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Rint 2000 wide angle goniometer

Manufactured by Rigaku
Sourced in Japan

The Rint 2000 is a wide-angle goniometer designed for X-ray diffraction analysis. It is capable of measuring the angular positions and intensities of X-ray diffraction peaks, which can be used to identify the crystalline structures of materials. The Rint 2000 features a wide angular range and high-precision measurements, making it a versatile tool for materials characterization in a variety of research and industrial applications.

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3 protocols using rint 2000 wide angle goniometer

1

Powder X-ray Diffraction and Photoluminescence Analysis

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Powder X-ray diffraction (XRD) measurements were recorded on a D/MAX 2500 instrument (Rigaku) with a Rint 2000 wide angle goniometer and Cu Kα1 radiation (λ = 1.54056 Å) at 40 kV and 100 mA. The diffraction patterns were scanned over an angular (2θ) range of 20−80° at intervals of 0.02° with a counting time of 0.6 s per step. Photoluminescence (PL) studies were conducted on a fluorescence spectrophotometer (Photon Technology International) equipped with a 60 W Xe-arc lamp as the excitation light source. All the measurements were recorded at room temperature.
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2

Characterization of Methotrexate Stability in Reverse Micellar Systems

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The chemical stability of MTX in
RM was monitored by UV–vis (Win-Carry 100) and Fourier transform
infrared (FT-IR) (PerkinElmer) spectrophotometers using the KBr liquid
cell over a frequency range of 4000–400 cm–1. A UV–Vis spectrophotometer (CARY 1E) scan was carried out
for pure MTX solution and AOT-water–OL RM with or without MTX
in the wavelength range of 200–800 nm. The standard curve of
the MTX was prepared by recording the absorbance at 302 nm, and its
stability in RM was also monitored at the same wavelength. The status
of molecular conformations and crystal packing of pure MTX and MTX
in MTX-RM was compared by measurement of thin-film XRD on a silica
substrate using a Rigaku-X-ray diffractometer equipped with RINT2000
wide-angle goniometer (40 kV/40 mA at scan rate 1.2°/min, copper
as an anode).
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3

Characterization of MOF-808 and PBE@MOF-808 Membranes

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The Brunauer–Emmett–Teller (BET) surface area from N2 adsorption–desorption isotherms at 77 K of MOF-808 and PBE@MOF-808 were determined using a 3Flex (Micromeritics Instruments, Norcross, GA, USA). Before the N2 adsorption–desorption measurement, approximately 100 mg of the samples were degassed under vacuum at 150 °C for 24 h. The chemical interactions between PBE copolymers and MOF-808 membranes were investigated using Fourier transform infrared spectroscopy (FT-IR). The morphologies of the membranes and particles were examined using a field-emission scanning electron microscope (FE-SEM, JSM-6701F, JEOL Ltd., Tokyo, Japan) and transmission electron microscope (TEM, Libra 120, Zeiss, operated at 120 kV). The thermal stability of the materials was investigated using thermogravimetric analysis (TGA) through a DTA/TGA analyzer (TA instruments, New Castle, DE, USA) at a heating rate of 10 °C/min under a nitrogen environment. The chain morphology of the polymers was analyzed using differential scanning calorimetry (DSC, (DSC8000, Perkin Elmer, Waltham, MA, USA)) at a scan rate of 10 °C/min under a nitrogen atmosphere. The crystalline structure of the membranes was characterized using X-ray diffraction (XRD, RINT2000 wide-angle goniometer, Rigaku, Tokyo, Japan) with a Cu cathode operated at 40 kV and 300 mA.
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