2010 fas tem

The morphology of the nanofibers was observed by using scanning electron microscopy (SEM, S-3000N, Hitachi Co., Nagano Kin, Nagano, Japan) with accelerating voltage of 12 kV. The dispersion of nanoparticles on nanofibers was studied by transmission electron microscopy (TEM, 2010 Fas TEM, JEOL, Nagano, Japan) with an accelerating voltage of 200 kV that was used to analyze the dispersion of AgNPs on the nanofibers. The average diameter and size distributions of the nanofibers and AgNPs were determined from SEM and TEM micrographs by image analysis software (image J, version 1.49).

Scanning Electron Microscope (SEM) (JSM-5300, JEOL Ltd., Tokyo, Japan) with 10 kV acceleration voltage and Transmission Electron microscope (TEM) (JEOL 2010 Fas TEM, Tokyo, Japan) with 200 kV accelerating voltage was utilized to investigate the morphological properties of PAN and PAN/AgNPs. All the samples were sputtered coated with platinum (Pt) for 160s at 20mA before SEM analysis. The average diameter of the PAN and PAN/AgNPs was measured by analyzing the SEM images employing the ImageJ 1.50i software. Excel and results were displayed in mean values with standard deviations. This software was also used to measure the nanoparticle size by analyzing the TEM images. The nanofibers’ average diameter was measured over 50 nanofiber strands for each sample, and the size of AgNPs was measured by sampling over 50 nanoparticles.