D8 discover xrd system

The structure of quercetin – para-aminobenzoic acid (QPABA) was determined using both ¹H and ¹³C NMR Bruker 600 MHz operated through Topspin 3.0 NMR software. UV-vis spectra of the resulting QPABA-based nanoparticle solutions were determined using Hewlett-Packard 8453 UV-vis spectrophotometer from 200 to 1000 nm. The samples for TEM analysis were prepped via drop-casting the samples of liquid aliquots on SiO₂-coated 300 mesh copper grids. The samples are dried thereafter. The nanoflowers' size and morphology were examined and analyzed using Axion Vision software version 4.8.2. TEM. A drop of the sample was added to the TEM grid and dried at room temperature for TEM imaging. The experiment was performed, and the images were recorded. The TEM images and size distribution measurements of AuNFs and AuNS were prepared. The XRD measurements for the samples were analyzed using a Bruker D8 Discover XRD system operating at 40 kV and 40 mA. The XRD samples were dissolved in ethanol and then mounted on sample holders for measurements. Furthermore, XRD patterns were obtained using an X-ray diffractometer (Bruker D8 Advance 800234-X-ray (9729), Germany) using Cu-Kα radiation (l ¼ 1.5178 A, 40 kV, and 40 mA). The 2-theta angle scanning range was from 5 to 80 with a scanning speed of 0.1 per second.

Attenuated total reflectance (ATR) FTIR spectra were acquired on a Thermo Scientific iS50 FTIR with ATR attachment. Absorption spectra were collected by obtaining 64 scans at autogain with a resolution of 2 cm⁻¹. X-ray diffractograms were obtained using a Bruker D8 Discover XRD system. Cu-Kα X-ray generator with a wavelength of 1.54184 Å at a voltage 40 kV and 40 mA current was used. Surface and morphological analyses were conducted using a Zeiss Ultra Plus field emission scanning electron microscope (FESEM) equipped with an energy dispersive X-ray detector for elemental analysis. Powder sample was dispersed in formic acid to obtain a 0.1% (w/w) suspension, which was spin coated on silicon wafer to make the surface fairly conductive without using gold/carbon sputtering. Secondary electron (SE) detector images were obtained to analyse the morphology of the nanoparticles obtained. Raman analysis was performed on a Renishaw Invia-Raman microscope by using either 532 or 785 nm laser sources. Ca/P atomic ratio was determined by XRF using a Bruker Tiger S8 instrument.