Nexsa base model

A Bruker 3000 Hyperion Microscope outfitted with a Vertex 80 FTIR spectrometer was utilized on the KBr pellets. The Phillips X’pert Pro MPD (multipurpose diffractometer) was used to perform powder XRD at a scan speed of 2°/min utilizing Cu K radiation (2 = 10–90). Jeol 6390LA/OXFORD XMX N is used for SEM-EDS analysis with accelerating voltage of 0.5 to 30 kV and magnification up to 30k. EDS has a resolution of 136 eV and an area detector of 30 mm². HRTEM was investigated by Jeol/JEM 2100 (200 KV), consisting LaB6 electron gun having lattice resolution and point resolution is 0.14 nm and 0.23 nm, respectively. The free radical test has done by the ESR technique (JES-FA200). The VSM lakeshore model (7400 series) determines the magnetic properties of the catalyst. Nova Station B was used in the N₂ atmosphere for N₂ adsorption-desorption. Before that, the sample was degassed at 80 °C. XPS analysis was obtained from the Nexsa base model made by Thermo Fischer Scientific. FT-RAMAN spectrometer analysis is obtained using Bruker RFS with a wavelength of 50–5000 cm^–1. HPLC with LCMS received from Agilent 6545XT AdvanceBio LC/Q-TOF to know the end products and understand the formation of the iron cluster. The dye concentration was measured by a Genesys 10S UV-Vis spectrophotometer.

Powder X-ray diffraction (XRD) spectroscopy, Fourier Transform Infra-Red (FTIR), Spectroscopy, scanning electron microscopy (SEM), X-ray energy dispersion spectroscopy (EDS), X-ray photoelectron spectroscopy (XPS), and CHNS analyzer, were used to characterize the WNS-SO₃H catalyst. The ELEMENTAR vario EL III device was employed as a CHNS analyzer to determine the percentage amount of carbon, hydrogen, nitrogen, and sulfur. The XRD pattern in the catalyst was studied in a Philips X'pert Pro diffractometer equipped with Cu-K with a scanning rate of 2° min⁻¹ and a range of 2θ between 10° and 90°. The functional groups in the catalyst were identified using FT-IR spectroscopy. For FT-IR spectroscopy in the 4000–400 cm⁻¹ range, a Vertex 80 equipped with a Bruker 3000 Hyperion Microscope spectrometer and KBr pellets was used. For SEM–EDS; Jeol 639OLA/OXFORD XMX N was employed to look over the surface morphology of the WNS-SO₃H. SEM–EDS was performed using an acceleration voltage of 0.5–60 eV and an EDAX detector area of 30 mm². The XPS was performed on a Thermofisher Scientific Nexsa base model equipped with Auger electron microscopy, which has an ionization energy range of 21.2–40.8 eV. The TGA analysis was performed using TGA-DTA Hitachi STA7000 in the temperature range of 30–600 °C.