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Fp 6200 spectrophotometer

Manufactured by Jasco
Sourced in Japan

The FP-6200 spectrophotometer is a laboratory instrument used to measure the absorption or transmission of light by a sample. It is designed to analyze the spectral properties of a wide range of materials, providing accurate and reliable data for various scientific and industrial applications.

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3 protocols using fp 6200 spectrophotometer

1

Characterization of ZnL Interaction with HSA

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Infrared (IR) spectra were recorded by transmission mode, using KBr pellets for ZnL only and by reflection mode as cast films for HSA and HSA+ZnL using a stainless plate on a JASCO (Tokyo, Japan) FT-IR 4200 plus spectrophotometer in the range 4000–400 cm−1 at 298 K. Electronic (UV-Vis) spectra were obtained on a JASCO (Tokyo, Japan) V-570 UV-vis-NIR spectrophotometer in the range 1500–200 nm at 298 K. Fluorescence spectra were measured on a JASCO (Tokyo, Japan) FP-6200 spectrophotometer in the range of 720–220 nm. Circular dichroism (CD) spectra were obtained on a JASCO (Tokyo, Japan) J-820 spectropolarimeter in the range 900–250 nm at 298 K.
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2

Synthesis and Characterization of a Novel Organic Semiconductor

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3,6‐dibromobenzene‐1,2‐diamine and phthalic anhydride were purified by sublimation (10−2 mbar) before use. All other purchased chemicals were used as received. ITO substrates were well cleaned and treated by Photo Surface Processor (PL 16‐110, replace lamp SUV110GS‐36) before use. IR spectra were obtained from Perkin Elmer Spectrum 100 Model FT‐IR spectrometer. 1H NMR spectra were obtained on Bruker AC‐400 MHz NMR Spectrometer. GPC analysis was recorded by using a Malvern instrument connected with Viscotek‐VE3580‐RI‐Detector and standard polystyrene samples as calibration, which were performed on a polymer/THF solution at a flow rate of 1 mL min−1 at 30 °C. TGA were taken under nitrogen atmosphere with 10 °C min−1 rate and were recorded on Perkin Elmer Pyris 6 workstation. Photochemical measurements were obtained by using SHIMADZU UV‐3600 and Jasco FP‐6200 spectrophotometer. Cyclic voltammeter was measured by CHI‐660E electrochemical workstation at a voltage scan rate of 50 mV s−1. Luminance properties of PLED were recorded by using Keithley source measurement (Keithley 2400 and Keithley 2000) with a calibrated silicon photodiode. The electroluminescent spectra were obtained by using Spectra scan PR650 spectrophotometer. Memory behaviour was carried out by Keithley 4200‐SCS semiconductor workstation under applied voltage with step of 0.05 V.
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3

Spectroscopic Characterization of Zn-HSA Complexes

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Infrared (IR) spectra were recorded by transmission mode using KBr pellets for Zn complex only and by reflection mode as cast films for HSA and HSA+Zn complexes using a stainless plate on a JASCO (Tokyo, Japan) FT-IR 4200 plus spectrophotometer in the range 4000–400 cm−1 at 298 K. Electronic (UV-vis) spectra were obtained on a JASCO (Tokyo, Japan) V-570 UV-vis-NIR spectrophotometer in the range 1500–200 nm at 298 K. Fluorescence spectra were measured on a JASCO (Tokyo, Japan) FP-6200 spectrophotometer in the range of 720–220 nm. Circular dichroism (CD) spectra were obtained on a JASCO (Tokyo, Japan) J-820 spectropolarimeter in the range 900–250 nm at 298 K.
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