MoS2 flakes were mechanically exfoliated from bulk MoS2 crystals (HQ graphene) onto 300 nm c‐SiNx (Cornell), 300 nm SiO2 (Nova), and 300 nm smooth SiNx (SVM) substrates. Standard electron‐beam lithography (FEI nano SEM 230) was used to pattern the contacts in a Hall bar structure, followed by thermal evaporation (Kurt J. Lesker, Nano36) of 80 nm gold as electrodes. The electrical characterization, Hall effect measurements, and the magnetotransport were all measured using a Physical Property Measurement System (PPMS, Quantum Design). The devices were mounted on a chip carrier using conductive silver paint. Aluminium wires (with diameter ≈25 µm) were then used to connect the patterned electrode‐pads to the pins on the chip carrier, which was completed using a grounded wire‐bonder setup (F&K Delvotec Model).
Nanosem 230
Manufactured by Thermo Fisher Scientific
Sourced in United States
The NanoSEM 230 is a scanning electron microscope (SEM) designed for high-resolution imaging of nano-scale samples. It features a field emission electron gun, which provides a stable and high-brightness electron beam for superior image quality. The NanoSEM 230 is capable of achieving resolution down to 1 nanometer, enabling detailed observation and analysis of small-scale structures and features.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Physical property measurement system (ppms), by Quantum Design (1 mentions)
Jem 2200fs, by Bruker (1 mentions)
Icon3, by Bruker (1 mentions)
Spectrum two, by PerkinElmer (1 mentions)
Nova nanosem 230, by Thermo Fisher Scientific (1 mentions)
X pert pro mpd x ray diffractometer, by Philips (1 mentions)
Tecnai gx f20 s twin, by Thermo Fisher Scientific (1 mentions)
Tecnai g2 f20 s twin, by Thermo Fisher Scientific (1 mentions)
Axis ultra dld photoelectron spectrometer, by Shimadzu (1 mentions)
Ols5000, by Olympus (1 mentions)
Tm3000, by Hitachi (1 mentions)
11 protocols using nanosem 230
1
Fabrication and Characterization of MoS2 Flakes
2
Nanostructure Elemental Analysis
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The energy-dispersive x-ray (EDX) spectroscopy measurements were performed on a nanoSEM 230 (FEI).
3
Characterization of MXene@PI Composites
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Scanning electron microscopy (SEM, FEI NanoSEM 230), transmission electron microscopy (TEM, JEOL JEM2200fS) and atomic force microscopy (AFM, Bruker ICON3) were employed to characterize the morphology and microstructure. A drop shape analyzer (DSA 30, Krüss, Germany) was utilized to measure the water contact angles (CA). A FTIR spectrometer (PerkinElmer Spectrum Two) with an attenuated total reflection accessory was used to perform the FTIR measurements. The resistances (R) were measured in a four-probe method by a Keithley 4200 electrometer so as to calculate the electrical conductivity (δ). EMI SE in the frequency range of 8.2–12.4 GHz (X-band) was measured by a vector network analyzer (Agilent 8517A) in the waveguide method. More than three specimens were tested for each component. The S-parameters were recorded and used to calculate the SET, SER, and SEA. To evaluate the electrothermal performance, various DC voltages were applied to the 10L MXene@PI composite foams using a DC-regulated power supply. The temperature of the sample was measured by a digital thermometer (UT325) with its T-type thermocouple contacting the surface of the sample. The electromechanical response of the composite foams was obtained by measuring the resistance change using the Keithley 4200-SCS electrometer in a two-probe method.
4
SEM Imaging of Cellulose Nanoparticles
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The cellulose nanoparticles
were imaged with a NanoSEM 230 (FEI) SEM at a distance of 10 mm and
an accelerating voltage of 5 kV. The samples were prepared by evaporating
the acetone from the suspension in a 60 °C oven. The dried powders
were sprinkled on a carbon tape stuck to aluminum sample holders.
A 7 nm layer of platinum was sputtered on the samples as conductive
layer. The samples were stored under vacuum in a desiccator before
imaging.
were imaged with a NanoSEM 230 (FEI) SEM at a distance of 10 mm and
an accelerating voltage of 5 kV. The samples were prepared by evaporating
the acetone from the suspension in a 60 °C oven. The dried powders
were sprinkled on a carbon tape stuck to aluminum sample holders.
A 7 nm layer of platinum was sputtered on the samples as conductive
layer. The samples were stored under vacuum in a desiccator before
imaging.
5
Thermogravimetric and Structural Analysis of CNTs/MnOx Hybrid Nanofibers
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Thermogravimetric analysis (TGA) of the as-prepared CNTs/MnOx-Carbon hybrid nanofibers and CNTs/MnOx hybrid nanofibers was carried out with a TGA/DSC1 type instrument (STA449C NETZSCH, German) with a heating rate of 5 °Cmin−1 from 35 to 700 °C in air. The phase of the products was examined with an X’ Pert Pro MPD X-ray diffractometer with Cu Kα radiation (λ = 1.5418 Å, Philips, Holland). The morphology of these nanomaterials was evaluated with a NanoSEM 230 field emission scanning electron microscope (FE-SEM, Nova NanoSEM 230, FEI, USA) and a Tecnai G2F20 S-TWIN transmission electron microscope (TEM, Tecnai GX F20 S-TWIN, FEI, USA). The X-ray photoelectron spectroscopy (XPS) experiments were carried out on a VG Scientific ESCALAB 250 instrument (XPS, ESCALAB 250, Thermo Scientific, America) by using aluminum Kα X-ray radiation during XPS analysis.
6
SEM Analysis of Fractured Specimens
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The fractured specimens were selected for examination with by SEM (NOVA NanoSEM 230, FEI, USA). The representative morphology of the crown surface of the fractured specimens was sputtered with a gold-palladium alloy by an ion sputtering equipment (Emitech K550X, Quorum, Britain) to form a conductive layer and examined by SEM with an acceleration voltage of 5 kV.
7
Characterization of Xylem Vessel Morphology and GO Attachment in Plant Stems
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After 6 days of treatment, small sections of 1–2 cm from the bottom of the flower stems of each treatment were observed by using a stereomicroscope. Some other stem segments were first frozen in liquid nitrogen for half an hour and then freeze-dried with a lyophilizer (Telstar, Lyoqlest-85, Spain). The stem segments were sputter-coated (Emitech K550X, UK) and then observed using SEM (FEI Nova NanoSEM 230, USA) to characterize the morphology of the incised xylem vessels of the samples from each group. Afterward, the surfaces of the freeze-dried stem segments, which contacted the treatment solutions directly, from the C and C+GO groups were analyzed using an FTIR spectroscope (Nicolet iS50, USA) to characterize the special peak of the GO attached on the surface of the stem ends, with a wavenumber range from 500 to 4000 cm−1. The surfaces of the freeze-dried stem segments, which contacted the treatment solutions indirectly, from the L and L+GO groups were examined using XPS (Axis-Ultra-Dld, U.K.) to analyze the redox state of the GO attached to the inner surface of the xylem vessels.
8
Nanoparticle Surface Characterization by SEM
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The surface morphology of the nanoparticles prepared was examined using Scanning Electron Microscopy (SEM). The analysis was performed on a NanoSEM 230 (FEI Company, Hillsboro, OR, USA) equipped with an Everhart-Thornley Detector (ETD) and a Through Lens Detector (TLD). In order to secure conductivity of the surface for clear imaging, gold sputtering was applied with a nominal thickness of 7 nm using an EMS 550X Sputter Coater (Hatfield, PA, USA).
9
Characterization of Reactor Sludge Morphology
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The morphology and microstructure of reactor sludge were characterized by scanning electron microscope (SEM). Mixed liquor samples (20 mL) taken from the reactors were washed three times and pelleted with 0.1-M phosphate buffer saline (PBS; pH 7.4) by centrifugation (2,000 g, 10 min), after which they were fixed with 2.5% (w/v) glutaraldehyde in 0.1-M PBS (pH 7.4) at 4°C for 4 h. The fixed pellet was washed by centrifugation in the same manner as above, followed by serial dehydration in 50, 70, 90 and 100% (v/v) ethanol solutions (15 min each) and air-drying. The prepared specimen was loaded on an SEM stub with carbon tape, sputter-coated with platinum and characterised using a field-emission SEM system (NanoSEM 230, FEI, USA).
10
Scanning Electron Microscopy of Frozen Surimi Gels
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Microstructure of the frozen surimi and gels was obtained by scanning electron microscopy (SEM). Samples were cut into slices with a thickness of 2–3 mm, soaked with 3% glutaraldehyde solution and then washed in distilled water for 1 hour prior to being dehydrated with ethanol. Dried samples were placed on a bronze stub and sputter-coated with gold for observation by a scanning electron microscope (Nova NanoSEM 230, FEI, USA) at an acceleration voltage of 5 kV30 (link).
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