Jsm 6480lv sem
The JSM-6480LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of a wide range of samples. The JSM-6480LV utilizes a tungsten electron source and offers a maximum magnification of up to 300,000x. It is equipped with secondary electron and backscattered electron detectors for imaging, as well as energy-dispersive X-ray (EDX) analysis capabilities.
Lab products found in correlation
6 protocols using jsm 6480lv sem
Insect Eye Ultrastructure Analysis
Nanostructure Characterization of Electrodes
Electrochemical Characterization of Au Electrodes
activated in 0.05 M H2SO4 by cycling the potential
from −0.5 to 1.6 V
versus Ag/AgCl for 12 cycles, at a scan rate of 100 mV s–1. The PCB Au electrodes were functionalized with a film of hPG to
increase the surface area. The hPG film was deposited via the dynamic
hydrogen bubbling template as previously described by our group.15 The ESA of both the Au and hPG/Au electrodes
was calculated from the reduction peak of gold oxide in sulfuric acid,
as previously described.25 (link)The Au
and hPG/Au electrodes were also characterized by scanning electron
microscopy (SEM) with the use of a JEOL JSM-6480LV SEM.
two electrodes.
Characterization of Iron Oxide Nanoparticles
Film Thickness Determination by SEM Imaging
Freeze-drying and SEM Imaging of Grass Blades
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