Esem xl 30 feg
The ESEM XL 30 FEG is a field emission gun scanning electron microscope (SEM) designed for high-resolution imaging and analysis of a variety of samples. It features a field emission electron source, providing high-brightness, high-resolution electron beam for imaging and analysis applications.
Lab products found in correlation
22 protocols using esem xl 30 feg
Scanning Electron Microscopy of Bacterial Infection
Intestine Ultrastructure Analysis Protocol
Scanning Electron Microscopy of Bacterial Infection
Scanning Electron Microscopy of Bacteria-Infected HMEECs
SEM Imaging of Cancer Cell Samples
Ultrasonic Tip Topography Analysis
Characterization of Biodegradable Fibers
Electron Microscopy Sample Preparation
Osteoblast Morphology on BCP Granules
Graphene-Reinforced Alumina Coatings Synthesis
As the actual thickness of the coating consisted of a few atomic layers, no additional particle size distribution and true density analyses were performed for the coated aggregates. Instead, these were taken as direct replacement of the uncoated particle fraction in the reference batch. Nevertheless, the effectiveness of the coating procedure was investigated by scanning electron microscopy (SEM) (ESEM XL30FEG, FEI Company, Hillsboro, OR, USA).
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