AFM was as described in [37 (link)]. AFM imaging was carried out using an AFM Ntegra-Vita microscope (NT-MDT Spectrum Instruments, Moscow, Russia) in noncontact (tapping) mode in air. The typical scan rate was 0.5–1 Hz. Measurements were carried out using NSG03 cantilevers with a resonance frequency of 47–150 kHz and ensured a 10 nm tip curvature radius. The processing and presentations of AFM images were performed using Nova PX software (NT-MDT Spectrum Instruments, Moscow, Russia) and Gwyddion 2.44 software (http://gwyddion.net/ , Jihlava, Czech Republic).
Nova px software
Manufactured by NT-MDT
Nova PX software is a platform for controlling and data acquisition of NT-MDT scanning probe microscopes. It provides a user interface for configuring the microscope, acquiring images, and analyzing the data collected.
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Lab products found in correlation
4 protocols using nova px software
1
Atomic Force Microscopy Imaging Protocol
2
Characterization of Polymeric Thin Films
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Deposited films were imaged with scanning electron microscope (SEM) MIRA3 (TESCAN, Brno, Czech Republic) with a Schottky field emission electron gun equipped with secondary electron and back-scattered electron detectors as well as a characteristic X-ray detector (EDX) analyzer (Oxford Instruments, High Wycombe, UK). The IR spectra of deposited films were measured by FTIR spectrometer Alpha (Bruker, Billerica, MA, USA) using a single reflection ATR module Platinum. The total surface free energy of the films was determined from measurements of contact angles between testing liquids and the film surfaces using a sessile-drop technique. Acid-base theory was used for the calculation of total surface free energy. Atomic Force Microscope (AFM) Ntegra Prima (NT-MDT, Apeldoorn, The Netherlands) was used to study the surface topography of the POx films. The measurements were performed in semicontact mode on
m and
m areas of each coating with a scanning rate of 0.5 Hz. The 3D roughness parameters of the thin films were evaluated according to the ASME B46 standard using the NovaPx software (NT-MDT). The film thickness was measured using a Dektak XT (Bruker, Tucson, AZ, USA) mechanical profilometer.
m and
m areas of each coating with a scanning rate of 0.5 Hz. The 3D roughness parameters of the thin films were evaluated according to the ASME B46 standard using the NovaPx software (NT-MDT). The film thickness was measured using a Dektak XT (Bruker, Tucson, AZ, USA) mechanical profilometer.
3
Raman and AFM Characterization Protocol
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The Raman measurements
are performed by Renishaw InVia Confocal
Raman Microscope instrument in a backscattering geometry. The excitation
laser has a wavelength of 514.5 nm and the laser spot size is around
1 μm when using a 50× objective lens.
The AFM measurement
is performed by the scanning probe microscope NTEGRA from NT-MDT company
in tapping mode, and the results are analyzed by Nova PX software
(NT-MDT).
are performed by Renishaw InVia Confocal
Raman Microscope instrument in a backscattering geometry. The excitation
laser has a wavelength of 514.5 nm and the laser spot size is around
1 μm when using a 50× objective lens.
The AFM measurement
is performed by the scanning probe microscope NTEGRA from NT-MDT company
in tapping mode, and the results are analyzed by Nova PX software
(NT-MDT).
4
AFM Imaging of Nanostructures
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AFM scanning was performed in tapping mode in air with a Titanium atomic force microscope (NT-MDT, Zelenograd, Russia; the microscope pertains to the equipment of “Human Proteome” Core Facility of the Institute of Biomedical Chemistry, supported by Ministry of Education and Science of Russian Federation, agreement 14.621.21.0017, unique project ID: RFMEFI62117X0017) equipped with NSG03 silicon cantilevers with gold reflecting coating (TipsNano, Zelenograd, Russia; typical resonance frequency 47 to 150 kHz, tip curvature radius 10 nm) [37 (link)].
For each scanned sensor area, at least five 5 µm × 5 µm frames with 256 × 256 resolution were obtained. The AFM operation, obtaining AFM images, image processing (flattening correction etc.) and the data export into ASCII format was carried out using standard NOVA Px software (NT-MDT, Zelenograd, Russia) supplied with the atomic force microscope as described elsewhere [33 (link)]. The heights of objects in the AFM images were measured using a specialized software for AFM data processing, developed in the Institute of Biomedical Chemistry (Rospatent registration No. 2010613458). The cut-off level (noise level) amounted to 500 objects per 400 μm2 area [32 (link)]. The height of the AFM-imaged objects was used as the criterion for the determination of their dimensions.
For each scanned sensor area, at least five 5 µm × 5 µm frames with 256 × 256 resolution were obtained. The AFM operation, obtaining AFM images, image processing (flattening correction etc.) and the data export into ASCII format was carried out using standard NOVA Px software (NT-MDT, Zelenograd, Russia) supplied with the atomic force microscope as described elsewhere [33 (link)]. The heights of objects in the AFM images were measured using a specialized software for AFM data processing, developed in the Institute of Biomedical Chemistry (Rospatent registration No. 2010613458). The cut-off level (noise level) amounted to 500 objects per 400 μm2 area [32 (link)]. The height of the AFM-imaged objects was used as the criterion for the determination of their dimensions.
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