E4980a precision lcr meter
The E4980A precision LCR meter is a versatile instrument designed for accurate measurement of impedance parameters, such as inductance (L), capacitance (C), and resistance (R). It provides high-precision measurements across a wide frequency range, enabling users to characterize electronic components and materials.
Lab products found in correlation
25 protocols using e4980a precision lcr meter
Capacitance Measurement of Pressure Sensors
Dielectric Constant Measurement of Solvents, Polymers, and Organogels
Characterization of FAPbI3 Single Crystals
Stretchable Current Collectors for Batteries
Comprehensive Characterization of Chalcogenide Compounds
were purchased from commercial sources and used as received. Elemental
analyses (Mo, W, Na, P, Se and Te) were performed via ICP-OES. C,
H, and N contents were determined by microanalysis using an EA 1110
CHNS, CE-440 Elemental Analyzer. Thermogravimetric analysis was performed
on a TA Instruments Q 500 Thermogravimetric Analyzer under nitrogen
flow at a typical heating rate of 10 °C min–1. UV–vis–NIR spectra were collected using a SPECORD
S600 Analytic Jena spectrophotometer in transmission mode using quartz
cuvettes with a 1.0 cm optical path length. Infrared spectra (4000–400
cm–1) of all samples were recorded on a JASCO FTIR-410
spectrometer or a JASCO FT-IR 4100 spectrometer. 125Te
NMR spectroscopy were recorded on a Bruker AVIII 600 MHz spectrometer.
All MS data was collected using a Qtrap, time-of-flight MS (Maxis
Impact) instrument supplied by Bruker Daltonics Ltd. Temperature-dependent
dielectric permittivity was measured using an Agilent E4980A Precision
LCR meter.
Development of MIS Capacitors and OTFTs
On the same substrate OTFTs were realized in a staggered, top–gate bottom–contact configuration with gold source and drain contacts and Al gate and a channel width and length of 10 mm and 10, 20, 40 μm. Transfer characteristic curves were measured applying a drain–to–source voltage of 5 V by means of Agilent B1500A Semiconductor Parameter Analyzer.
Printed Humidity Sensor Response Evaluation
Trap Density of States Analysis
Characterization of Polymer Monomers
Comprehensive Characterization of SWNT/PDMS Substrate
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