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Jsm 6510lv microscope

Manufactured by JEOL
Sourced in Japan

The JSM-6510LV is a low-vacuum scanning electron microscope (SEM) manufactured by JEOL. It is designed to observe a wide range of samples, including those that are non-conductive or moisture-containing, without the need for extensive sample preparation. The JSM-6510LV provides high-resolution imaging and analytical capabilities, making it a versatile tool for various applications.

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11 protocols using jsm 6510lv microscope

1

Ultrastructural Analysis of Blood Flukes

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For electron microscopy, live blood flukes were fixed using 3% glutaraldehyde in a 0.1 M sodium cacodylate buffer (pH 7.2) for 7 days at 5 °C, rinsed three times for 10 min periods in the same buffer and postfixed in 1% osmium tetroxide for 1 h. For SEM observations, fixed specimens were dehydrated in a graded ethanol series, with a final change to absolute acetone and then critical-point dried with liquid CO2. Later, the specimens were mounted on stubs, sputter-coated with gold-palladium and examined under a JEOL-JSM-6510LV microscope operating at 30 kV. For transmission electron microscopy (TEM), fixed specimens were later embedded in a mixture of Araldite and Epon using an Araldite/Embed-812 EM Embedding kit (EMS). Ultrathin sections were then stained with uranyl acetate and lead citrate, and examined using a JEM 1011 microscope operating at 80 kV.
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2

SEM Imaging of Membrane Samples

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All SEM experiments were performed using a JSM-6510LV microscope (Jeol, Tokyo, Japan). After analysis in buffer, membranes were washed with water, dried, and coated with gold using an IB-3 coater (EIKO, Tokyo, Japan). Digital images were analyzed using the Image Tool program (UTHSCSA, San Antonio, TX, USA).
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3

Nanoparticle Characterization Protocol

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The size and shape of the biosynthesized NPs were obtained using JEOL JEM-1010 transmission electron microscope (TEM, Japan). The samples were drop coated on carbon grid for TEM analysis and voltage was retained at 100 kV. The functional group pattern was assessed by Fourier transform infrared (FTIR) spectroscopy. All samples were examined within a range of 450–4000 cm-1. The morphological characterization of CchiBs and MchiBs were carried out by scanning electron microscope (SEM) (JSM-6510LV microscope, JEOL, Tokyo, Japan), which operated at 10 keV. The elemental analysis of Fe3O4-NPs was determined using energy-dispersive X-ray detector, which attached to JEOL JSM-6510LV SEM at 10 keV. Finally, the crystalline structure of the magnetic nanomaterial was confirmed by X-ray powder diffraction (XRD), X’PERT PRO, (MiniFlex 300/600 X-ray, USA) which operated at 28 °C and 40 kV with a radiation source of Cu-Ka. The samples of Fe3O4-NPs, CchiBs and MchiBs were scanned in the range of 2θ from 10 to 90° at 10.00° min scanning rate.
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4

Scanning Electron Microscopy Sample Preparation

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Fifty μl of sample was placed on a glass slide and then a cover slip was mounted. This was followed by overnight dehydration at 37°C and 50% humidity. The sample was gold platedand visualized underscanning electron microscope.The image was recorded with the help of JEOL JSM-6510LV microscope at an acceleration voltage of 15 kV and 1500 x magnification.
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5

Characterization of Zinc Oxide Nanoparticles

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The external surface geometry of ZnO NPs was inspected using a scanning electron microscope (SEM) (JSM-6510LV microscope, JEOL, Tokyo, Japan). Sputter coater SPI-MODULE TM (SPI, West Chester, PA, USA) was used in the gold coating of ZnO NPs. The elemental status of ZnO NPs was analyzed using EDX via an analysis X-ray unit (Oxford X-Max 20, Ontario, Canada) attached to a scanning electron microscope [34 (link)].
After the proper dilution of ZnO NPs, droplets of ZnO NPs suspension were fixed on the carbon grid and left for 10 min until drying prior to examination under a transmission electron microscope (TEM, JEM-2100 Electron Microscope, JEOL Ltd., Tokyo, Japan) [13 (link)].
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6

Visualizing CXB-GLR-PVP Microparticles

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Scanning electron microphotographs of CXB-GLR-PVP MPs were visualized using JSM- 6510LV microscope (JEOL, Tokyo, Japan). The instrument was operated with an accelerated voltage equal to 30 kV. The sample was fixed on an aluminum carrier, and a sputter coater SPI-MODULE TM Sputter Coater (USA) was used to coat the sample with a gold film for 10 min. Measurements shown on SEM images were displayed using image J software [15 (link)].
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7

Scanning Electron Microscopy of Egg Sac

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A piece of a formalin-fixed egg sac was first dehydrated by critical point drying and then gold-coated before introduction into the vacuum chamber of a JEOL JSM-6510LV microscope using an electron beam energy of 10 kV and a spot size of 30.
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8

Nanoparticle Characterization by Microscopy

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Shape and surface morphology of NP–XL were analyzed with scanning electron microscopy (SEM) and transmission electron microscopy (TEM). A suspension NP–XL in distilled water was dropped onto the surface of a formvar-coated copper grid (Gilder Grid Square 200 Mesh), followed by the evaporation of the solvent to prepare sample for TEM. Then, 10 µL of UranyLess solution (Electron Microscopy Sciences, Hatfield, PA, USA) was also dropped onto the surface of a formvar-coated copper grid and incubated for 20 s to enhance the contrast of the TEM images. The grid was then washed twice in deionized water. To prepare the sample for SEM, a drop of NP–XL water suspension (1 mg/mL) was placed on a double-sided carbon tape, respectively, and dried for 30 min. Samples were coated with a gold layer. TEM analysis was performed on a JEM-1400 microscope at 120 kV (JEOL, Tokyo, Japan). SEM analysis was performed on a JSM-6510LV microscope (JEOL, Tokyo, Japan).
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9

Surface Topography Analysis via SEM

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Surface topography was evaluated with a JEOL JSM 6510LV microscope operating at 20 kV, using secondary electron signals. Samples were sputtered with a thin layer of approximately 15 nm of gold using a Denton Vacuum DESK IV system.
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10

Microscopy Characterization of Samples

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Size, shape and topography were evaluated with a JEOL JSM 6510LV microscope operating at 20 kV, using secondary electron signals. Samples were sputtered with a gold thin layer of approximately 15 nm using a Denton Vacuum DESK IV system.
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