For understanding various physicochemical features, nanoparticles were characterized by UV-Vis spectroscopy analysis (UV-1800 Shimadzu, Japan), XRD (Bruker D8 advance, Germany), FTIR (IRaffinity 1, Shimadzu, Japan), Zeta potential (Malvern Zetasizer, UK), SEM (EVO 18 Carl Zeiss, Germany) and TEM (FEI-Tecnai G2 20, USA)
D8 advance
Manufactured by Shimadzu
Sourced in Germany, Japan
The Shimadzu D8 Advance is an X-ray diffractometer. It is designed for the analysis of the atomic and molecular structure of materials.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Evo 18, by Zeiss (1 mentions)
Iraffinity 1, by Shimadzu (1 mentions)
Uv 1800, by Shimadzu (1 mentions)
S 4800, by Shimadzu (1 mentions)
Jem 2100f, by Shimadzu (1 mentions)
Mpms xl, by Quantum Design (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Gemini 300, by Zeiss (1 mentions)
Avio 200 icp oes, by PerkinElmer (1 mentions)
Lambda 750, by PerkinElmer (1 mentions)
Talos f200, by Thermo Fisher Scientific (1 mentions)
Ultra plus, by Zeiss (1 mentions)
Spm 9700, by Shimadzu (1 mentions)
6 protocols using d8 advance
1
Nanoparticle Characterization Techniques
2
Comprehensive Material Characterization
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The morphologies of the samples were investigated by SEM (S4800, Japan), TEM (JEM-2100F, Japan), AFM (Veeco dimension V, USA), XRD (D8 Advance, Germany), UV-vis diffuse reflectance spectra (Shimadzu UV2550, Japan), XPS (Thermo ESCALAB 250, USA), inductively coupled plasma-atomic (ICP) mass spectrometry (Atomscan Advantage, Germany), superconducting quantum interference device (Quantum Design MPMS–XL, USA), X-ray absorption near-edge structure (Beamline of BL12B of Nation al Syncrotron Radiation Laboratory, China), Theoretical calculations (National Super Computing Centre in Jinan, China).
3
Comprehensive Material Characterization Protocol
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The obtained products are characterized by scanning electron microscopy (SEM, Gemini 300, ZEISS, Oberkochen, Germany), transmission electron microscopy (HRTEM, Tecnai G2 F20, FEI, Hillsboro, OR, USA) combined with an energy dispersive X-ray spectroscopy (EDS), X-ray diffraction (XRD, Bruker D8 Advance, and the data is collected on a Shimadzu XD-3A diffractometer using Cu Ka radiation, Bruker, Karlsruhe, Germany), X-ray photoelectron spectroscopy (XPS, Thermo Fisher K-Alpha American with an Al K X-ray source, Thermo Scientific, Waltham, MA, USA), and Raman spectroscopy (532 nm laser, Jobin Yvon T6400, Horiba Scientific, Kyoto, Japan).
4
Soy Lecithin and Apigenin XRD Analysis
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Moderate amounts of soy lecithin, apigenin, SLA, and PMSLA were used to conduct the XRD experiment.
A D8 Advance X-ray diffractometer (XRD-6100, Shimadzu, Japan) was used to generate monochromatic Cu Ka radiation (wavelength = 1.54056 A°). 40 kV was set as the tube voltage while 40 mA was set as the tube current. The scanning regions of the diffraction angle (2 θ) were set between 5°C and 70°C with the scanning speed of 4°C/min.
A D8 Advance X-ray diffractometer (XRD-6100, Shimadzu, Japan) was used to generate monochromatic Cu Ka radiation (wavelength = 1.54056 A°). 40 kV was set as the tube voltage while 40 mA was set as the tube current. The scanning regions of the diffraction angle (2 θ) were set between 5°C and 70°C with the scanning speed of 4°C/min.
5
Characterization of Graphene-Based Materials
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CV, EIS, and DPV
studies were carried out using the electrochemical workstation (model
CHI660C, CH Instruments). The characterizations of the materials GO,
rGO, and ErGO were analyzed using a Powder XRD (Model Bruker D8 Advance),
FTIR spectrophotometer (Model Shimadzu IR Affinity-1), TA instruments
(Model SDT Q600), Nanosizer (Model Horiba Scientific, SZ 100), UV–visible
spectrophotometer JASCO (V-670 PC), SEM (Model Carl Zeiss EVO/18 Research),
FESEM (Thermo Fisher FEI QUANTA 250 FEG), and Avio 200 ICP-OES (Perkin
Elmer).
studies were carried out using the electrochemical workstation (model
CHI660C, CH Instruments). The characterizations of the materials GO,
rGO, and ErGO were analyzed using a Powder XRD (Model Bruker D8 Advance),
FTIR spectrophotometer (Model Shimadzu IR Affinity-1), TA instruments
(Model SDT Q600), Nanosizer (Model Horiba Scientific, SZ 100), UV–visible
spectrophotometer JASCO (V-670 PC), SEM (Model Carl Zeiss EVO/18 Research),
FESEM (Thermo Fisher FEI QUANTA 250 FEG), and Avio 200 ICP-OES (Perkin
Elmer).
6
Perovskite Solar Cell Characterization
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The SnO2 nanoparticles were characterized using a high resolution TEM (Talos F200S, Thermo Fisher, USA). The surface morphologies and microstructures of SnO2 films, perovskite films and the cross-sectional structure of these PSCs were investigated using a field-emission scanning electron microscopy (FESEM, Zeiss Ultra Plus). The SnO2 and perovskite films were also characterized by TOF-SIMS (TOF.SIMS 5-100, ION-TOF GmbH), UV-Vis spectrometer (lambda 750 S, PerkinElmer), X-ray diffractometer (XRD, D8 Advance), atomic force microscope (AFM) and kelvin probe force microscope (KPFM) (SPM9700, Shimadzu, Japan), respectively. The thickness of the perovskite, SnO2 and FTO tested in TOF-SIMS are approximately 500 nm, 100 nm and 800 nm, respectively. The EIS measurements of these PSCs were carried out by an EC-lab (SP300). The J-V curves of these PSCs were measured using a Keithley 2400 source meter at room environment. The light source was a solar simulator (Oriel 94023 A, 300 W) to match AM 1.5 G. The intensity of the light was 100 mW cm−2 calibrated by a standard silicon reference solar cell (Oriel, VLSI standards). All the devices were tested using a black metal aperture with a defined active area of 0.16 cm2 for the small devices and 16.07 cm2 for the large 5 cm × 6 cm PSCMs, respectively.
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