Overview bright-field (BF) TEM images were acquired with a JEOL JEM-1011 instrument equipped with a thermionic W source operating at 100 kV. Energy-filtered TEM (EFTEM) and high-resolution TEM (HRTEM) images were obtained using an image-Cs-corrected JEOL JEM-2200FS TEM with a Schottky emitter, equipped with an in-column image filter (Ω-type) and operating at 200 kV. The elemental maps were obtained by using the three-windows method at the O K, Fe K and Cu L23 core-loss edges. Overview high-angle annular dark field- scanning TEM (HAADF-STEM) images were acquired on a FEI Tecnai G2 F20 TWIN TMP TEM.
Tecnai g2 f20 twin tmp tem
Manufactured by Thermo Fisher Scientific
The Tecnai G2 F20 TWIN TMP TEM is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials at the nanoscale. It features a field emission gun (FEG) source, a twin-lens objective, and a Tilt-Rotate-Tilt (TRT) specimen holder, allowing for advanced imaging capabilities. The core function of this TEM is to provide researchers with a powerful tool for the study of the atomic-scale structure and composition of a wide range of materials.
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2 protocols using tecnai g2 f20 twin tmp tem
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Transmission Electron Microscopy Imaging
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In situ TEM Analysis of CdSe Nanosheets
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The CdSe nanosheets were loaded on TEM grids with amorphous carbon film by dropping a few drops of a chloroform solution containing the nanosheets. To analyze the phase transformation, in situ TEM and STEM/EDS of the nanosheets were performed with a Titan Themis Z TEM (FEI, Thermo Fisher Scientific) at an accelerating voltage of 300 kV. An image corrector (CETCOR, hexapole‐type Cs‐corrector), probe corrector (DCOR, hexapole‐type Cs‐corrector), and Ceta2 camera (4k × 4k pixels, 16‐bit dynamic range, 40 frames per second) were used for in situ TEM. The in situ TEM data were analyzed using FIJI software and custom MATLAB codes.
For in situ heating TEM, CdSe nanosheets were loaded on heating chips (Protochips). The data were collected with a Tecnai G2 F20 TWIN TMP TEM (FEI, Thermo Fisher Scientific) at an operating voltage of 200 kV. An in situ heating holder (Fusion Select, Protochips) was used to control the temperature of the samples during TEM measurements.
For in situ heating TEM, CdSe nanosheets were loaded on heating chips (Protochips). The data were collected with a Tecnai G2 F20 TWIN TMP TEM (FEI, Thermo Fisher Scientific) at an operating voltage of 200 kV. An in situ heating holder (Fusion Select, Protochips) was used to control the temperature of the samples during TEM measurements.
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