Jsm 6510lv microscope
The JSM-6510LV is a low-vacuum scanning electron microscope (SEM) manufactured by JEOL. It is designed to observe a wide range of samples, including those that are non-conductive or moisture-containing, without the need for extensive sample preparation. The JSM-6510LV provides high-resolution imaging and analytical capabilities, making it a versatile tool for various applications.
Lab products found in correlation
11 protocols using jsm 6510lv microscope
Ultrastructural Analysis of Blood Flukes
SEM Imaging of Membrane Samples
Nanoparticle Characterization Protocol
Scanning Electron Microscopy Sample Preparation
Characterization of Zinc Oxide Nanoparticles
After the proper dilution of ZnO NPs, droplets of ZnO NPs suspension were fixed on the carbon grid and left for 10 min until drying prior to examination under a transmission electron microscope (TEM, JEM-2100 Electron Microscope, JEOL Ltd., Tokyo, Japan) [13 (link)].
Visualizing CXB-GLR-PVP Microparticles
Scanning Electron Microscopy of Egg Sac
Nanoparticle Characterization by Microscopy
Surface Topography Analysis via SEM
Microscopy Characterization of Samples
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