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Spc 130 em counting module

Manufactured by Becker & Hickl

The SPC-130-EM is a counting module for single photon counting applications. It features high-speed data acquisition and time-correlated single photon counting (TCSPC) functionality. The module provides fast, accurate, and reliable photon counting capabilities for a variety of scientific and industrial applications.

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4 protocols using spc 130 em counting module

1

Perovskite Nanocrystals Photoluminescence Decay

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These measurements
were performed using a time-correlated single photon counting system
equipped with the SPC-130-EM counting module (Becker & Hickl GmbH)
and an IDQ-ID-100-20-ULN avalanche photodiode (Quantique) for recording
the decay traces. Emissions from the perovskite NCs were excited by
using a BDL-488-SMN laser (Becker & Hickl) with a pulse duration
of 50 ps, a wavelength of 488 nm, and a CW power equivalent of ∼0.5
mW and were externally triggered at a repetition rate of 1 MHz. PL
emissions from the samples were passed through a long-pass optical
filter with an edge at 500 nm to reject the excitation laser line.
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2

Characterizing Lead Halide Perovskite Nanocrystal Photoluminescence

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TRPL spectra were characterized using a Hamamatsu Quantaurus-Tau (Q-Tau) fluorescence lifetime spectrometer (C11367-31) equipped with a photon counting measurement system. The ANCs thin film samples were exited at 470 nm pulsed emission with a repetition rate of 200 kHz and 10,000 counts. The excitation wavelength of 470 nm was chosen to avoid excitation of underneath HTL, X-F6-TAPC, and Poly-TPD. The PL decay curves of LHP ANCs on different surfaces were fitted using a biexponential decay model. The excitation power dependent PL lifetime measurements were performed using a time correlated single photon counting (TCSPC) setup, equipped with an SPC-130-EM counting module (Becker & Hickl GmbH) and an IDQ-ID-100-20-ULN avalanche photodiode (Quantique) for recording the decay traces. The samples were excited by 355 nm pulse laser with a maximum pulse intensity of 8.5 nJ cm−2 triggering a TCSPC counting module through an electronic delay generator (DG535 from Stanford Research Systems). The pulse laser intensity tuned between 0.1 and 100%.
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3

TRPL Measurements Using TCSPC Setup

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TRPL measurements were carried out using a time-correlated single photon counting (TCSPC) setup, equipped with an SPC-130-EM counting module (Becker & Hickl GmbH) and an IDQ-ID-100-20-ULN avalanche photodiode (Quantique), which was used to record the decay traces. To trigger emission from solid and liquid samples, they were excited by 355-nm (frequency-tripled emission of Nd:YAG laser Duetto Time-Bandwidth Products), 10-ps laser pulses with a repetition of 824 kHz and an intensity between approximately 0.05 and 5000 nJ cm−2 triggering the TCSPC module through an electronic delay generator (DG535 from Stanford Research Systems). The beam power was measured by Si photodiode sensor S120VC from Thorlabs. The beam profiles were recorded by a DP-M17 USB Digital Microscope from Conrad.
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4

Optical Characterization of Perovskite Nanocrystals

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UV-Vis absorption and reflection spectra of the NC films were collected using a Jasco V670 spectrometer equipped with an integrating sphere. Steady-state PL emission and excitation spectra were acquired with a Fluorolog iHR320 Horiba Jobin Yvon spectrofluorometer, equipped with Xe lamp and a photomultiplier tube (PMT) detector. PL lifetime measurements were performed using a time-correlated single-photon counting setup, equipped with SPC-130-EM counting module (Becker & Hickl GmbH) and an IDQ-ID-100-20-ULN avalanche photodiode (Quantique) for recording the decay traces. The emission of the perovskite NCs was excited by a 400-nm 100-fs laser pulses with a repetition of 1 kHz synchronized to time-correlated single-photon counting module through an electronic delay generator (DG535 from Stanford Research Systems). Transmission electron microscopy images were recorded using a JEOL JEM-2200FS microscope operated at 200 kV. For the thickness determination of the films, an AlphaStep D-120 profilometer was used.
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