Jsm 6490 microscope

The temperature of SHS synthesis was controlled using tungsten–rhenium thermocouples. The microstructures of the SHS powders and spark-plasma-sintered specimens were observed by a JEOL JSM-6490 microscope equipped with energy dispersive spectroscopy (EDX). The phase composition of the SHS powders and obtained specimens was identified using X-ray diffraction with CuKα radiation using a Shimadzu XRD 7000 diffractometer. The Diffrac.EVA program was used to determine the phase composition. The PDF-4 (powder diffraction file) database was used as a database. The densities of the specimens were calculated by the Archimedes method with distilled water as the immersion medium. A Metolab-502 tester was employed to measure the Vickers hardness. The dwell time was 10 s, and the normal load was 9.8 N. At least 10 indentations were made from different places of the samples.

Specimens were fixed with 2,5% glutaraldehyde and 2,5% formaldehyde in 0,1 M phosphate buffer. After progressive dehydration with ethanol solutions from 20% to 100%, they were critical point dried and vacuum metalized. A Jeol JSM 6490 microscope (Jeol, Peabody, MA) was utilized for observation and recording. Images were elaborated by Photoshop CS2 software to ease the visualization of different ECM components and cell elements: basal lamina/ECM, ECs, endothelial microvilli and red cells were colored in green, blue, purple and red respectively.

Information on GB character was obtained by EBSD analysis (see Supplementary Fig. 1b) of 9 ROIs (#01-#91) of the polished surface of the bicrystal disk using a JEOL-JSM-6490 microscope operated at 30 kV and equipped with an EDAX/TSL EBSD system. In addition, we performed mapping of the grain orientation and GB characters for the TEM lamellae using precession assistant 4DSTEM^{44 (link)} (see Supplementary Fig. 2). 4DSTEM data sets have been acquired using the TemCam-XF416 pixelated complementary metal-oxide-semiconductor detector (TVIPS) in a JEM-2200FS TEM (JEOL) operated at 200 kV. During the data acquisition, the incident electron beam was precessed by 0.5° to create a quasi-kinematic diffraction pattern and scanned with a step size of 2.5 nm. The collected diffraction patterns of 4DSTEM data set were indexed by ASTAR INDEX program and the orientation was mapped using an offline TSL OIM Analysis 8 software package.