Graphite or Sn–graphite was observed via Fourier transform infrared spectroscopy using Nicolet PROTÉGÉ FT-IR (JSM-6360LA, JEOL, Japan), X-ray diffraction (XRD) on a Rigaku XRD-6000 diffractometer (Rigaku Corporation, Japan) with a CuKα radiation and JCPDS reference number (no. 85-0712), and scanning electron microscopy (SEM) (JSM-6360LA, JEOL, Japan). In an ASAP2020M system (Micromeritics Instrument Co., USA), nitrogen adsorption–desorption isotherms at 77 K were used to measure the Brunauer–Emmett–Teller (BET)-specific surface area. The X-ray photoelectron spectroscopy (XPS) analysis was performed on a physical electronics ESCALAB 250 spectrometer (Thermo Fisher Scientific Co. Ltd, USA). FF, FFA, and FAM were quantified via HPLC.20,21 (link) FF (furfural), FAM (furfurylamine), and FFA (furfuryl alcohol) were determined by HPLC equipped with a Waters Nova-Pak C18 column (3.9 × 150 mm, 4 μM), which were eluted by mobile phase (20 v% methanol and 80 v% water containing 0.1 wt% trifluoroacetic acid) at a flow rate of 0.8 mL min−1. FFA and FAM were detected at 210 nm, and FF was detected at 254 nm. The components of BSS were determined as reported NREL (National Renewable Energy Laboratory) method (http://www.nrel.gov/biomass/analytical_procedures.html ).
Xrd 6000 diffractometer
Manufactured by Rigaku
Sourced in Japan
The XRD-6000 is a versatile X-ray diffractometer designed for a wide range of applications. It features a high-intensity X-ray source and a sensitive detector to provide accurate and reliable data for phase identification, structural analysis, and materials characterization. The instrument is capable of performing both qualitative and quantitative analyses of crystalline and polycrystalline samples.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250 spectrometer, by Thermo Fisher Scientific (4 mentions)
Supra 55, by Zeiss (3 mentions)
Jsm 6360la, by JEOL (1 mentions)
Nova pak c18 column, by Waters Corporation (1 mentions)
Asap 2020m system, by Micromeritics (1 mentions)
Jem 2010 hrtem, by JEOL (1 mentions)
Av 600 spectrometer, by Bruker (1 mentions)
Vg escalab 250 x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
5 protocols using xrd 6000 diffractometer
1
Graphite and Sn-Graphite Characterization
2
Thermal and Optical Characterization of Compounds
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In this study, all of the chemical reagents used were of analytical grade, are commercially available and were used without further purification. The powder X-ray diffractometry (PXRD) was performed using a Rigaku XRD-6000 diffractometer using an operating power of 40 kV/40 mA and employing graphite-monochromatized Mo-Kα radiation. The solid-state optical absorption spectra were recorded on a Shimadzu UV-2550 double monochromatic spectrophotometer over the range of 220–800 nm at room temperature using Ba2SO4 power as the reflectance. The absorption spectrum data were calculated from the Kubelka–Munk function: α/S = (1 − R)2/2R, in which α is the absorption coefficient, S the scattering coefficient, and R is the reflectance.42,43 (link) Differential scanning calorimetry (DSC) analyses were carried out using a STA 449 F5 Jupiter instrument under a nitrogen atmosphere (35 mL min−1) at 20–600 °C at a rate of 5 °C min−1.3 (link) The DSC data of compounds 1, 2 were obtained using a DSC-200F3 Maia instrument, compounds 3, 4 were obtained using a STA 449 F5 Jupiter instrument.
3
Characterization of Cu-Based Catalysts
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The content of Cu was determined via inductively coupled plasma-atomic emission spectroscopy (ICP-AES). X-ray diffraction (XRD) measurements were carried out on a Rigaku XRD-6000 diffractometer. XRD patterns were recorded by employing a Cu Kα radiation (λ = 0.15418 nm) at 30 mA and 40 kV over a 2θ angle ranging from 3° to 80° (scanning rate: 5° min−1). Scanning electron microscopy (SEM) images of the samples were obtained on a Zeiss Supra 55 at an accelerating voltage of 20 kV. Transmission electron microscopy (TEM) images were obtained to investigate the particle size and microstructure of catalysts on a JEM-3010 high-resolution transmission electron microscope operating at an accelerating voltage of 200 kV.
4
Characterization of Structured Photocatalysts
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X-ray diffraction (XRD) patterns of the products were collected on a Rigaku XRD-6000 diffractometer using Cu Kα radiation. The surface morphologies of structured photocatalyst were characterized by scanning electron microscope (SEM; Zeiss SUPRA 55) with an accelerating voltage of 20 kV, combined with energy dispersive X-ray spectroscopy (EDS). Transmission electron microscopy (TEM) images were used to characterize the microstructures of the products adopting a HITACHI HT7700 Exalens and a JEOL JEM-2010 HR-TEM. An ESCALAB 250 spectrometer (Thermo Scientific) equipped with a monochromatic 150 W Al Kα source was employed for X-ray photoelectron spectroscopy (XPS). The passing energy was 30 eV, and charge was compensated by low energy electrons. Binding energies are reported relative to the C 1s line at 284.8 eV. Diffuse reflectance ultraviolet and visible (DRUV-vis) spectroscopy was performed with a Tsushima UV-3600 UV-vis spectrometer over the wavelength range 200 to 800 nm. Inductively coupled plasma-mass spectrometry (ICP-MS) was adopted to analyze the chemical components of the catalysts, the solutions prepared by dissolving the samples in dilute HNO3 (1 : 1). 1H NMR spectra were measured (CDCl3) with a Bruker AV600 spectrometer at 400 MHz.
5
Comprehensive Characterization of Catalysts
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X-ray diffraction (XRD) patterns were collected on a Rigaku XRD-6000 diffractometer using Cu Kα radiation from 3° to 80° at the scan rate of 10° min−1. The morphologies were investigated via SEM (Zeiss SUPRA 55) at an accelerating voltage of 20 kV. A Brunauer–Emmett–Teller (BET, ASAP 2460) apparatus was used to measure the surface area. HRTEM images were recorded using a JEOL JEM-2010 field-emission transmission electron microscope at an accelerating voltage of 200 kV, combined with energy-dispersive X-ray spectroscopy (EDS). XPS measurements were performed on a Thermo VG ESCALAB 250 X-ray photoelectron spectrometer with Al Kα radiation at a pressure of about 2 × 10−9 Pa. Inductively coupled plasma-optical emission spectrometry (ICP-OES) was adopted to analyze the chemical components of the catalysts.
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