Bi 200sm instrument
The BI-200SM is a light scattering instrument designed for the measurement of the size and size distribution of particles or macromolecules in solution. The instrument uses a laser light source and a highly sensitive detector to measure the intensity of light scattered by the sample, which is then used to determine the particle size characteristics.
Lab products found in correlation
3 protocols using bi 200sm instrument
Dynamic Light Scattering Analysis
Comprehensive Characterization of Nanoparticles
characterization was carried out on a JEOL JEM-2100 EX transmission
electron microscope (Japan). Scanning electron microscope (SEM) measurement
was performed on a JSM-6360LV scanning electron microscope (Japan).
Hydrodynamic diameter (Dh) measurement
was performed with a Brookhaven BI-200SM instrument (USA). Fourier
transform infrared (FT-IR) spectra in KBr were recorded using the
BRUKER TENSOR 27 Fourier transform infrared spectrophotometer. The
crystal structure of nanoparticles was determined on a Rigaku D/max/2500v/pc,
Japan. The X-ray diffraction (XRD) pattern was carried out on a Rigaku
D/max/2500 X-ray diffractometer, Japan. The X-ray photoelectron spectra
(XPS) was obtained on a Shimadzu Kratos AXIS Ultra DLD X-ray photoelectron
spectrometer, Japan. The magnetic properties were analyzed with a
LDJ9600-1 vibrating sample magnetometer, USA. The hydrophilicity was
evaluated with JCY-1 contact angle analyzer, China. Zeta potential
was measured by a Brookhaven ZetaPALS potentiometric analyzer, USA.
MALDI-TOF MS measurements were performed on a Bruker AutoflexIII
LRF200-CID instrument, Germany. DHB (25 mg/mL, V(ACN)/V(H2O)/V(TFA) = 80:19:1) was
used as matrix. All the LC–MS/MS analyses were carried out
on a Orbitrap Q-Exactive mass spectrometer, Thermo Fisher Scientific,
Waltham, MA.
Comprehensive Nanomaterial Characterization Protocols
Bruker, Billerica, MA, USA). N2 adsorption/desorption isotherms were determined on a Tristar 3000 analyzer (Micromeritics, Atlanta, GA, USA), and the resultant data applied to measure the surface area and pore size of the obtained nanoparticles. X-ray photoelectron spectroscopy (XPS)
was conducted with the aid of an Escalab 250Xi (ThermoFisher, Waltham, MA, USA).
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