Rint 2000 wide angle goniometer
The Rint 2000 is a wide-angle goniometer designed for X-ray diffraction analysis. It is capable of measuring the angular positions and intensities of X-ray diffraction peaks, which can be used to identify the crystalline structures of materials. The Rint 2000 features a wide angular range and high-precision measurements, making it a versatile tool for materials characterization in a variety of research and industrial applications.
Lab products found in correlation
3 protocols using rint 2000 wide angle goniometer
Powder X-ray Diffraction and Photoluminescence Analysis
Characterization of Methotrexate Stability in Reverse Micellar Systems
RM was monitored by UV–vis (Win-Carry 100) and Fourier transform
infrared (FT-IR) (PerkinElmer) spectrophotometers using the KBr liquid
cell over a frequency range of 4000–400 cm–1. A UV–Vis spectrophotometer (CARY 1E) scan was carried out
for pure MTX solution and AOT-water–OL RM with or without MTX
in the wavelength range of 200–800 nm. The standard curve of
the MTX was prepared by recording the absorbance at 302 nm, and its
stability in RM was also monitored at the same wavelength. The status
of molecular conformations and crystal packing of pure MTX and MTX
in MTX-RM was compared by measurement of thin-film XRD on a silica
substrate using a Rigaku-X-ray diffractometer equipped with RINT2000
wide-angle goniometer (40 kV/40 mA at scan rate 1.2°/min, copper
as an anode).
Characterization of MOF-808 and PBE@MOF-808 Membranes
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