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Inspect f50 scanning electron microscope

Manufactured by Thermo Fisher Scientific
Sourced in United States

The Inspect F50 scanning electron microscope is a high-performance imaging tool designed for detailed surface analysis. It utilizes a focused electron beam to generate images that provide information about the topography and composition of a specimen's surface. The Inspect F50 offers high resolution and versatility, making it a valuable instrument for applications in materials science, nanotechnology, and other fields requiring advanced microscopic analysis.

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8 protocols using inspect f50 scanning electron microscope

1

Additive Effect on Lubricant Tribology

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An MMW-1A vertical universal frictional tester (Shunmao, Jinan, China) was used to perform four-ball tests on different lubricants. The tests were designed following the GB 3142/82 standard, the Chinese equivalent to ASTM D-2783. GCr15 bearing steel balls having a diameter of 12.7 mm and a hardness varying from 59 to 61 HRC were chosen for the tests. The samples were tested at room temperature, at a rotational speed of 1450 rpm for 30 min. The impacts of the oil containing different concentrations of additive (0 wt%, 0.1 wt%, 0.3 wt, 0.5 wt%, 0.8 wt%, and 1.0 wt%) on the tribological properties were determined. Upon completion of the tests, the lower balls were cleaned with acetone for 5 min and then dried. A precision optical microscope (10 μm) was used to measure the wear scar diameter (WSD) of the lower balls. Morphologies of the wear scar were observed by using a VHE-1000 ultra depth of field microscope (Keyence, Osaka, Japan) in conjunction with the FEI INSPECT-F50 scanning electron microscope. The mean friction coefficients were calculated based on the data obtained during the tests, each repeated for three times. The increase of the oil mixture’s temperature after each test was recorded by the accompanying temperature monitoring system.
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2

Shear-Induced Platelet Morphology Analysis

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Scanning electron microscopy (SEM) images were obtained for platelets exposed to average peak shear stresses of 50, 150, 400, and 500 dyne/cm2 to analyze the role of repeated pathological shear stress exposure on shape change. Briefly, 150 μl of shear-exposed platelets were added to 150 μl of 2% v/v glutaraldehyde in platelet buffer and simultaneously placed onto 12 mm circular glass coverslips in a 24-well plate for 15 min. Excess solution was partially aspirated, leaving approximately 50 μl of the mixture. Coverslips were washed with 25%, 50%, 75%, and 100% of double-distilled H2O in 1% glutaraldehyde. The coverslips were then dehydrated through a graded series of 0%, 25%, 50%, 75%, and 100% ethanol in double-distilled H2O. Samples were stored in 100% ethanol until drying through a series of 25%, 50%, 75%, and 100% hexamethyldisiloxane (HMDS) in ethanol. Each preparation stage required 5 min immersion at room temperature. Coverslips were then mounted on double-sided carbon tape, allowed to air dry overnight, and then sputter-coated with islanded gold in an argon chamber. Images were obtained at 30 kV and 20,000× zoom using an Inspect F50 scanning electron microscope (FEI, Hillsboro, OR). Pseudopod numbers and lengths were obtained using ImageJ (NIH).
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3

Platelet Morphology SEM Preparation

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Aggregated or control (un-activated) platelets (150 µL) were added to 150 µL of 2% v/v glutaraldehyde in platelet buffer, pH 7.4 and simultaneously placed onto 12mm circular glass coverslips in 24-well plates for 15 minute. Excess solution was partially aspirated, leaving approximately 50 µL of mixture behind. Coverslips were washed with 25%, 50%, 75%, and 100% of double-distilled H2O in 1% glutaraldehyde. Coverslips were then dehydrated through a graded ethanol series of 0%, 25%, 50%, 75%, and 100% in double-distilled H2O. Samples were stored in 100% ethanol until critical point drying through a series of 25%, 50%, 75%, and 100% hexamethyldisiloxane (HMDS) in ethanol exposures. Each preparation stage required a 5 min immersion at room temperature. Coverslips were then mounted on double-sided carbon tape, allowed to air dry overnight, and then sputter-coated with islanded gold in an argon chamber. Samples were imaged at 15 kV with an aperture spot size of 3 by using an Inspect F50 scanning electron microscope (FEI, Hillsboro, OR) to identify platelet morphological changes, which represent platelet activation and platelet aggregation.
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4

Surface Morphology Analysis by SEM

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After the surface of the sample was subjected to gold spray treatment, the surface morphology of the material after degradation was observed by an Inspect F50 scanning electron microscope (FEI, Thermo Fisher Scientific Inc., Waltham, MA, USA).
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5

Chromium, Iron, and Water Quality Analysis

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The concentration of Cr(VI) was determined at a wavelength of 540 nm using a UV–Visible spectrophotometer (Q/TBCR1, Xinmao Instruments Co., Ltd., Shanghai, China) according to the standard of the Chinese Ministry of Environmental Protection (GB/T 7467-1987). Total chromium (TCr) was determined using the potassium permanganate oxidation-diphenylcarbonyldihydrazide spectrophotometric method (GB 7466-87). Total iron (TFe) was determined by the colorimetric method of o-phenanthroline (MT/T 368-2005). pH was determined by the electrode method (HJ 1147-2020). turbidity was determined by turbidimeter (HJ 1075-2019). COD was determined by fast-elimination spectrophotometry (HJ/T 399-2007). TEM was measured by JEOL JEM-2100F. Specific surface area and pore size were measured using Mack ASAP 2460. The surface structure of the samples was scanned using a FEI Inspect F50 scanning electron microscope. The physical phase analysis was determined by Rigaku Smartlab9 X-ray diffractometer.
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6

Fabrication and Characterization of Xerogels

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The hydrogel samples were prepared and then freeze-dried to form xerogels. The xerogel was attached to the silica wafer and coated with gold. SEM measurements were performed using an Inspect F50 scanning electron microscope (FEI, USA).
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7

Comprehensive Material Characterization

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A large number of samples were compositionally analysed by energy-dispersive X-ray spectroscopy (EDS) using an Inspect F-50 scanning electron microscope (FEI Company) and equipped with an INCA 350 detector (Oxford Instruments). Additionally, chemical analyses were performed by electron energy loss spectroscopy (EELS) in cross-sectional specimens by Scanning Transmission Electron Microscopy (STEM) in a Titan Low Base microscope (FEI Company). Annular dark field (ADF) images were obtained at 300 keV in STEM mode.
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8

Optical and Surface Characterization of Coated Glass

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The transparencies of the coated glass substrates were measured using a JASCO V-630 Double-beam UV-Vis Spectrophotometer. For the surface analysis, X-ray Photoelectron Spectroscopy (XPS) measurements were done using a VG ESCALAB 250 Spectrometer measured using an Al Kα source. The microstructural images were taken using an FEI Inspect F50 Scanning Electron Microscope.
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