X pert pro mrd

XRD measurements were performed on a Materials Research Diffractometer (MRD; Malvern PANalytical Xpert Pro MRD, Malvern PANalytical). The diffractometer had a horizontal omega-2theta goniometer (320 mm radius) in a four-circle geometry and it worked with a ceramic X-ray tube with a Cu Kα anode (l = 1.540598 Å). The detector used was the Pixel, a fast X-ray detector based on Medipix2 technology. Incident optics used included: a parabolic mirror; a divergent slit, 1/ 4°; a mask, 2 mm; Soller slits, 0.04 rad; and a Ni filter (0.02 mm). Diffracted optics used included: the Pixel detector and an antiscatter slit, 7.5 mm. The measurements were performed using the scanning mode of the detector. Measurement conditions: 2theta range = 10-50°; step size = 0.03°; and counting time (time per step) = 500 s.

BisBAL nanoparticles were synthesized and characterized as early was described in previous publications 15) . Briefly, bismuth (Bis) was mixed with 2,3-dimercapto-1-propanol (BAL) in a molar ratio 2:1 and the resultant composite BisBAL was reduced by sodium borohydride to generate BisBAL NPs. The stock suspensions of 25 mM of BisBAL NPs in 10 mL batches were prepared and stored at 4ºC until use. Information on the shape and size of nanoparticles was obtained using scanning electron microscopy (SEM; FEI Tecnai G2 Twin, FEI, Hillsboro, OR, USA; 160 kV accelerating voltage). The rhombohedral crystallinity and crystallite size were determined using the X-ray diffractometer (XRD; X'Pert PRO MRD PANalytical, Lelyweg, The Netherlands) equipped with Cu Kα as X-ray source (λ=1.541874 Å). Diffractograms were interpreted using the Debye-Sherrer formula (X'Pert Data Viewer software PANalytical, Lelyweg, The Netherlands) to estimate the rhombohedral structure and crystallite size.

Grazing incidence X-ray diffraction (GI-XRD) was employed to determine the crystalline phases of the MoS 2 thin films. The XRD analysis was performed on a Panalytical X'Pert PRO MRD employing Cu Kα (1.54 Å) radiation with an incidence angle of 0.5°with respect to the substrate plane. Furthermore, Raman spectroscopy (RS) and photoluminescence (PL) spectroscopy measurements were performed with a Renishaw Raman microscope equipped with a 514 nm laser, integrated switchable gratings with 600 or 1800 lines per mm, and a CCD detector. For each scan, 5 accumulations with acquisition time of 10 s were taken. The surface morphology was studied by scanning electron microscopy (SEM) using a ZeissSigma Nanolab operating at an acceleration voltage of 2 kV. Additionally, atomic force microscopy (AFM) was also employed to study the surface topology of the as-deposited films. The images were acquired at room temperature on Veeco dimension 3100 operated in tapping mode using Al coated Si tip (PointProbe Plus-NCHR) having a radius <7 nm. Images were processed in Gwyddion software with OpenGL interface and RMS roughness was obtained statistically from a scan area of 500 × 500 nm 2 .