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Xplora raman microspectrometer

Manufactured by Horiba
Sourced in France

The XploRA Raman microspectrometer is a versatile and high-performance analytical instrument designed for materials characterization. It provides precise Raman spectroscopy analysis of a wide range of samples, enabling the identification and quantification of molecular structures and chemical composition.

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3 protocols using xplora raman microspectrometer

1

Evaluating Cytotoxicity of LENA Nanoparticles

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PANC-1
cells were exposed to LENA IN PEG AuNPs and LENA@DOX IN PEG
AuNPs in complete media (DMEM + 10% FBS) at concentrations ranging
from 0 to 10 μM of LENA IN PEG AuNPs and LENA@DOX IN PEG AuNPs
for 48 h in 12-well plates. Untreated cells were also included in
the experimental design. The cells were successively washed and suspended
in complete media. Measurements for each sample were carried out in
triplicate. The optical images of the cells were recorded with the
optical microscope of an XploRA Raman microspectrometer (Horiba Scientific)
in bright and dark fields; 10× and 100× objectives were
used with numerical apertures of 0.25 and 0.9, respectively.
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2

Graphene Characterization by AFM and Raman

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Atomic Force Microscopy (AFM) measurements were performed with a SOLVER PRO from NT-MDT, RMS was evaluated by using Nova Px software. A Horiba Jobin-Yvon XploRA Raman microspectrometer, equipped with a 532-nm diode laser (∼50 mW laser power at the sample) was used. All measurements were acquired by using a × 100 long working distance objective (LMPLFLN, N.A. 0.8, Olympus). The spectrometer was calibrated to the 520.7 cm-1 line of silicon prior to spectral acquisition. A 2400 lines per mm grating was chosen. The spectra were dispersed onto a 16-bit dynamic range Peltier cooled CCD detector. The spectral range from 1100 to 3000 cm-1 was chosen and spectra were acquired for 3 × 10 s at each measurement spot. Chips were measured before and after PBASE functionalization. For each sample, 10 point/spectra were acquired, and a Raman map was acquired with the same parameters on squared areas (20 µm × 20 µm), with a step size of ∼3 µm, for a total number of 36 spectra. On each Raman map, the following values were calculated: intensity of the band centred at 2690 cm-1 (the 2D band), the intensity of the band at 1592 cm-1 (the G band), and the ratio between these two bands (I2D/IG). False colour images were built by using the I2D/IG ratio.
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3

Combined SERS and LSPR Spectroscopy

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Transmission spectra were obtained by using a Bruker Vertex 70 Fourier transform spectrometer (FTIR) with a diameter of the collimated polychromatic beam of 0.5 mm 2 . In order to perform combined SERS and LSPR experiments with a focused beam, an Xplora Raman microspectrometer (Horiba Scientific, France) with a ×100 objective (numerical aperture of 0.9) was used. On each substrate, several spectra were acquired on a square area of 200 × 200 µm with a distance between neighboring spots of 50 µm. In the case of LSPR measurements, the edge filter was removed and the transmission spectra were measured in the whole spectral range of 400-900 nm. Each spot was illuminated with a white lamp and the recorded spectra were normalized by that acquired on a reference area without the nanostructures. The transmitted light is collected from an area with a diameter of 3 µm defined by the hole of the confocal microscope. The SERS measurements were performed in the backscattering configuration at room temperature with the same lens and a laser beam at λ L = 785 nm focused at a spot 1 µm in diameter. The power of the laser beam at the spot was about 100 μW and the Raman spectrum was accumulated by 20 s and artefacts corresponding to cosmic rays were removed. The transmission spectra were analyzed in order to determine the spectral position and the width of the LSPR band.
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