The J–V characteristics of the photovoltaic cells were measured under illumination at 100 mW cm−2, using an AM 1.5 solar simulator (San-ei Electric, XES-301S). J–V measurements were performed using a source measure unit (Keysight, B2901A Precision SMU). The scan rate and sampling time were ∼0.08 V s−1 and 1 m s, respectively. Four cells were tested for each cell composition. The solar cells were illuminated through the sides of the FTO substrates, and the illuminated area was 0.090 cm2. IPCE of the cells were also measured (Enli Technology, QE-R). The microstructures of the cells were investigated using an X-ray diffractometer (Bruker, D2 PHASER), a transmission optical microscope (Nikon, Eclipse E600), and a scanning electron microscope (Jeol, JSM-6010PLUS/LA) equipped with EDS.
B2901a precision smu
Manufactured by Keysight
The B2901A Precision Source/Measure Unit (SMU) is a compact, high-performance instrument designed for precise electrical measurements. It offers a wide voltage and current range, high resolution, and low noise performance, making it suitable for a variety of applications that require accurate electrical characterization.
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2 protocols using b2901a precision smu
1
Characterization of Photovoltaic Cells
2
Photovoltaic Cell Characterization Protocol
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J–V characteristics of the photovoltaic cells were measured under illumination at 100 mW cm−2, with the use of an AM 1.5 solar simulator (San-ei Electric, XES-301S). J–V measurements were performed using a source measurement unit (Keysight, B2901A Precision SMU). The scan rate and sampling time were ∼0.08 V s−1 and 1 ms, respectively. Four cells were tested for each cell composition and the reported values are the averages of these four measurements (ηave). The solar cells were illuminated through the sides of the FTO substrates and the illuminated area was 0.0784 cm2. EQEs (Enli Technology, QE-R) of the cells were also measured using a source meter (Keithley Tektronix, 2450). The microstructures of the cells were investigated by X-ray diffraction (XRD, Bruker, D2 PHASER) and scanning electron microscopy (SEM, JEOL, JSM-6010PLUS/LA) equipped with energy dispersive X-ray spectroscopy (EDS).
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J–V characteristics of the photovoltaic cells were measured under illumination at 100 mW cm−2, with the use of an AM 1.5 solar simulator (San-ei Electric, XES-301S). J–V measurements were performed using a source measurement unit (Keysight, B2901A Precision SMU). The scan rate and sampling time were ∼0.08 V s−1 and 1 ms, respectively. Four cells were tested for each cell composition and the reported values are the averages of these four measurements (ηave). The solar cells were illuminated through the sides of the FTO substrates and the illuminated area was 0.0784 cm2. EQEs (Enli Technology, QE-R) of the cells were also measured using a source meter (Keithley Tektronix, 2450). The microstructures of the cells were investigated by X-ray diffraction (XRD, Bruker, D2 PHASER) and scanning electron microscopy (SEM, JEOL, JSM-6010PLUS/LA) equipped with energy dispersive X-ray spectroscopy (EDS).
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