D8 advance x ray
The D8 Advance is an X-ray diffractometer designed for materials analysis. It features advanced optics and a high-performance goniometer to enable precise and accurate measurements of crystal structures and phase compositions.
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48 protocols using d8 advance x ray
Structural and Electrochemical Analysis
X-ray Diffraction Analysis of Pure Drugs and MSNs
Comprehensive Material Characterization Protocol
Structural Analysis of PEO-Fibroin Scaffolds
Characterization of Fe3O4/ZnO Core-Shell Nanostructures
Comprehensive Characterization of Prepared Samples
In Situ High Temperature X-ray and Raman Analysis
In situ high temperature Raman spectroscopic studies were carried out under a dry inert atmosphere using the LabRAM HR800 Raman spectrometer (Horiba Jobin Y’von, Paris, France) equipped with an ultraviolet pulse laser beam of 355 nm which was focused on the sample through a microprobe with a 4× objective lens. The average laser beam power on the sample was about 60 mW. It was equipped with a microscopic heating furnace (TS1500) (Linkam, Tadworth, UK) with a small temperature deviation of about ±1 K for investigating the microstructure of the sample at different temperatures. The platinum crucible which was applied to measure the high temperature experiment is protected by a patent [16 ]. A charge coupled device (CCD) detection system by an accumulated mode of 20 × 20 (20 times with 20 s each time) was used to collect Raman scattering light. The sample was held at the targeted temperature for 5 min before recording Raman spectra in order to ensure the sample reaches the targeted temperature and also avoids volatilization of the sample.
XRD Analysis of Material Properties
Characterization of Nickel Adsorbents
The crystalline structures of the adsorbents were character-ized through X-ray diffraction (XRD) by using a Bruker D8 Advance X-ray diffractometer with a Cu Kα = 0.154 nm monochromatized radiation source, operating at 40 kV and 100 mA.
The crystal lattice of the adsorbents was surveyed by JEM-2100 transmission electron microscope (TEM).
The dispersity and reducibility of Nickel were undertaken by using the H2/O2 pulse titration (HOPT) with a chemisorption analyzer Autochem II 2920(Micromeritics, USA).
Temperature programmed reduction (TPR) was surveyed by the analyzer Autochem II 2920(Micromeritics, USA).
X-ray photoelectron spectroscopy (XPS) was characterized by the multi-function photoelectron spectrometer (ESCALAB 250Xi).
Comprehensive Material Characterization Techniques
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