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Bi 200sm instrument

Manufactured by Brookhaven Instruments
Sourced in United States

The BI-200SM is a light scattering instrument designed for the measurement of the size and size distribution of particles or macromolecules in solution. The instrument uses a laser light source and a highly sensitive detector to measure the intensity of light scattered by the sample, which is then used to determine the particle size characteristics.

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3 protocols using bi 200sm instrument

1

Dynamic Light Scattering Analysis

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DLS measurements were performed by a Brookhaven BI-200SM Instrument equipped with an argon laser (k = 532 nm) at 25 °C. The results obtained were analyzed by the CONTIN method.
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2

Comprehensive Characterization of Nanoparticles

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Transmission electron microscope (TEM)
characterization was carried out on a JEOL JEM-2100 EX transmission
electron microscope (Japan). Scanning electron microscope (SEM) measurement
was performed on a JSM-6360LV scanning electron microscope (Japan).
Hydrodynamic diameter (Dh) measurement
was performed with a Brookhaven BI-200SM instrument (USA). Fourier
transform infrared (FT-IR) spectra in KBr were recorded using the
BRUKER TENSOR 27 Fourier transform infrared spectrophotometer. The
crystal structure of nanoparticles was determined on a Rigaku D/max/2500v/pc,
Japan. The X-ray diffraction (XRD) pattern was carried out on a Rigaku
D/max/2500 X-ray diffractometer, Japan. The X-ray photoelectron spectra
(XPS) was obtained on a Shimadzu Kratos AXIS Ultra DLD X-ray photoelectron
spectrometer, Japan. The magnetic properties were analyzed with a
LDJ9600-1 vibrating sample magnetometer, USA. The hydrophilicity was
evaluated with JCY-1 contact angle analyzer, China. Zeta potential
was measured by a Brookhaven ZetaPALS potentiometric analyzer, USA.
MALDI-TOF MS measurements were performed on a Bruker AutoflexIII
LRF200-CID instrument, Germany. DHB (25 mg/mL, V(ACN)/V(H2O)/V(TFA) = 80:19:1) was
used as matrix. All the LC–MS/MS analyses were carried out
on a Orbitrap Q-Exactive mass spectrometer, Thermo Fisher Scientific,
Waltham, MA.
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3

Comprehensive Nanomaterial Characterization Protocols

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Transmission electron microscopy (TEM) was performed on a JEM 1200EX instrument (JOEL, Tokyo, Japan). Scanning electron microscopy (SEM) was undertaken with a Nova Nano microscope (FEI, Hillsboro, OR, USA). Fourier transform infrared (FT-IR) spectroscopy was performed with a Nicolet Nexus 670 spectrometer (Thermo Fisher, Waltham, MA, USA), and UV-vis spectra on a UV-3600 spectrophotometer (Shimadzu, Tokyo, Japan). Dynamic light scattering (DLS) and polydispersity index (PDI) data were collected on a BI-200SM instrument (Brookhaven Instruments, Holtsville, NY, USA). X-ray diffraction (XRD) patterns were measured using a D8 Advance X-ray powder diffractometer supplied with Cu Kα radiation (40 kV, 40 mA;
Bruker, Billerica, MA, USA). N2 adsorption/desorption isotherms were determined on a Tristar 3000 analyzer (Micromeritics, Atlanta, GA, USA), and the resultant data applied to measure the surface area and pore size of the obtained nanoparticles. X-ray photoelectron spectroscopy (XPS)
was conducted with the aid of an Escalab 250Xi (ThermoFisher, Waltham, MA, USA).
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