Sylgard 527 gel
Sylgard 527 gel is a two-part silicone-based potting and encapsulating compound. It is designed for applications requiring low viscosity, high elasticity, and electrical insulation. The product offers good thermal stability and chemical resistance.
Lab products found in correlation
5 protocols using sylgard 527 gel
Engineered PDMS Substrates for Cell Culture
3D Printed Macropore-Mimetic Hemispheres for Tissue Engineering
Commercially available polydimethylsiloxane (PDMS), Sylgard 527 gel and Sylgard 184 elastomer (Dow Corning, Midland, MI, USA) were blended to match the mechanical properties of our PLLA scaffold materials. The ratio of Sylgard 184 to Sylgard 527 was 1:8, by weight [83 (link)]. The mixture was degassed in a desiccator and cast at room temperature, then cured for 24 h at 65 °C.
Prior to cell seeding, constructs were sterilized with ethylene oxide and 70% ethanol solution. Normal cell culture protocols were followed otherwise.
Tunable PDMS Substrates for Cell Studies
Fabrication of Soft PDMS Substrates
Fabrication of PDMS Substrates with Tunable Stiffness
Briefly, base liquid and curing agent of sylgard 184 gel were mixed at a mass ratio of 10:1, while the part A and B of sylgard 527 gel were mixed equally. Subsequently, these two gels were blended with varying mass percentage of sylgard 184 from 0 to 100. Once defoamed in a Thinky-Conditioning mixer (Thinky Corporation, Japan), PDMS was poured into tissue culture plates to create ~2-mm thick films. All substrates were cured at 100 o C for 4 h, followed by treatment with UV-Ozone cleaner (Novascan Technologies, Ames, IA, USA) for 30 min and immediately coating with 25 μg/ml fibronectin (FN) (Corning) for 2 h before use for cell culture. FN coating was confirmed by fluorescence microscopic imaging of Alexa Fluor® 647 mouse anti-FN (BD Biosciences, San Jose, CA). The Young's modulus of PDMS substrates was determined by uniaxial tensile testing using a Shimadzu universal tester (Shimadzu, Japan) as previously described (Zhang et al., 2014) (link). Substrate topography was examined using an atomic force microscope (AFM) of Scanning Near-field Optical Microscopy (SNOM, NTEGRA Solaris, NT-MDT, Russia) in tapping mode with a scan point size of 256 × 256 over an area of 5 μm × 5 μm.
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