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Golden gate single reflection diamond atr accessory

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Golden Gate single-reflection diamond ATR accessory is a compact and robust device designed for Fourier transform infrared (FTIR) spectroscopy. It provides a simple and effective way to analyze a wide range of solid, liquid, and paste-like samples using the attenuated total reflectance (ATR) sampling technique.

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2 protocols using golden gate single reflection diamond atr accessory

1

Elemental Composition and FTIR Analysis

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The elemental composition of the materials (C%, H%, N%) was determined using the EA 1110 CHNS-O analyzer (CE Instruments, Milano, Italy). Furthermore, they were also analyzed by Fourier-transform infrared spectroscopy (FTIR) before and after every synthesis step to identify the functional groups present on the surface. The spectra were obtained using attenuated total reflection (ATR) by a Nicolet 6700 (Thermo Fisher Scientific, Waltham, MA, USA) equipped with a Golden Gate single-reflection diamond ATR accessory at a resolution of 2 cm−1 and co-adding 200 scans.
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2

Characterization of Functionalized Catheters

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FTIR-ATR spectra of catheters were collected using a Nicolet 5700 spectrometer with a golden gate single reflection diamond ATR accessory (Thermo Fisher Scientific, US). An ESCALAB MK-II spectrometer (VG Scientific Ltd., Britain) was used for XPS spectra with the excitation wavelength of Al Kα (Al anode) at 1486.69 eV. Surface morphology change and thickness were studied with JEOL JSM 6390LA emission scanning electron microscope (Jeol Ltd., US). A DSA 25 contact angle analyzer (Kruss Scientific, Germany) was employed to measure the surface wettability. The leachability of PU/PPEG-OH-MPS-NO was determined using an Agilent 6530 liquid chromatography mass spectrometer (LC-MS, Agilent Technologies, US) with acetonitrile/water as the eluent. Released NO was detected amperometrically in PBS (pH 7.2) using a TBR 4100 free radical analyzer (WBI, US) fitted with a NO-specific probe (ISO-NOP) at 37 °C.
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