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29 protocols using phi 5000 versaprobe 3

1

UPS Analysis of Material Properties

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UPS was performed with an incident light energy of 21.22 eV (He I source), path energy of 1.3 eV, and step size of 0.01 eV, using a PHI 5000 VersaProbe III (ULVAC-PHI, Chigasaki, Japan). A bias of −5 V was applied to the sample to measure the secondary electron cut-off energy. Spectra were also obtained with zero bias to measure the VBM edge.
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2

XPS Analysis of Coated Titanium Alloy

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A PHI 5000 Versa Probe III (ULVAC Inc, Kanagawa, Japan) XPS with a monochromatic Al Kα X-ray source (45°, 1486.6 eV, 50 W, sampling area: 200 μm diameter) was used to determine the elemental composition of the uncoated and coated eTi under ultra-high vacuum (10−8 Pa). All eTi discs were gently dried with a nitrogen stream and stored in a vacuum desiccator overnight before XPS analysis. Survey spectra were collected at 0-1100 eV using a pass energy of 280 eV with a step size of 1.0 eV. Three samples were scanned per group while each sample was measured in 4 different locations with 15 scans per location. Peak fitting and semi-quantification of surface elemental composition were performed in MultiPak (PHI, ULVAC Inc, Kanagawa, Japan).
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3

PEEK Surface Analysis by XPS

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An X-ray photoelectron spectrometer (XPS, PHI 5000 VersaProbe III, ULVAC-PHI Inc., Chigasaki, Japan) was harnessed to scrutinize the surface composition of PEEK samples. The examination prominently centered on quantifying the relative abundances of carbon (C), oxygen (O), and sulfur (S) on the samples’ surfaces. Further depth was added by analyzing the functional groups’ content, varieties, and relative ratios detected in the C1s peak spectrum. Notably, the carbon–carbon (C–C) spectral peak, pinpointed at 284.8 eV, was consistently used as a reference anchor for charge correction throughout the analysis.
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4

Surface Elemental Composition Analysis by XPS

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An X-ray photoelectron spectrometer (XPS; PHI 5000 VersaProbe III, ULVAC Inc.) was used to quantify the surface elemental composition with a monochromatic Al Kα X-ray source (45°, 1486.6 eV, 50 W, sampling area; 200-μm diameter). Survey spectra were collected using a pass energy of 280 eV and a step size of 1.0 eV. Charge compensation was used, and spectra were calibrated to the C 1s signal at 284.8 eV. Surface elemental composition [as atomic composition (At %)] was determined using MultiPak (ULVAC Inc) from background-subtracted (system optimized) peak areas (n>3).
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5

Multimodal Characterization of Biomaterial Samples

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The organic element content was determined using elemental analysis (EA) (EA 2400 II, PerkinElmer, USA). Because the nitrogen content of various proteins was 16%, the amount of protein in the samples was obtained by multiplying the percentage of nitrogen element by 6.25 [36 (link)]. The morphology, structure, and elemental maps of the samples were determined by scanning electron microscopy (SEM) (Sigma 300, Zeiss, German) with energy dispersive X-ray spectroscopy (EDS). A fluorescence microscope (IX73P2F, Olympus, Japan) was used to collect optical and fluorescence microscopy images. Other characteristics were determined using Fourier transform infrared spectroscopy (FT-IR) (Vertex 70, Bruker, USA), X-ray photoelectron spectroscopy (XPS) (PHI-5000 Versaprobe III, ULVAC-PHI, Japan), X-ray diffraction (XRD) (SmartLab, Rigaku, Japan), and flow cytometry (FCM) (MoFlo Astrios EQ, Beckman Coulter, USA).
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6

Comprehensive Analytical Characterization

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The elemental analyses (C, H and N) were measured on an EA-3000 elemental analyser (Euro Vector, Italy). FT-IR spectra were recorded on Thermo IS 5 FT-IR spectrometers (Walthamm, MA, USA) in the range of 4000–400 cm−1. The PXRD data of the samples were measured on a Bruker D8 ADVANCE (Karlsruhe, Germany). Thermogravimetric analyses (TGA) were measured using a Japan Shimadzu DTG-60 H thermal analyser (Shimadzu, Tokyo, Japan). The UV-vis absorption spectra were collected on a UT-1950 spectrophotometer (Persee, Beijing, China) in the range of 200–800 nm. The liquid CD spectra were measured on a JASCO J-1500 spectropolarimeter (JASCO, Tokyo, Japan) in the range of 200–800 nm and the solid CD spectra were measured by KBr pellet (sample: KBr = 1: 200). ESI-MS spectra were measured using a Thermo Scientific (Walthamm, MA, USA) Q Exactive HF-X mass spectrometer equipped with an ESI source and in the positive ion mode from m/z 100 to 1600. HPLC were measured with Waters upc2 (Waters, Milford, MA, USA) Chiralpak IG using MeOH/CO2 = 20:80 with flow rate of 2.0 mL/min and detection at 214 nm. X-ray photoelectron spectra (XPS) were measured with a PHI 5000 Versaprobe III (ULVAC-PHI, Kanagawa, Japan) with monochromatized Al Kα-X-rays (Hv,1486.6 eV) operating at 150 W, and were calibrated by the BE of the C component (BE = 284.6 eV) coming from contamination carbon.
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7

XPS Analysis of Peptide-Immobilized Surfaces

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An X-ray photoelectron spectroscopy (XPS) spectrometer (PHI 5000 VersaProbe III, ULVAC Inc., Chigasaki, Japan) was used to assess the surface elemental composition with a monochromatic Al Kα X-ray source (45°, 50 W, 1486.6 eV, sampling area; 200 μm diameter spot) of the peptide-immobilized surfaces and controls. Survey spectra were collected with a step size of 1.0 eV and a pass energy of 280.0 eV with charge compensation. Spectra were calibrated to the C 1s signal at 284.8 eV using the associated software (MultiPak, 9.6.0).
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8

XPS Analysis of Peptide-Immobilized Surfaces

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An X-ray photoelectron spectroscopy (XPS) spectrometer (PHI 5000 VersaProbe III, ULVAC Inc., Chigasaki, Japan) was used to assess the surface elemental composition with a monochromatic Al Kα X-ray source (45°, 50 W, 1486.6 eV, sampling area; 200 μm diameter spot) of the peptide-immobilized surfaces and controls. Survey spectra were collected with a step size of 1.0 eV and a pass energy of 280.0 eV with charge compensation. Spectra were calibrated to the C 1s signal at 284.8 eV using the associated software (MultiPak, 9.6.0).
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9

X-ray Photoelectron Spectroscopy Analysis of Sensor Surfaces

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A X-ray photoelectron spectrometer (XPS; PHI 5000 Versa Probe III, ULVAC Inc, Kanagawa Japan) with a monochromatic Al Kα X-ray source (45°, 1486.6 eV, 50 W, sampling area: 200-μm diameter) was used to determine elemental composition of the four different sensor surfaces without and with pellicle. Survey spectra were collected at 0−1100 eV using a pass energy of 280 eV with a step size of 1.0 eV. Sensors were put into a desiccator to dry overnight prior to measurements. Each sensor was measured in 4 different locations with 15 scans per location.
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10

Synthesis and Characterization of Cerium Oxide Nanoparticles

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The synthesis of CNPs has been described in detail in our previous study (Yu et al., 2022 (link)). The particle size and morphology of CNPs were evaluated using transmission electron microscopy (TEM, JEM-2100, JEOL, Japan). In order to reduce the agglomeration phenomenon during CNPs detection, the obtained CeO2 solution was dispersed in water and sonicated for 1 h. The solution was then added dropwise onto a copper mesh (with a 20-nm thickness of carbon support attached to the mesh) using a dropper and left to dry for observation. Moreover, a small amount of CeO2 solution dispersed in water was diluted. About 1/3–2/3 of the liquid was put in the cuvette, and the hydrated particle size and distribution of CNPs were measured using dynamic light scattering (DLS, Nanosizer ZS90, Malvern, UK). X-ray photoelectron spectrometer (PHI-5000 Versaprobe III, ULVAC-PHI, Japan) was used to detect the valence distribution of Ce in CNPs. After freeze-drying the sample, a certain amount of powder was taken under the XPS for detection. The binding energy of C1s (285eV) was used as the internal reference for all measurements.
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