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Emx 10 12 spectrometer

Manufactured by Bruker
Sourced in Germany

The EMX-10/12 spectrometer is a compact and versatile X-band electron paramagnetic resonance (EPR) spectrometer designed for a wide range of applications. It features a stable and high-sensitivity detection system, providing reliable and accurate measurements. The instrument is capable of operating at both 10 and 12 GHz frequencies, allowing for flexibility in experimental setups. The EMX-10/12 spectrometer is a core tool for researchers and scientists in the field of EPR spectroscopy.

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16 protocols using emx 10 12 spectrometer

1

Detecting Reactive Species by EPR

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The reactive species created by the piezocatalyst were detected by the electron paramagnetic resonance (EPR) technique with a Bruker EMX-10/12 spectrometer. First, 10 mg samples were dissolved in 10 mL of deionized water or 10 mL of dimethyl sulfoxide for •OH and •O2 detection, respectively. After 15 min of vibration, 200 μL solution was taken out and 20 μL of 5,5-dimethyl-1-pyrroline N-oxide (DMPO) was added into the solution. The reactive species were detected immediately after ultrasound for 0, 1, and 5 min. For the •OH in 3% H2O2, we used a Fenton reaction to release the reactive species. Briefly, 10 μL of 5 mmol L−1 FeSO4 was mixed with 20 μL DMPO, and 180 μL of 3% H2O2 was added in the mixed solution. Under ultrasonic vibration for 30 s, the •OH created by this classical reaction was detected.
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2

Characterization of Faceted Nanomaterials

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The powder XRD analysis was carried out on a Philips X’Pro X-ray diffractometer using Cu Kα irradiation (λ = 1.54184 Å) operated at 40 kV and 40 mA at 25 °C. High-resolution TEM images were obtained on an FEI Titan 80/300 S/TEM with an acceleration voltage of 200 kV. Electron paramagnetic resonance (EPR) spectra were recorded on the samples with the same mass (50 mg) by a Bruker EMX-10/12 spectrometer at room temperature. The Brunauer–Emmett–Teller specific surface areas of the samples were measured by nitrogen adsorption at 77 K using a Micromeritics tristar ASAP 2020 instrument. The contents of C and N impurities of the samples were analyzed using a Heraeus CHN-0-Rapid analyzer. XPS spectra of both faceted samples were obtained on an Ulvac-PHI PHI 5000 VersaProbe instrument.
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3

EPR Characterization of TiO2 Nanoparticles

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For EPR measurements,
the powder sample was inside a Suprasil quartz glass tube connected
to an appropriate high vacuum pumping system (p <
10–6 mbar). Spectra acquired on MOCVS and FSP grown
TiO2 nanoparticle powders (Figure 1) were performed with a Bruker EMXplus-10/12/P/L
X-band spectrometer equipped with a waveguide Cryogen-Free System
from Oxford Instruments. The spectra were recorded at 10 K with a
field modulation frequency of 100 kHz, modulation amplitude of 0.2
mT, and microwave frequency of 9.30 GHz. Spin quantification was carried
out with the Xenon software from Bruker. The detailed EPR analysis
discussed along Figures 3, 5, and 6 was carried
out with a Bruker EMX 10/12 spectrometer using a Bruker ER 4102ST
standard rectangular resonant cavity in the TE102 mode. The g values were determined on the basis of a DPPH standard.
For quantitative measurements, the spin concentrations were obtained
by double integration of EPR signals, which were measured at T = 77 K using a microwave power of 200 μW.
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4

Physicochemical Characterization of Nanomaterials

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Transmission electron microscopy (TEM) was conducted on a JEM-2100 transmission electron microscope (JEOL Ltd., Tokyo, Japan) at the operating voltage of 200 kV. The chemical composition of was performed by X-ray photoelectron spectroscopy (XPS) with PHI5300 electron spectrometer using 250 W, 14 kV, Mg Ká radiation (PE Ltd., Boston, MA, USA). UV-Vis absorption spectra were recorded on UV-2450 spectrophotometry (Shimadzu Corporation, Honshu Island, Japan). Electron paramagnetic resonance (EPR) measurements were recorded using an EMX-10/12 spectrometer (Bruker, Karlsruhe, Germany).
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5

EPR Spectroscopy of Hydrogen Radicals

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5,5-dimethyl-1-pyrroline N-oxide (DMPO) was used to capture the instable hydrogen radical to form the DMPO-H adduct to generate EPR spectra64 . In the experiments, 5 ml electrolyte was mixed with 10 μL DMPO and was deoxygenated by bubbling Ar. The potentiostatic electrolysis was carried out for 5 min in the H-type cell under the protection of Ar. EPR measurement was performed by Bruker EMX-10/12 spectrometer operating at a frequency near 9.5 GHz, sweep width of 200 G and power of 20 mW.
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6

Comprehensive Analytical Techniques for Material Characterization

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SEM images were acquired from a SU‐70 electron microscope (Japan). TEM images, high‐angle annular dark‐field images, EDS element mappings were obtained on a Talos F200 electron microscope (US). Nitrogen adsorption–desorption isotherm and pore‐size distribution were performed by a Tristar 3000 system (US). XRD was tested on an Ultima IV X‐ray diffractometer (Japan). XPS spectra were recorded by Thermo Fisher Scientific K‐Alpha+ (US). FTIR spectra were recorded by a Nicolet Avatar 360 spectrometer (US). UV–vis–NIR absorption spectra were performed on a UV‐3600 spectrometer (Japan). Element concentration was determined by an Agilent 5100 inductively coupled plasma optical emission spectrometer (Switzerland). ESR spectra were performed on a Bruker EMX‐10/12 spectrometer (Germany). CLSM images were acquired on a Leica TCS SP5 CLSM (Germany). NIR fluorescence images were acquired by a Series II 900/1700 NIR‐II small animal imaging system (China). NIR photoacoustic images were acquired by a VisualSonics Vevo‐2100 system (Canada).
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7

Comprehensive Characterization of Nitrogen-Doped Graphene Quantum Dots

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Transmission electron microscopy (TEM) images were obtained at 200 kV from a transmission electron microscope (JEM-2100; JEOL, Japan). Freshly peeled mica was used as the substrate to deposit NGQDs for atomic force microscopy (AFM) measurement. Tapping mode was employed to obtain AFM images on a Bruker Multimode 8 (Bruker, United States). X-ray photoelectron spectroscopy (XPS) was obtained with Mg Ká radiation (250 W, 14 kV) on an electron spectrometer (PHI5300; Perkin-Elmer, United States). The ultraviolet-visible (UV-Vis) absorption and fluorescence spectra were taken by a UV-Vis spectrometer (UV-2450; Shimadzu, Japan) and a fluorescence spectrometer (RF-5301PC; Shimadzu), respectively. The fluorescence emission spectrum was obtained when excited at 465 nm, and the fluorescence excitation spectrum was measured using an emission wavelength of 520 nm. The absolute photoluminescence (PL) quantum yield was determined by a fluorescence spectrometer (FL 3C-11; Hariba Scientific, United States). Electron paramagnetic resonance (EPR) spectrum was recorded on an EMX-10/12 spectrometer (Bruker, Germany).
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8

Electron Paramagnetic Resonance Spectroscopy of TbMscL

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Room temperature: 30 μL of purified TbMscL samples at monomer concentrations of ~450 µM were loaded into glass capillary tubes. Spectra were recorded on a Bruker EMX 10/12 spectrometer operating at ~9 GHz with 100 kHz modulation frequency using an ELEXSYS Super High Sensitivity Probehead (Bruker ER4122SHQE). Spectra were averaged for 20 scans with a modulation amplitude of 0.2 mT, magnetic field sweep width of 16 mT and magnetic field center at 350.5 mT. X-axis resolution was set to 512, microwave bridge power to 1 mW and both time constant and conversion time were set to 40.96 ms.
Low temperature (i.e., 80 K). Sample preparation was identical to the one described for PELDOR. Measurements were carried out using a Bruker ELEXSYS E580 X-band spectrometer with an Oxford Instruments CF935 helium flow cryostat operating with liquid nitrogen and Flexline probehead housing 5 mm dielectric ring resonator (MD5) that was critically coupled. Spectra were taken as single scans with a modulation amplitude of 0.2 mT, magnetic field sweep width of 20 mT and magnetic field center at 346.0 mT. X axis resolution was set to 1024, microwave bridge power to 1.5 µW, time constant to 40.96 ms and conversion time was set to 346 ms.
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9

Measuring Labeling Efficiency via CW EPR

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Room-temperature CW EPR measurements to assess labelling efficiency were performed using a Bruker EMX 10/12 spectrometer equipped with an ELEXSYS Super Hi-Q resonator at an operating frequency of ∼9.9 GHz (X-band) with 100 kHz modulation. Samples were recorded using a 120 G field sweep centred at 3505 G, a time constant of 20.48 ms, a conversion time of 18.67 ms, and 1714 points resolution. An attenuation of 20.0 dB (2 mW power) and a modulation amplitude of 0.7 G were used. Csx23 samples were measured in 20 μl capillaries at ∼30 μM monomer concentration and double integrals were compared to 4-hydroxy-TEMPO (4-hydroxy-2,2,6,6-tetramethylpiperidine 1-oxyl; Acros) as a standard. Labelling efficiency was ∼63% for the N62R1 mutant and ∼73% for both V52R1 and N59R1 mutants; samples showed negligible free spin label contribution and the shape of the spectra suggested low mobility of the label (Supplementary Figure S9).
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10

Comprehensive Materials Characterization

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The samples were characterized using different techniques. X-ray diffraction (PAN analytical Empyrean CuKα = 0.15406 nm, 40 kV, 40 mA) from 5° to 90° was used for phase and crystal structure studies. The morphology of samples was identified by scanning electron microscopy (SEM, Hitachi, Ltd., S4700). Reflectance spectroscopy was analyzed by a UV-3600 spectrophotometer (Shimadzu Corporation) in the wavelength range of 200–800 nm with barium sulphate as the reference. X-ray photoelectron spectroscopy (XPS) characterization was carried out on an ESCALAB 250Xi (Thermo Fisher Scientific Inc.) spectrometer using an Al Kα source. Specific surface areas were measured by Brunauer–Emmett–Teller (BET) nitrogen adsorption–desorption at 77 K on Micromeritics ASAP-2010. The electrochemical workstation CH1760E equipped with a Xe lamp (AM 1.5G) was used for photoelectron measurements. Electron spin-resonance spectroscopy (ESR) was conducted on a Bruker model EMX 10/12 spectrometer (Bruker, Germany) equipped with a Hg lamp for the measurement of the signals of radicals spin-trapped by 5,5-dimethyl-1-pyrroline N-oxide (DMPO) at a microwave frequency of 9.77 GHz.
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