmitted and reflected light from the aerogels was scattered and collected in an integrating sphere and then detected with a photomultiplier tube. Using an integrating sphere, we can thoroughly measure the total reflectance R(λ) (transmittance (T(λ)) spectra of aerogels with scattering from ∼60 nm nanopores, including both diffuse and specular reflections (transmissions). For the measurement of the reflection/transmission spectra, we mounted the samples at an oblique incidence angle (8°) with respect to the normal at the rear/front of an integrating sphere.
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6

Hierarchical LIPSS Reflectance Spectrum

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The reflectance and absorption spectrum of the untreated surface and prepared hierarchical LIPSS were recorded by a UV-vis-NIR (Ultraviolet-Visible-Near Infrared) spectrophotometer (UV3600, Shimadzu Scientific Instruments, Kyoto, Japan) with an integrating sphere (MPC-3100) in the wavelength range from 250 to 700 nm.
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7

Measuring Aerogel Attenuation Coefficients

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To characterize the attenuation coefficient of the aerogels, we measured the total spectral transmittance of aerogels with various thicknesses as described in Supplementary Fig. 2. We used a ultraviolet–visble–NIR spectrometer (UV3600, Shimadzu Scientific Instruments) with a 60-mm-diameter integrating sphere (MPC-3100). Supplementary Fig. 2a presents the transmittance of the aerogels in the wavelength range of 400–850 nm with thicknesses of 2.4, 3.0, 4.2, 4.8, 5.9, 6.9, 7.2 and 7.6 mm. The transmittance reduction during light propagation is lower at longer wavelengths. This results in a smaller attenuation coefficient at longer wavelengths; consequently, red light can propagate for longer distances in the aerogels compared with light at shorter wavelengths (Supplementary Fig. 2b). Figure 2c shows the attenuation in the aerogels as a function of the propagation length (the thickness of aerogels) on a semi-logarithmic scale at wavelengths of 633, 589, 523 and 473 nm. The attenuation for an averaged transmittance in the visible spectrum from 400 to 700 nm is also plotted. The slope of the fit gives an estimate of the attenuation coefficient (in mm−1) of each wavelength; the results are summarized in Supplementary Table 1.
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