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Afc 10 saturn 724 ccd diffractometer

Manufactured by Rigaku

The AFC-10/Saturn 724+CCD diffractometer is a laboratory instrument designed for single-crystal X-ray diffraction analysis. It combines the AFC-10 automated four-circle goniometer with the Saturn 724+ CCD (Charge-Coupled Device) detector. This system enables the collection of high-quality single-crystal X-ray diffraction data for structural analysis and characterization of crystalline materials.

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2 protocols using afc 10 saturn 724 ccd diffractometer

1

Comprehensive Characterization of Energetic Materials

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Infrared spectra (IR) is recorded on a Bruker Equinox 55 infrared spectrometer. Elemental analyses (C, H, O, and N) are performed on a varioMICRO cube fully automatic trace element analyzer. 1H and 13C NMR spectra are recorded on Bruker Advance 400 nuclear magnetic resonance spectrometers. The single crystal X-ray diffraction data collections are carried out on a Rigaku AFC-10/Saturn 724+CCD diffractometer. The density at 25 °C is determined by Micromeritics Accupyc II 1340 pycnometer automatic true density meter. Thermal decomposition temperatures are determined by using DSC and thermogravimetric (TG) on a CDR-4 of Shanghai Precision & Scientific Instrument Co., Ltd. The long-term thermal stability, flame and electrostatic discharge sensitivity, bulk density, flowability, PD, solubility, and MPC test (or initiation capability test) are measured according to the method given by GJB 5891-2006, respectively. Impact and friction sensitivity measurements were made using a standard BAM Fall hammer and a BAM friction tester. The heat of formation is calculated with the Gaussian 09 software. The detonation parameters are calculated based on the program suite of EXPLO5 (version 6.02).
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2

Single Crystal X-ray Diffraction of BHM

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The data collections of the single crystal X-ray diffraction of BHM (0.24 × 0.23 × 0.2 mm) were carried out on a Rigaku AFC-10/Saturn 724 + CCD diffractometer with graphite-monochromated Mo Kα radiation (λ = 0.71073 Å), using the multi-scan technique. The structures were determined by direct methods using SHELXS-2014 and refined by full-matrix least-squares procedures on F2 with SHELXL-2014. A total of 9673 integrated reflections were collected, and 2896 were unique in the range with Rint = 0.0434 and Rsigma = 0.0409. The maximum/minimum residual electron density = 0.396/−0.428 eÅ−3. Structural information was deposited with the Cambridge Crystallographic Data Center (CCDC 1902058).
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