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Em208s device

Manufactured by Philips

The EM208S is a compact and versatile electron microscope designed for educational and research applications. It offers high-quality imaging capabilities and is suitable for a wide range of sample types. The device's core function is to provide users with the ability to magnify and examine small-scale specimens in a controlled environment.

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2 protocols using em208s device

1

Comprehensive Material Characterization Protocol

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The crystal structure of the material was determined by X-ray diffraction (D8-Advance, Bruker, Germany) using Cu Kα radiation (λ = 1.5406 Å) in the 2θ range from 10° to 80°. Fourier transform infrared spectroscopy (FTIR, SHIMADZU 8400S, Japan) has been used to study the structure and chemical bonds of the molecule. X-ray photoelectron spectrometer (XPS) with a monochromated AlKα source at a power of 180 W (Specs/FlexPS, Germany). The surface morphology of the sample was observed with a field emission scanning electron microscope (FESEM, ZISS). Energy dispersive X-ray spectroscopy (EDS) (MIRA III SAMX detector, France) was performed to determine the percentage of elements in the composition. The transmission electron microscope (TEM) image was obtained from a Phillips model EM208S device. Nitrogen adsorption–desorption isotherms (BELSORP MINI II, BEL company) were recorded with Quantachrome at liquid N2 temperature. The specific surface area was determined from the linear part of the BET diagram. The light absorption properties of solid samples were determined by UV–visible DRS (Avaspec-2048-TEC, Netherlands). In order to investigate the degree of electron/hole separation, photoluminescence (PL) spectrum (Avaspec-2048-TEC, Netherlands) and electrochemical impedance (EIS) (Sharif solar co, model PGE-18) were determined.
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2

Comprehensive Material Characterization Protocol

Check if the same lab product or an alternative is used in the 5 most similar protocols
Brunker model D8 X-ray diffractometer was used to check the crystal structure. Fourier transform infrared spectroscopy (FTIR) Magna-IR Nikolate 550 was used to identify organic compounds. Zeiss sigma 300-HV field emission scanning electron microscope was used to determine the average size of particles and morphology. Also, Philips X-ray energy diffraction spectrometer (EDS) model XL30 was used. The transmission electron microscope (TEM) image was obtained from a Phillips model EM208S device. Nitrogen adsorption/desorption was done using Belsorp mini x device. Shimadzu model UV3600Iplus Diffuse Reflectance/Transmission Spectrometer (DRS) was used to determine light absorption ability.
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