Ultra plus scanning electron microscope
The Zeiss Ultra Plus scanning electron microscope is a high-performance imaging system that utilizes a focused electron beam to produce detailed images of small-scale structures and features. The core function of the Ultra Plus is to generate high-resolution, magnified images of samples, enabling users to analyze the surface topography and composition at the micro- and nanoscale level.
Lab products found in correlation
15 protocols using ultra plus scanning electron microscope
SEM and TEM Analysis of Pdd RM-71 Cells
Pdd RM-71 Growth Characterization
Structural Analysis of Prepreg Tape
Hydrogel Formulation for Combination Therapy
FESEM Imaging of Self-Assembled Peptides
scanning electron
microscope operating at 3 kV. To avoid the morphology of the self-assembled
peptides from being obscured by the salts from the buffer, we used
Milli-Q water for scanning electron microscopy (SEM) imaging. Calculated
amounts of peptides were dissolved in the desired solvent (water or
TFE) and allowed to stand for at least 12 h at room temperature (ca.
25 °C). An aliquot of 2 μL of the peptide solution was
then drop-casted on a clean silicon wafer. Samples were allowed to
dry at room temperature in vacuum desiccators for at least 12 h, and
the dried film was sputter-coated with gold prior to imaging.
Characterization of Self-Assembled Nanoparticles
were performed to characterize the size of the self-assembled nanoparticles.
Samples were prepared carefully to minimize the effect of aggregation.
Then, 3–4 μL of peptide solutions was drop-casted on
different substrates followed by drying under high vacuum [Formvar
coated Cu grid for HRTEM, silicon wafer substrate for AFM, and field
emission SEM (FESEM)]. FESEM images were recorded using Zeiss Ultra
Plus scanning electron microscope after gold coating. AFM images were
recorded using Agilent instruments. The imaging was carried out in
tapping mode using a TAP-190AL-G50 probe from Budget sensors which
had a nominal spring constant of 48 N/m and the resonance frequency
of 190. HRTEM images were captured through a 1024 × 1024 digital
CCD camera using a Tecnai-G220-TWIN microscope instrument.
SEM samples were prepared by drop-casting NP and control peptide
solutions (3 μL, concentration: 1 mg/mL in 50:50 EtOH/H2O after lyophilization in 1 mL HFIP) on silicon wafers. Silicon
wafers were then dried at rt for 2 days and imaged. Similarly, HRTEM
samples were prepared by depositing NP solutions (3 μL, concentration:
1 mg/mL in 50:50 EtOH/H2O) on a copper grid, dried at rt
for 1 day, and then imaged. For AFM, samples were drop-casted on freshly
cleaved silicon wafers, air-dried at rt for 2–3 days. Tapping
mode was applied for AFM imaging according to the reported procedures.
Nanofibrous Layer Morphology Analysis
Structural and Optical Characterization of Photocatalysts
Characterization of Aβ Fibril Morphology
Comprehensive Material Characterization Techniques
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