Identification of synthetic minerals was conducted with a power X-ray diffractometer equipped with a copper target (X-Pert Powder; Philips Co.). All diffraction profiles were obtained at a step size of 0.01°, with a divergence and receiving slit of 1° and 0.3 mm, respectively.
X pert powder
Manufactured by Philips
Sourced in Japan
The X'pert powder is a laboratory equipment designed for advanced X-ray powder diffraction analysis. It provides precise measurements and data collection for the identification and characterization of crystalline materials.
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Lab products found in correlation
4 protocols using x pert powder
1
Synthetic Mineral Identification by XRD
2
Multifaceted Characterization of Co/Co3O4-CoO 3DFs
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The morphological, crystal structural and chemical characterization of the Co/Co3O4–CoO 3DFs were analyzed at the nanoscale using a field emission scanning electron microscope (FESEM, Hitachi S-4800, Japan), spherical aberration correction electron microscope (Cs-STEM, Titan Cubed Themis G2 300, FEI), high angle annular dark field and high resolution scanning transmission electron microscope (HAADF-HRSTEM), selected area electron diffraction (SAED), EDX mapping and X-ray diffraction (XRD) instrument using Cu Kα radiation (λ = 1.5418 Å) (X'pert powder, Philips). The chemical composition and atomic bonding states were analyzed by X-ray photoelectron spectroscopy (XPS, Kratos Axis Ultra DLD, Japan). The Nitrogen adsorption–desorption isothermals were measured at 77 K using Brunauer–Emmett–Teller (BET, ASAP2020, Micromeritics, USA).
3
Comprehensive Material Characterization for Electromagnetic Shielding
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The crystal phase is recorded on X-ray powder diffraction (XRD, X'pert powder, Philips), while using Cu Kα1 (λ = 1.540 Å) radiation. The microstructure and morphology are determined using scanning electron microscopy (FIB-SEM, Tescan LYRA 3 XMU), and scanning transmission electron microscopy (STEM). The shape and size of the particles were determined from high-magnification transmission electron microscopy (HRTEM, FEI Tecnai G2 F30). The degree of graphitization was confirmed by Micro-Raman spectroscopy (Jobin–Yvon Horiba HR800) using argon ion laser (k = 532 nm) in the range of 800–1800 cm−1. The pore-size distribution is investigated by Brunauer–Emmett–Teller measurement (BET, ASAP 2020 Micromeritics), and the magnetic properties were carried out by vibrating sample magnetometer (VSM Lake-Shore 7404, USA) in room temperature.
The EM parameters are analyzed in the test range (2.00–18.00 GHz) by using a vector network analyzer (VNA, Agilent N5245A). According to the mass ratio of sample to paraffin of 1:5, the sample are pressed into a toroidal shape (outer diameter of 7.0 mm and inner diameter of 3.04 mm). The calculated reflection loss (RL) and simulated reflection loss (RL) are calculated by the coaxial reflection/transmission method based on the NRW method and the transmission line theory, respectively.
The EM parameters are analyzed in the test range (2.00–18.00 GHz) by using a vector network analyzer (VNA, Agilent N5245A). According to the mass ratio of sample to paraffin of 1:5, the sample are pressed into a toroidal shape (outer diameter of 7.0 mm and inner diameter of 3.04 mm). The calculated reflection loss (RL) and simulated reflection loss (RL) are calculated by the coaxial reflection/transmission method based on the NRW method and the transmission line theory, respectively.
4
Thin Film Characterization by Advanced Analyses
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An evaluation of the produced targets was carried out through a set of analyses. The density calculations were performed using information on the weight and thickness of obtained films. The weight measurements were performed with electronic precision balances (Sartorius MCA225S-2S00-I Cubis® II Semi Micro Balance, 220 g × 0.01 mg). The thickness was measured by a linear contact profilometer (Veeco Dektak 8). The growing behaviour and thickness of the films were accurately investigated by scanning electron microscopy (COXEM, CX-200plus). Additionally, X-ray Diffractograms were collected (X’Pert Powder, Philips) and analysed with dedicated HighScorePlus software [30 (link)]. The diffractogram was acquired by using Cu-K X-ray = 1.54 Å as the radiation source at 40 kV and 40 mA.
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