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25 protocols using e4980a precision lcr meter

1

Capacitance Measurement of Pressure Sensors

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The Agilent E4980A Precision LCR meter was used to take the capacitance measurements at 15 kHz frequency with a 5 V a.c. signal. A force gauge (Mark-10, Series 5, Force Gauge Model M5-10) along with a mechanized z-axis stage were used to apply the pressures to the sensors. Measurements were performed at controlled temperature (23.5 ± 1°C) and humidity (40 ± 10%). 5 cycles with a step size of 2 μm to a maximum for of 0.5 N and 10 N were repeated for all sensors.
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2

Dielectric Constant Measurement of Solvents, Polymers, and Organogels

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To investigate the polarity of the solvents, polymers, and organogels, we conducted dielectric constant measurement using LCR meter (E4980A precision LCR meter, Agilent Technologies) equipped with accessories of dielectric test fixture and software (16451B and N1500A). Frequency sweeps were performed from 200 Hz to 1 MHz. Dielectric constant of the solvents was measured by non-contact method, while that of AINOs was measured by contact method with 5 mm diameter active electrode and 1 mm height to obtain their capacitance.
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3

Characterization of FAPbI3 Single Crystals

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Powder XRD measurements were performed using a Rigaku (SmartLab-9 kW) x-ray diffractometer equipped with a Cu tube operated at 40 kV and 20 mA. Single-crystal XRD was measured on a Bruker (D8 Quest) x-ray diffractometer. The UV-Vis-NIR absorbance of the FAPbI3 SCs was studied using a spectrophotometer (PerkinElmer, Lambda 950) equipped with an integrating sphere. Photoluminescence spectra were collected using a PicoQuant FT-300 and MT-100 spectrometer, and a 510-nm laser was used as the pulsed excitation source. Capacitance of the SCs at different frequencies was measured in the dark by an impedance analyzer (Agilent-E4980A Precision LCR Meter). The conductivity of the SCs at different temperature was measured using a high-precision source meter (Keysight B2902A). X-ray photoelectron spectroscopy spectra were acquired with a photoelectron spectrometer (Thermo Fisher Scientific, Escalab-250Xi). All the photographs of the FAPbI3 SCs were taken using a digital camera.
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4

Stretchable Current Collectors for Batteries

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Stretchable current collectors were fabricated by thermal evaporation of a gold film of 40–100 nm onto a thin (20 µm) film of SLIC-3. The evaporation rate was 8 Å s−1. The strain-dependence of electronic resistance was measured using a customized stretcher and resistance monitor (Agilent E4980A precision LCR Meter). To make stretchable batteries, the composite electrode slurry was doctor-bladed with a gap height of 10–200 µm directly onto the Au@SLIC film. Following drying in the vacuum glovebox at 60 °C, Au@SLIC + electrode slurries were transferred into the nitrogen-filled glovebox. In the glovebox, the SLIC electrolyte was plasticized, and the components were assembled in the following order: Au@SLIC + LTO || SLIC electrolyte || Au@SLIC + LFP. Aluminum tabs were taped to the edge of the Au@SLIC current collectors, and the entire stack was sandwiched between two slabs of PDMS (EcoFlex DragonSkin 10 Medium) and sealed with a coating of liquid PDMS. Typical stretchable batteries had an active material area of 1 cm2.
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5

Comprehensive Characterization of Chalcogenide Compounds

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All reagents and solvents
were purchased from commercial sources and used as received. Elemental
analyses (Mo, W, Na, P, Se and Te) were performed via ICP-OES. C,
H, and N contents were determined by microanalysis using an EA 1110
CHNS, CE-440 Elemental Analyzer. Thermogravimetric analysis was performed
on a TA Instruments Q 500 Thermogravimetric Analyzer under nitrogen
flow at a typical heating rate of 10 °C min–1. UV–vis–NIR spectra were collected using a SPECORD
S600 Analytic Jena spectrophotometer in transmission mode using quartz
cuvettes with a 1.0 cm optical path length. Infrared spectra (4000–400
cm–1) of all samples were recorded on a JASCO FTIR-410
spectrometer or a JASCO FT-IR 4100 spectrometer. 125Te
NMR spectroscopy were recorded on a Bruker AVIII 600 MHz spectrometer.
All MS data was collected using a Qtrap, time-of-flight MS (Maxis
Impact) instrument supplied by Bruker Daltonics Ltd. Temperature-dependent
dielectric permittivity was measured using an Agilent E4980A Precision
LCR meter.
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6

Development of MIS Capacitors and OTFTs

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Experimental data have been taken from ref. 4 (link) where MIS capacitors were developed by spin–coating P(NDI2OD-T2) upon a gold bottom contact. The semiconductor was patterned22 (link) to suppress the spurious effect of lateral carrier spreading23 (link)–25 (link). PMMA was then spin coated as insulator and Aluminum was evaporated as gate contact. MIS capacitors were measured by means of an Agilent E4980A Precision LCR Meter, applying to the gate an oscillation amplitude of 100 mV of variable frequency superimposed to a biasing constant voltage.
On the same substrate OTFTs were realized in a staggered, top–gate bottom–contact configuration with gold source and drain contacts and Al gate and a channel width and length of 10 mm and 10, 20, 40 μm. Transfer characteristic curves were measured applying a drain–to–source voltage of 5 V by means of Agilent B1500A Semiconductor Parameter Analyzer.
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7

Printed Humidity Sensor Response Evaluation

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The experimental setup for investigating the response of the printed humidity sensor towards varying relative humidity (%RH) is shown in Fig. 7. Electrical connections to the printed sensor were made using the FFCs. The printed sensor was subjected to relative humidity varying from 20% RH to 80% RH, in steps of 10% RH, at a constant temperature of 25 °C in a Thermotron® SE 3000 environmental chamber. The chamber was equipped with a Thermotron® 8800 data acquisition (DAQ) system for controlling, monitoring, graphing and reporting environmental chamber data. The relative humidity and temperature of the chamber were recorded using an integrated humidity sensor HUMICAP 180 from Vaisala and a T-type (Copper/Constantan) thermocouple (T-20 B/W), respectively. During the experiment, an Agilent E4980A precision LCR meter, controlled by a custom-built LabVIEW™ program on a PC, was used to record the resistance of the printed humidity sensor at an operating frequency of 1 kHz and an applied voltage of 1 V.
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8

Trap Density of States Analysis

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TAS was performed using an Agilent E4980A precision LCR meter. During the measurement, the DC bias (V) was fixed at 0 V and the amplitude of the AC bias (δV) was 20 mV. The scanning range of the AC frequency (f) was 0.02–2000 kHz. The tDOS (NT (Eω)) was calculated using the equation NT (Eω) = (−1/qkT) (ωdC/)∙(Vbi/W), where q, k, T, ω and C are elementary charge, Boltzmann’s constant, temperature, angular frequency, and specific capacitance, respectively. W and Vbi are the depletion width and build-in potential, respectively. The demarcation energy Eω = kTln(ω0) (where ω0 is the attempt-to-escape angular frequency and equals 2πv0T2) is derived from the temperature-dependent C–f measurements for a perovskite with a similar composition reported in a previous work where ω0 = 1 × 1011 Hz32 (link). Note the ω0 only determines the energy depth of the trap states from the band edges, and not the impact of relative trap density changes of the device upon irradiation and healing processes.
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9

Characterization of Polymer Monomers

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A Gallenkamp melting point apparatus was used to measure the melting points of the monomers. A Nicolet Impact 410 FT-IR Spectrometer was used with a pellet of sample mixed with KBr to measure the IR spectra. 1H-NMR spectra were recorded using a Bruker XL-500 Spectrometer operating at 500 MHz using CDCl3 and DMSO-d6 as solvents with the data given in parts per million (ppm) and spin–spin coupling constants (J) given in Hz. UV-Vis spectra of solid polymers were determined using a Jasco V670 UV-Vis Spectrophotometer. A Shimadzu Simultaneous Measuring Instrument, DTG–60/60 H was used with a heating speed of 10°C/min from 30°C to 600°C in the air to record the TGA/DTA thermograms. A SEM–Hitachi–4800 was used to perform the SEM analysis of the polymers. The Agilent E4980A Precision LCR Meter (United States) was used to determine the conductivity with polymer tablets of 0.5 cm diameter.
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10

Comprehensive Characterization of SWNT/PDMS Substrate

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The absorption measurement was carried out by Agilent Cary 6000i UV/Vis/NIR. Scanning electron microscopy (SEM) was performed using an FEI Magellan 400 XHR microscope with a 5-kV accelerating voltage and 25 pA current. The conductivity of the SWNT/PDMS substrate was measured using a standard four-point probe method at room temperature. The resistance was obtained using an Agilent E4980A Precision LCR meter. The stretch property was obtained using the home-made stretchable station. PS cycling measurements were performed on a mechanized z axis stage (Newmark Systems, 0.1 mm resolution), and a force gauge (Mark 10) was used to apply loads to the 1-cm2 pressure-sensitive pad on a custom-built probe station. The load values were recorded by a precision balance.
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