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Invenio r spectrometer

Manufactured by Bruker
Sourced in Germany

The Invenio R spectrometer is a high-performance Fourier Transform Infrared (FTIR) spectrometer designed for analytical applications. It features a robust and compact design, providing reliable and accurate infrared spectroscopy measurements.

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7 protocols using invenio r spectrometer

1

Characterization of Advanced Materials

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FE-SEM images were taken by a JEOL
JSM-6500F microscope. The XRD 2θ scan was executed via a lab
source (4-circle) X-ray diffractometer (wavelength = 1.5406 Å;
Cu Kα1, D8 Discover, Bruker). The Raman spectrum
at room temperature was recorded using a 473 nm excitation source.
FTIR spectroscopy in the range 4000–1000 cm–1 was acquired using a Bruker Invenio R spectrometer. The water contact
angles of the samples were measured by SEO, Phoenix 300. The diffuse
reflectance and transmittance spectra were acquired using a Varian,
Cary5000 spectrometer, equipped with an integrating sphere. An Abet
Tech Inc. 10,500 solar simulator was used to replicate the natural
sunlight. The temperature profiles were measured using a Testo-868
(160 × 120 pixels) thermal imager. A 1.5 × 1.5 cm2 IFCS/FP was placed in a square container under the solar simulator
at one and three sun position on an electronic balance (Vibra, AJH-220E-D)
to record the mass change of bulk water. The ion concentrations of
saline and desalinated water were analyzed by ICP mass spectrometry.
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2

Spectroscopic and Thermal Analysis of Coordination Compounds

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The UV-Vis diffuse reflectance spectra were recorded on a Jasco V-660 spectrometer (Jasco, Easton, MD, USA), in the spectral range 200–850 nm, using spectralon [56 (link)] as a standard with 100% reflectance. The three-dimensional fluorescence spectra were recorded on a Jasco FP-6300 spectrofluorometer (Jasco, Easton, MD, USA), with solid samples directed at an angle of 30° to the incident beam. The excitation and emission wavelength ranges were 220–640 nm and 230–740 nm, respectively. The data pitch and bandwidth were 1 nm on both monochromators. The ATR-IR spectra of the coordination compounds were recorded on a Bruker INVENIO-R spectrometer (Bruker Optik GmbH, Ettlingen, Germany) in the spectral range 4000–400 cm−1. The thermal analyses were carried out with a Netzsch STA 449 F1 Jupiter thermoanalyzer (Netzsch-Geratebau GmbH, Selb, Germany) coupled with a Netzsch Aeolos Quadro QMS 403 mass spectrometer (Netzsch-Geratebau GmbH, Selb, Germany). Samples were heated in corundum crucibles up to 1000 °C, with a heating rate 10 °C∙min−1 in synthetic air (20% O2, 80% N2) flow.
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3

Multimodal Characterization of Materials

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Atomic force microscopy (AFM) measurements were performed under ambient conditions using a NanoWizard 3 System (NanoWizard 3, JPK Instruments) in tapping mode with a PPP-NCHR AFM probe. Raman spectra were obtained with an InVia Raman microscope with a 532 nm excitation laser, 1800 mm−1 grating and a spatial resolution of 1 mm from Renishaw, Gloucestershire, UK. Fourier-transform infrared spectroscopy (FTIR) was performed at room temperature with a Bruker Invenio R spectrometer. X-ray diffraction (XRD) measurements were carried out on a Panalytical Empyrean 2 diffractometer with a Ge 220 monochromator, CuKα1 radiation (λ = 0.154056 nm) and a programmable anti-scatter slit.
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4

Structural Characterization of THCPSi Microparticles

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Structural characterization of the THCPSi microparticles was done with N2 sorption at −196 °C using a TriStar 3000 (Micromeritics Inc., USA). The specific surface area was calculated from the isotherm using the Brunauer‐Emmett‐Teller (BET) method, while the total pore volume was obtained from the total amount adsorbed at a relative pressure p/p0 = 0.97. The average pore diameter was estimated with the BET area and total pore volume by assuming the pore shape to be cylindrical. The success of the hydrocarbonization treatment was verified with FTIR spectrometry. The infrared spectra of the THCPSi microparticles were obtained using an Invenio R spectrometer (Bruker Optics, Germany) equipped with a PA301 photoacoustic detector (Gasera Oy, Finland). The morphology of the particles was studied using a field‐emission scanning electron microscope (Thermo Scientific Apreo S, Netherlands).
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5

Synthesis and Characterization of Gallium Iodide Glass

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Gallium iodide samples were prepared in a highly
exothermic reaction
by carefully heating stoichiometric amounts of gallium metal (Aldrich,
99.99%) and iodine powder (VWR Rectapur GPR, ≥99%) up to 300
°C, forming a dark red melt. Samples of the gallium iodide glass
were prepared by air quenching a melt of composition Ga2I3.17 (i.e. Ga38.7I61.3), from 400
°C to room temperature. This composition corresponds to the solubility
limit of Ga in the melt at 400 °C. The composition of the glass
was determined as Ga2I3.17 by back-weighing
the residual Ga metal from samples with Ga metal excess. Differential
scanning calorimetry (DSC) data were collected on a PerkinElmer DSC
8000 system at a rate of 10 K min–1. Raman and Fourier
transform infrared (FTIR) spectra were recorded under an inert atmosphere
on a Renishaw Ramascope (HeNe laser, 633 nm) and a Bruker INVENIO-R
spectrometer, respectively. Time-of-flight neutron diffraction data
were recorded on the GEM instrument (RAL-ISIS, UK) in the range Q = 0.1–60 Å–1. The DC conductivity
and AC admittance data were recorded in a two-probe mode using a UNI-T
61C ohmmeter and an Agilent HP 4294A precision impedance analyzer,
respectively. Further experimental details and data evaluation are
provided in the Supporting Information.
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6

Cryogenic Co-deposition of H2O and C10H16

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Circular CaF2 windows with 15 mm diameter and 2 mm thickness from UQG Optics were mounted onto the cryogenic deposition plate in the vacuum chamber. H2O with 5 wt% D2O and C10H16 were then codeposited at either 100 : 1 or 34 : 1 molar ratio for 2.5 minutes. The optical windows were transferred into a modified Optistat DN-V cryostat from Oxford instruments that was precooled with liquid nitrogen. The cryostat was operated at a base pressure of 5 × 10−4 mbar.
FT-IR spectra were recorded in transmission geometry at 80 K using a Bruker Invenio-R spectrometer with a liquid-nitrogen cooled MCT detector and MIR source. A spectral resolution of 1 cm−1 was used and all spectra were recorded with 512 scans. Background spectra were recorded with blank CaF2 windows in the cryostat.
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7

Spectroscopic Analysis of Wood Samples

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Square samples with an edge length of 5 mm and 1 mm thickness were cut out of each wood. The ATR FTIR spectra were recorded on the Bruker Invenio R spectrometer equipped with a diamond ATR unit (Bruker Optik GmbH, Ettlingen, Germany) in the range of 4000-400 cm -1 using 64 scans at a resolution of 4 cm -1 . The samples were pressed on the ATR-crystal with a built-in applicator to ensure a reproducible and constant force. Prior to measurements a background spectrum with an empty specimen compartment was recorded and automatically subtracted from the spectra in the following measurements. For each wood, two samples were analysed, and their spectra averaged. The spectra were baseline corrected and vector-normalised using the software OPUS version 8.2 (Bruker Optik GmbH, Ettlingen, Germany).
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