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Quanta650feg

Manufactured by Bruker

The Quanta650FEG is a high-performance scanning electron microscope (SEM) produced by Bruker. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The instrument features a field emission gun (FEG) electron source, which enables high-resolution imaging with low beam energies. The Quanta650FEG is capable of operating in various imaging modes, including secondary electron, backscattered electron, and energy-dispersive X-ray spectroscopy (EDS) analysis.

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3 protocols using quanta650feg

1

Thermal Stability Analysis of PLA/Mg Composites

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A thermogravimetric analysis (TGA) (TA SDT 650) was used to determine the thermal stability of the PLA/Mg composites. These composites were taken into the ceramic crucible, and heated from room temperature to 500 °C with a heating speed of 10 °C/min under a nitrogen atmosphere. The cold crystallization temperature, melting point, and decomposition temperature of the differential scanning calorimetry (DSC) and the remaining mass percentage of the TGA at 500 °C were identified from the testing curves. The composite surface morphology was examined using a field emission scanning electron microscope functioning at a 2 kV accelerating voltage and a working distance of 9.0 mm. The composite composition was analyzed with energy-dispersive X-ray spectroscopy (FEI Quanta650FEG is used for imaging and Bruker Quantax400 for EDS). The X-ray diffractometer (XRD) was used to determine the crystal structures of the composites using Cu Kα radiation within an angle range of 10°–90° at a scan rate of 0.1 °/min. A Fourier transform infrared spectrometer (FTIR) was used to detect the functional groups in the PLA/Mg composites before and after decomposition.
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2

Thermal Stability Analysis of PLA/Mg Composites

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A thermogravimetric analysis (TGA) (TA SDT 650) was used to determine the thermal stability of the PLA/Mg composites. These composites were taken into the ceramic crucible, and heated from room temperature to 500 °C with a heating speed of 10 °C/min under a nitrogen atmosphere. The cold crystallization temperature, melting point, and decomposition temperature of the differential scanning calorimetry (DSC) and the remaining mass percentage of the TGA at 500 °C were identified from the testing curves. The composite surface morphology was examined using a field emission scanning electron microscope functioning at a 2 kV accelerating voltage and a working distance of 9.0 mm. The composite composition was analyzed with energy-dispersive X-ray spectroscopy (FEI Quanta650FEG is used for imaging and Bruker Quantax400 for EDS). The X-ray diffractometer (XRD) was used to determine the crystal structures of the composites using Cu Kα radiation within an angle range of 10°–90° at a scan rate of 0.1 °/min. A Fourier transform infrared spectrometer (FTIR) was used to detect the functional groups in the PLA/Mg composites before and after decomposition.
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3

ESEM Hydrated Plant Sample Imaging

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Environmental scanning electron microscopy micrographs were obtained with a non-commercial ESEM AQUASEM II and ESEM Quanta 650 FEG equipped with a Bruker QUANTAX EDS XFlash 6 detector. Fresh plant samples were sectioned approximately to 4–8 mm2, placed into a drop of water on the Peltier cooling stage equipped with a special flat cylindrical brass sample holder. In the case of observation of samples in their fully hydrated state, the sample temperature was 3 °C and 760 Pa of water vapour, the accelerating voltage 20 kV, the probe current 80 pA and the environmental distance between the sample surface and the second pressure limiting aperture was 8.5 mm.
In the case of the LTM for ESEM, the accelerating voltage was 10 kV, the probe current was 50 pA and the sample distance between the sample surface and the second pressure limiting aperture was 8.5 mm.
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