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Jsm 6480lv sem

Manufactured by JEOL

The JSM-6480LV is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging of a wide range of samples. The JSM-6480LV utilizes a tungsten electron source and offers a maximum magnification of up to 300,000x. It is equipped with secondary electron and backscattered electron detectors for imaging, as well as energy-dispersive X-ray (EDX) analysis capabilities.

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6 protocols using jsm 6480lv sem

1

Insect Eye Ultrastructure Analysis

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The corneal nipple arrays were studied using standard electron microscopy using eyes severed from heads of dead specimens. Eyes were dissected from insect heads and scales surrounding them were removed. Eyes were fractured in half with one half used for imaging the surface of the eye, the other for imaging a cross-section through a lens. Samples were mounted on SEM stubs using carbon tape and silver paint. The samples were sputter-coated with gold for surface imaging in a JEOL JSM6480LV SEM, or sputter coated with chromium for imaging in a JEOL JSM6310F FESEM.
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2

Nanostructure Characterization of Electrodes

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A Zeiss Ultra 55 Field Emission Scanning Electron Microscope (FESEM) and a JEOL JSM-6480LV SEM were used for the study of the electrodes’ nanostructure. X-ray Photoelectron spectroscopy was performed on samples as received and after 60–480 seconds of Argon-ion etching at 4KV (0.7 μA of current) using an Oxford AXIS ULTRA instrument. Raman spectrum of the DLEG sample for confirming the formation of graphene from the polyimide during the engraving process was obtained by using a DXR2 Raman spectrometer from Thermo Scientific with a laser power of 5 mW, at a laser excitation of 514.5 nm, and 2 seconds of integration time. Energy-Dispersive X-ray Spectroscopy (EDS) of the sensor was implemented by using X-Mass from Oxford Instruments. No additional processing steps were performed on the sensors before the characterizations.
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3

Electrochemical Characterization of Au Electrodes

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Prior to use, Au electrodes were
activated in 0.05 M H2SO4 by cycling the potential
from −0.5 to 1.6 V
versus Ag/AgCl for 12 cycles, at a scan rate of 100 mV s–1. The PCB Au electrodes were functionalized with a film of hPG to
increase the surface area. The hPG film was deposited via the dynamic
hydrogen bubbling template as previously described by our group.15 The ESA of both the Au and hPG/Au electrodes
was calculated from the reduction peak of gold oxide in sulfuric acid,
as previously described.25 (link)The Au
and hPG/Au electrodes were also characterized by scanning electron
microscopy (SEM) with the use of a JEOL JSM-6480LV SEM. Figure S1 shows the surface morphology of the
two electrodes.
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4

Characterization of Iron Oxide Nanoparticles

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Scanning electron microscopy (SEM) was used to determine the shape of the iron oxide nanoparticles according to the method described by Forough and Farhadi [16 ]. The synthesized nanoparticles were dispersed in double distilled water, and the resultant suspension was homogenized using an ultrasonicator for two hours. A drop of the nanoparticle's suspension was placed on a piece of microglass slide attached to a metal grid coated with carbon film and dried at room temperature. The sample was sputter coated with gold and visualized with a JEOL JSM-6480 LV SEM to assess the shape.
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5

Film Thickness Determination by SEM Imaging

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The film thickness has been determined from Scanning Electron Microscopy (SEM) images in cross section. The images have been collected by a JEOL JSM-6480LV SEM, operated at 20 kV. In order to prevent charging effects the samples have been metalized by depositing a 10 nm-thick gold film on the surface by sputtering in Ar atmosphere at a pressure of 10 1 mbar, with a Quorum Technologies- Emitech K550x sputter coater.
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6

Freeze-drying and SEM Imaging of Grass Blades

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Grass blades, either pre-or post-decellularization, were frozen at À80 C for 3 hr and lyophilized overnight using a Thermo Savant MicroModulyo-230 freeze dryer. Samples were then coated with a 50 nm layer of gold in an Edwards Sputter Coater S150B and imaged on a JEOL JSM-6480LV SEM.
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