The PSD of the MgSt brands was measured using laser diffraction in dry dispersion mode at a dispersion pressure of 0.5 bars. The cumulative undersized particle parameters d10 (μm), d50 (μm) and d90 (μm) were calculated. Morphological evaluation of the studied MgSt brands was conducted using scanning electron microscopy (SEM). The SSA of the studied MgSt brands was determined by nitrogen adsorption using the Brunauer-Emmett-Teller (BET) method. Samples of approximately 1 g were dispensed into 3/8” OD sample tubes and prior to analysis, the tubes were outgassed using a VacPrep 061 (Micromeritics, USA) outgassing unit under vacuum at ambient temperature for a minimum of 15 h. Experiments were conducted using a Tristar 3030 instrument (Micromeritics, USA). For each sample tube, specific surface area was calculated from a linear fit of the adsorption isotherm in a relative pressure range of 0.05–0.30 Pa. Three samples tubes were tested for each brand of MgSt and the reported results are the mean values of triplicate determinations [40 ].
Tristar 3030
Manufactured by Micromeritics
Sourced in United States
The Tristar 3030 is a surface area and porosity analyzer that utilizes nitrogen adsorption to measure the specific surface area and pore size distribution of solid materials. It is designed to provide accurate and reliable data for a wide range of materials, including catalysts, adsorbents, and fine powders.
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Lab products found in correlation
Vacprep 061, by Micromeritics (1 mentions)
Auriga crossbeam workstation, by Zeiss (1 mentions)
Dimension icon spm, by Bruker (1 mentions)
Nova nanosem 450, by Thermo Fisher Scientific (1 mentions)
Jem arm300f2, by JEOL (1 mentions)
Escalab 250i, by Thermo Fisher Scientific (1 mentions)
Jed 2300, by JEOL (1 mentions)
D8 advance diffractometer, by Bruker (1 mentions)
Uv 2600 spectrometer, by Shimadzu (1 mentions)
Tensor 27, by Bruker (1 mentions)
S 4800, by Hitachi (1 mentions)
5 protocols using tristar 3030
1
Comprehensive Magnesium Stearate Characterization
2
Multi-Technique Materials Characterization
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SEM characterization was carried out on the FEI Nova NanoSEM 450 FESEM at 5 kV. XRD was conducted on a Bruker D8 Thin‐Film XRD with Cu Kα radiation (λ = 1.54056 Å) with a step interval of 2° min−1. Focused ion beam processing and image collection were performed with Carl Zeiss AURIGA® CrossBeam® Workstation. Atomic force microscopy results were collected from a Bruker Dimension ICON SPM with tapping mode. Theta optical tensiometer was used to measure the contact angle. Micromeritics Tristar 3030 was utilized for porosity analysis.
3
Comprehensive Characterization of Li-HVDG
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The morphology and structure of the samples were characterized using a scanning electron microscope (FEI Nova NanoSEM 450, 15 kV) and an aberration-corrected transmission electron microscope (JEOL JEM-ARM300F2, 60 kV). The cross-sectional SEM images of Li-HVDG were collected with a Helios focused ion beam SEM instrument (FEI Helios G4 PFIB UXe DualBeam system) with 2.5-μA Xe plasma FIB ion beam. The cross-sectional milling process was started by coating a Pt layer on the Li-HVDG and performed step by step at a voltage of 30 kV. The final polishing process was carried out at a voltage of 3 kV. XRD was conducted on a D8 (Bruker) Thin-Film XRD with Cu Kα radiation (λ = 1.54056 Å). Specific surface area was measured using a Micromeritics TriStar 3030 instrument using the nitrogen physisorption technique at −195.8°C. Before analysis, the samples were degassed at 150°C for 3 hours under vacuum. XPS analysis was performed using a Thermo ESCALAB250i instrument with Al Kα radiation (15 kV, 150 W). ToF-SIMS (ION-TOF TOFSIMS 5) was performed using a bismuth cluster analysis beam (30 keV). Raman measurements were performed using a Renishaw inVia 2 Raman Microscope with an excitation wavelength of 633 nm.
4
Comprehensive Characterization of UiO-66 and UiO-66/g-C3N4
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X-ray diffraction (XRD) of the UiO-66 and UiO-66/g-C3N4 samples was performed on a D8 Advance diffractometer (Bruker, Germany) with CuKα as the radiation source (λ = 0.154 06 nm and a 2θ range of 2–50°). The morphology of the UiO-66 and UiO-66/g-C3N4 samples was characterized by scanning electron microscopy (SEM) and transmission electron microscopy (TEM) on Hitachi S4700 and Leica LEO 906E instruments, respectively. Energy-dispersive X-ray spectroscopy (EDS) was used to determine the composition of the elements in the UiO-66/g-C3N4 sample on a JEOL JED-2300 instrument. The elemental components were analyzed using a Thermo VG RSCAKAB 250× high-resolution X-ray photoelectron spectrometer (XPS). Surface area (SBET), total pore volume (Vpore), and mean Barrett–Joyner–Halenda (BJH) pore diameter were analyzed on a Tristar-3030 instrument (Micromeritics-USA) with N2 adsorbed at −196 °C. The UiO-66 and UiO-66/g-C3N4 samples were degassed with N2 gas at 150 °C for 12 h before measuring N2 adsorption. The surface functional groups of the UiO-66 and UiO-66/g-C3N4 samples were analyzed on a Nicolet Nexus 670 Fourier-transform infrared (FT-IR) spectrometer. UV-vis absorption spectra, UV-vis diffuse reflectance spectra (UV-vis DRS), and photoluminescence (PL) spectra were acquired using a Shimadzu UV-2600 spectrometer, a Shimadzu UV-3100 spectrometer, and Varian, respectively.
5
Biochar Characterization by Advanced Techniques
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The morphology of the biochar was examined by scanning electron microscopy (SEM, Hitachi S-4800), operated at an accelerating voltage of 15 kV. An energy dispersive X-ray (EDX) spectroscopy attachment in the SEM was used to determine the chemical composition. The pore volume and speci c surface area of the biochar were measured by Brunauer-Emmett-Teller (BET) analysis (Tristar-3030, Micromeritics-USA) using nitrogen adsorption/desorption isotherms at 77 K. The pore size distribution of the biochar was estimated through the Barrett-Joyner-Halenda (BJH) technique. The functional groups of biochar were analyzed by an FT-IR spectrometer (Bruker-Tensor 27) using KBr at room temperature in a wavenumber range from 4000 to 400 cm -1 . Thermogravimetric analysis (TGA) and differential scanning calorimetry (DSC) were conducted in a Labsys Evo thermogravimetric analyzer under N 2 heated over a temperature range from room temperature (RT) to 800°C at a scanning rate of 10°C min - 1 .
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