Dektakxt surface profiler

The Fourier transformed
infrared spectroscopy (FTIR) test of SEBS, MA-g-SEBS,
and their nanocomposites were conducted on a Perkin-Elmer 1000 FTIR
spectrometer. Raman spectra were measured on a ThermoFisher/DXR. The
X-ray diffraction (XRD) measurement was carried out on a Rigaku D/Max
2550 (Cu Kα, λ = 1.5418 Å) with a 2θ scan configuration
in the range of 5°–40°. X-ray photoelectron spectroscopy
(XPS) experiment was performed on a Shimadzu-Kratos (AXIS Ultra).
Typical tapping-mode atomic force microscope (AFM) measurements were
taken on a SIINT NanoNavi E-Sweep, with which not only the single-layer
GO platelets were observed but also the microscopic surface roughness
of the hybrid films was measured. Macroscopic surface roughness of
the films was obtained from a Bruker DektakXT Surface Profiler. The
sandwich structure of the LBL assembled films was observed using a
JEOL JSM-7401F scanning electron microscope at an acceleration voltage
of 5 kV, and all the samples were fractured after immersion in liquid
nitrogen for a few minutes. Dynamic mechanical analysis (DMA) was
carried out using a NETZSCH DMA 242 C/1/G instrument. The tensile
tests were conducted on a MTS Criterion Model 43 universal testing
machine, with a crosshead speed of 500 mm/min at the temperature of
25 °C.

Steady-state photoabsorption spectra
were recorded using a Jasco V-570 UV–vis spectrophotometer.
The molecular weight (weight-averaged: M_w) and polydispersity index (PDI) of polymers were measured using
the size exclusion chromatography (gel permeation chromatography:
GPC, a Shimadzu Corp. LC-20AT/CBM-20A/CTO-20A/ SPD-M20A) with polystyrene
standards in hot chloroform (40 °C) as an eluent. Photoelectron
yield spectroscopy (PYS) of the polymer films on indium–tin–oxide
(ITO) glass was performed using Bunko Keiki BIP-KV2016K. 2D-GIXD experiments
were performed on the beam line BL46XU at the SPring-8 (12.39 keV,
λ = 1 Å X-ray). The 2D-GIXD patterns were monitored with
a 2D image detector (Pilatus 300 K). Atomic force microscopy (AFM)
was performed using a Bruker Innova AFM microscope. Differential scanning
calorimetry (DSC) was carried out using a Netzsch DSC204F1 Phoenix
differential scanning calorimeter under N₂ at 10 °C
min^–1 (sample weight ∼2 mg). Thicknesses
of the polymer and blend films were measured using a Bruker Dektak
XT surface profiler. Xe-flash time-resolved microwave conductivity
(TRMC) was performed for the polymer:PCBM films prepared on a quartz
substrate. The microwave frequency and excitation light were ∼9
GHz and a white light from a Xe-lamp (pulse width ∼ 10 μs).
The details are in the reference.^{70 (link)}