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48 protocols using d8 advance x ray

1

Structural and Electrochemical Analysis

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With a rotating anode X-ray generator operating at Cu–K monochromatic radiation (=1.5418), a Bruker D8 Advance X-ray diffractometer (XRD) was used to evaluate the phase structures and crystalline size of the samples as-prepared. Thermo Scientific's XPS (VG Multilab 2000-Thermo Scientific, USA, K-Alpha), which can withstand high photonic energies of 0.1 to 3 keV, was used to gather the X-ray photoelectron spectra (XPS). The FT-IR-6600 spectrometer, manufactured by the Bruker business, was used to record FT-IR spectra. The spectrum was obtained using KBr, and the data was stored on an IFS 66V/S. Particle size and charge on material studied by using Litesizer 500 particle analyzer made by Anton Parr. All the electrochemical experiments were performed with (Autolab Metrohm PGSTAT 302N). All electrochemical experiments are performed with three eletrode systems glassy carbon electrodes (GCE), C110 of 3 mm diameter GCE used as working electrode or modified electrode, a counter electrode (Pt) and a reference electrode Ag/AgCl (in saturated KCl solution). All potentials in this paper were measured and reported versus Ag/AgCl. It is worth mentioning that in this study, and all experiments were carried out at laboratory temperature.
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2

X-ray Diffraction Analysis of Pure Drugs and MSNs

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X-ray diffraction analysis for pure drugs and MSNs loaded with EN-TA was performed using D8 advance X-ray (Bruker AXS, Madison, WI, United States) at 40 mA current using 40kV voltage. The sample was exposed by Cu-Ka generated monochromatic X-rays at the diffraction range (2θ) from 0 to 70o at a speed of 20 s/min (Katiyar et al., 2016 (link)).
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3

Comprehensive Material Characterization Protocol

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XPS measurements were performed with a Thermo Scientific 250Xi system with monochromatic Al Kα as the excitation source. The XRD patterns were recorded with a Bruker D8 Advance X-ray diffractometer with Cu Kα radiation (λ = 1.5406 Å) operated at 40 kV and 40 mA. The BET tests were performed by an ASAP 2460 with N2 analysis adsorptive at 77.2 K. SEM images were taken using a Hitachi SU-8010 microscope equipped with EDS at 30 kV. TEM images were taken using a Hitachi 7650 microscope operated at 100 kV. UV-DRS spectra was taken with a Shimadzu UV-3600 with a resolution of 0.1 nm. The ICP-MS measurement was performed with a NexION 300X (detection limit 1 μg/L).
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4

Structural Analysis of PEO-Fibroin Scaffolds

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With the aim of observing the functional groups of PEO and fibroin incorporated in the matrices, the electrospun scaffolds were measured by attenuated total reflectance Fourier-transform infrared (ATR-FTIR) spectroscopy (VARIAN 640-IR, Varian Inc., Palo Alto, CA, USA). X-ray diffraction was performed using D8 Advance x-ray (Bruker, Billerica, MA, USA) diffractometer with a copper source (1.541 Å).
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5

Characterization of Fe3O4/ZnO Core-Shell Nanostructures

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The crystalline structure of core/shell nanostructured Fe3O4/ZnO was characterized by X-ray diffraction (XRD) by using a Bruker D8 Advance X-ray diffractometer with Cu-Kα radiation (k = 1.5406 Å) at 2θ range of 10–70°. The X'pert Highscore Plus program was carried out to evaluate the grain size of the MNPs. The morphological characteristics, shape, and size of the MNPs and the core/shell nanostructure were observed through field emission scanning electron microscopy (FESEM; Hitachi S-4800) equipped with an energy dispersive X-ray spectrometer, and high-resolution transmission electron microscope (JEM 2100, JEOL). Fourier transform infrared (FTIR) spectroscopy (FTIR-GBC Cintra 40 Nicolet Nexus 670 FTIR), Raman spectra (XploRA, Horiba) and X-ray photoelectron spectroscopy measurement (Mutilab-2000 spectrometer with an Al Kα monochromatized source) were carried out to investigate the interaction between the Fe3O4 MNP core and ZnO shell. The optical properties of samples were characterized by UV-vis-NIR absorption spectroscopy (Hitachi U-4100) and HR photoluminescence system (IHR 500, Jobin Yvon) with an excitation wavelength of 350 nm. A commercial VSM (MicroSence EZ9) was used to observe the magnetic properties and saturation magnetization. Hysteresis loops were determined at an applied field of up to ±18 kOe at room temperature.
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6

Comprehensive Characterization of Prepared Samples

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X-ray diffraction (XRD) was performed to obtain the crystal structure and phase purity of all the prepared samples using a Bruker D8 Advance X-ray diffractometer (Bruker, Karlsruhe, Germany) with a Cu-Ka radiation source (λ = 0.154056 nm). Transmission electron microscopy (TEM) and high-resolution TEM (HR-TEM) images were carried on a JEOL 2010F microscope (JEOL, Tokyo, Japan). The specific surface area and pore size distribution of the as-prepared samples were recorded with the measurement of nitrogen adsorption isotherm at 77 K using a Micromeritics ASAP 2020 analyzer (Micromeritics, Norcross, Georgia, USA). Electrical conductivity measurements were carried out on cylindrical pellets compressed from the powder samples at 30 MPa between two copper electrodes. The substrate area was restricted to 1 cm2 while the thickness of the pellet was measured by a Vernier caliper. The value of resistivity was immediately measured by a JG-ST2258A resistivity tester (Jingge Electronic, Suzhou, Jiangsu, China) by inputting the thickness-area ratio as a parameter, followed by conversion to conductivity.
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7

In Situ High Temperature X-ray and Raman Analysis

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In situ high temperature X-ray powder diffraction studies were conducted using the Bruker D8 Advance X-ray diffractometer (40 KV, 40 mA) with Cu/Kα1 radiation (λ = 0.15406 nm). The patterns were recorded in an inert atmosphere in the 2θ range of 10 to 100° with a step size of 0.02° and a counting time of 0.33 s per step.
In situ high temperature Raman spectroscopic studies were carried out under a dry inert atmosphere using the LabRAM HR800 Raman spectrometer (Horiba Jobin Y’von, Paris, France) equipped with an ultraviolet pulse laser beam of 355 nm which was focused on the sample through a microprobe with a 4× objective lens. The average laser beam power on the sample was about 60 mW. It was equipped with a microscopic heating furnace (TS1500) (Linkam, Tadworth, UK) with a small temperature deviation of about ±1 K for investigating the microstructure of the sample at different temperatures. The platinum crucible which was applied to measure the high temperature experiment is protected by a patent [16 ]. A charge coupled device (CCD) detection system by an accumulated mode of 20 × 20 (20 times with 20 s each time) was used to collect Raman scattering light. The sample was held at the targeted temperature for 5 min before recording Raman spectra in order to ensure the sample reaches the targeted temperature and also avoids volatilization of the sample.
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8

XRD Analysis of Material Properties

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The XRD experiment was carried out by the D8 ADVANCE X-ray diffractometer manufactured by Bruker, Germany. Experimental conditions are tube pressure 40 kV, tube flow 200 μA, Cu target, diffraction width DS = SS = 1°, RS = 0.3 mm, scanning speed 2000 (d min−1), scanning range 10°–80°.
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9

Characterization of Nickel Adsorbents

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The sulfur concentrations of various samples are analyzed by an Antek 9000 total sulfur analyzer.
The crystalline structures of the adsorbents were character-ized through X-ray diffraction (XRD) by using a Bruker D8 Advance X-ray diffractometer with a Cu Kα = 0.154 nm monochromatized radiation source, operating at 40 kV and 100 mA.
The crystal lattice of the adsorbents was surveyed by JEM-2100 transmission electron microscope (TEM).
The dispersity and reducibility of Nickel were undertaken by using the H2/O2 pulse titration (HOPT) with a chemisorption analyzer Autochem II 2920(Micromeritics, USA).
Temperature programmed reduction (TPR) was surveyed by the analyzer Autochem II 2920(Micromeritics, USA).
X-ray photoelectron spectroscopy (XPS) was characterized by the multi-function photoelectron spectrometer (ESCALAB 250Xi).
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10

Comprehensive Material Characterization Techniques

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The SEM images were performed using a field emission scanning electron microscope (SEM, Hitachi S4800, Chiyoda City, Japan) at an accelerating voltage of 15 kV. Photos were taken of different samples using a field emission transmission electron microscope (TEM, H-7650, Hitachi, Tokyo, Japan) at 150 kV. The structures were characterized by using a D8 Advance X-ray diffractometer equipped with Cu Kα radiation (XRD, λ = 0.154 nm, Bruker, Bremen, Germany). FTIR spectroscopy was performed by using an FTIR spectrometer (IR Tracer–100, Shimadzu, Nagoya, Japan) in the region of 4000~500 cm−1. The Raman spectroscopy measurements were carried out using a Raman spectrometer (XploRA PLUS, Horiba, Japan) with a 514 nm laser. The nitrogen (N2) adsorption–desorption isotherms of IGGO and the Fe3O4–urea–rGOAs were collected at 77 K on a Kubo × 1000 surface area and pore size analyzer (Beijing Builder, Beijing, China). The BET surface area (SBET) was determined through the Brunauer–Emmett–Teller (BET) theory, and the pore volumes were processed through Barrett–Joyner–Halenda (BJH) models. The concentration of L2 in the gas stream was analyzed using a Fuli Analytical Instrument 9790 gas chromatograph equipped with a flame ionization detector (GC–FID, Chengde, China).
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