Em 90

Characterization of raw ilmenite and titanium dioxide nano particles (TiO₂ NPs) were carried out by using different analytical techniques such as transmission electron microscopy (TEM) using a Zeiss EM-90 operating at 80 kV tension. Scanning Electron Microscope (SEM) Model Jeol 6510 JSM, LA. Brunauer–Emmett–Teller (BET) by using N2 adsorption/desorption at 77 K using an automatic surface area device (BELSORP MINI X). X-ray diffraction (XRD) (Paralytical Philips APD-3720, Netherlands) with Cu–kα radiation (λ = 0.154 cm⁻¹) and operated at 40 kV, 35 mA, 5 min scanning speed in the 2θ range of 5°–80°. Fourier transform infrared (FTIR) spectrum of TiO₂ NPs was recorded in the range of 400–4000 cm⁻¹ with a Bruker FT/IR-2000 spectrometer. X-ray fluorescence (XRF) technique using Axios MAX, PAN analytical, 40 kV, 50 Ma.

All chemicals and solvents were purchased from Merck and Sigma-Aldrich (Germany) and used without further purification. A Win-Bomem spectrometer, version 3.04 Galactic Industries Corporation over the range of 400–4000 cm⁻¹ was used to obtain Fourier transform infrared (FT-IR) spectra. The synthesized TiO₂ NPs were coated with a thin layer of gold and visualized using a scanning electron microscopy/energy dispersive X-ray spectroscopy (SEM/EDX) instrument, VWGA3 TESCAN (20.0 KV). For recording the Transmission electron microscopy (TEM) images, so-called TiO₂ NPs were dispersed in distilled water and used a Zeiss EM-90 operating at 80 kV tension. Wide angle X-ray diffraction (XRD) profiles of TiO₂ NPs were collected by using a Bruker D8 Advance diffractometer with wavelength, λ = 0.154059 nm (Cu Kα) at 30 keV.