X pert highscore plus software

Morphology of the synthesized nanoparticles were characterized by high-resolution analytical transmission electron microscopy (TEM, JEM-2100, JEOL, Tokyo, Japan) and scanning electron microscope (SEM, S-3400N II, Hitachi, Tokyo, Japan). The specific surface areas (SSA) were measured with nitrogen adsorption-desorption isotherm via the Brunauer–Emmett–Teller (BET) method. Prior to the measurements, the samples were degassed at 180 °C for 3 h. The average pore sizes, total pore volumes and pore size distributions were obtained with nitrogen desorption data, using the Barrett-Joyner-Halenda (BJH) model. Both were carried out with a Micromeritics Tristar II 3020 (Micromeritics Instrument Corp., Norcross, GA, USA), using nitrogen gas as an adsorbate at 77 K. The phase composition and crystal structure of the synthesized particles were determined by X-ray diffraction (XRD, PANalytical X’Pert Powder Pro, Malvern Panalytical, Almelo, The Netherlands) using Cu K_α1/2 radiation (λ_α1 = 1.5406 Å) in the range of 10°–90°(2θ). A standard silicon was measured to determine the instrumental broadening, in order to calculate the average crystallite sizes of silver based on the XRD data using Scherrer’s equation [16 (link)]. Analysis of the XRD patterns was performed using X’Pert HighScore Plus Software (Malvern Panalytical, Almelo, The Netherlands).

An X-ray diffractometer (PANalytical Empyrean model, Almelo, The Netherlands) was used to measure the polymorphic types of the oleogel samples following the Cj 2-95 method [19 ]. The oleogel samples were kept at ambient temperature overnight and loaded at that temperature to the instrument. The measurement was completed with a Cu source X-ray tube (λ = 1.54056 Å, 40 kV and 40 mA) and angular scans (2θ) from 2.0 to 50° at 2°/min scan rate. X’Pert HighScore Plus software (Malvern Panalytical Ltd., Royston, UK) was used for data analysis [13 (link)].

The crystalline structure and XRD spectra were measured by means of the X-ray diffraction (XRD) method. A high-resolution X-ray diffractometer (Malvern Panalytical, Malvern, Worcestershire, UK) (with Cu K-alpha radiation (λ = 0.154184 nm) and a Ni filter with a generator voltage of 40 kV and a current of 30 mA was used. The radiation was measured with a proportional detector. The samples were measured in θ–2θ geometry over a range of 5° to 80°. All measurements were carried out at room temperature with a step size of 0.01° and a counting time of 5 s per data point. The crystalline phases were identified using the X’Pert High Score Plus software (v3.0e, Malvern Panalytical, Malvern, UK).