X-ray diffraction (XRD, Bruker D8 Advance, CuKa radiation) was performed to investigate the phase composition. Scanning electron microscopy (SEM, Regulus 8100, 15 kV) and HRTEM (high-resolution transmission electron microscopy, FEI Tecnai G2 F20, 15 kV) were supplied to observe the micro-appearance and the distribution of element with an energy-dispersive X-ray spectroscopy (EDS). X-ray photoelectron spectroscopy (XPS, Escalab 250Xi) was used to explore the elemental composition on the surface and valence states. On the base of BET multipoint approach and BJH model, the pore distribution was characterized by N2 adsorption/desorption at 77 K (V-Sorb 2800P). Atomic force microscopy (AFM, Veeco Multimode V) was performed to measure material thickness at room temperature.
Regulus 8100
Manufactured by Thermo Fisher Scientific
Sourced in Japan
The Regulus 8100 is a high-performance scanning electron microscope (SEM) designed for advanced materials characterization. It features a field emission gun (FEG) electron source, providing high-resolution imaging capabilities. The Regulus 8100 is equipped with various detectors and analytical tools to enable comprehensive analysis of samples.
Automatically generated - may contain errors
Lab products found in correlation
Escalab 250, by Thermo Fisher Scientific (3 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (2 mentions)
D8 advance, by Bruker (2 mentions)
Tecnai g2 20, by Thermo Fisher Scientific (2 mentions)
Multimode 5, by Veeco (1 mentions)
Smartlab, by Rigaku (1 mentions)
D max 3, by Rigaku (1 mentions)
Fei tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Lambda 650 spectrometer, by PerkinElmer (1 mentions)
Nicolet is50 ftir spectrometer, by Thermo Fisher Scientific (1 mentions)
Agilent 7890b, by Agilent Technologies (1 mentions)
Talos f200, by Thermo Fisher Scientific (1 mentions)
Smartlab x ray diffractometer, by Rigaku (1 mentions)
Raman microscope, by Renishaw (1 mentions)
Asap 2020 nitrogen adsorption apparatus, by Micromeritics (1 mentions)
6 protocols using regulus 8100
1
Comprehensive Material Characterization
2
Comprehensive Material Characterization Protocol
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The morphology and microstructure were observed by SEM (Hitachi Regulus 8100, operated at 5 kV) and TEM (FEI Tecnai G2 20). The elemental distribution was collected by EDS mapping through SEM at an accelerating voltage of 15 kV. The crystal structure and phases were determined by XRD (Rigaku Smart Lab) at a wavelength of 1.5418 Å with copper Kα radiation. The specific surface area and pore size distribution were analyzed at a particulate ASAP2460 analyzer with BET calculation. The wettability of the electrolyte was measured by a contact angle (Theta) test. Elemental analysis was performed using XPS (Thermo Scientific K-Alpha). Thickness of material was measured by AFM (Bruker Dimension Icon).
3
Comprehensive Material Characterization Protocol
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The SEM and TEM (including HRTEM) images were carried out with a Hitachi Regulus 8100 and FEI Tecnai G2 20, respectively. The XRD pattern was observed on a Rigaku D/Max III diffractometer with Cu Kα radiation (λ = 1.5418 Å). The specific surface area and pore size distribution were measured with a Kubo-X1000 analyzer with the BET calculation. The contact angle test was completed by JY-82B Kruss DSA. The XPS results were obtained using a Thermo Scientific K-Alpha tester. TGA was performed using a NETZSCH ASAP2020 thermal analyzer under the protection of air gas.
4
Comprehensive Characterization of MgAl2O4 Nanomaterials
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The crystalline
phase of the as-synthesized products and the raw material were examined
by a X-ray diffractometer [Rigaku, SmartLab (3KW), Japan] with Cu
target and Ka radiation. The morphological characteristics of MgAl2O4 powders were characterized by SEM (Hitachi,
Regulus8100, Japan) and transmission electron microscopy (FEI, FEI
Tecnai G2 F20, America). Energy-dispersive X-ray spectroscopy (EDAX
Octane Elect, America) was used to observe the elemental distribution
of the samples. Fourier transform infrared spectra (FT-IR) of the
samples were recorded on a Nicolet iS50 FT-IR spectrometer (Thermo,
America) in the scan range of 4000 to 400 cm–1.
UV–vis diffused reflectance spectra (DRS) of samples were registered
on a Lambda 650 spectrometer (PerkinElmer, America) in the UV–vis
region of 200–800 nm. The photoluminescence (PL) measurements
were performed on an iHR320 spectrometer (Edinburgh Instruments, England)
at room temperature. The particle size was obtained from Mastersizer
2000 (Malvern, England).
Differential scanning calorimetry (DSC)
and thermogravimetric (TG) analysis (Mettler Toledo, Columbus, OH)
were used to determine the reactions of the alloy powder in air or
oxygen. Approximately 2.0 mg of the sample was heated at a rate of
20 °C/min from 50 to 1100 °C in a ceramic crucible. The
flow rate of the air or oxygen was kept at 50 mL/min.
phase of the as-synthesized products and the raw material were examined
by a X-ray diffractometer [Rigaku, SmartLab (3KW), Japan] with Cu
target and Ka radiation. The morphological characteristics of MgAl2O4 powders were characterized by SEM (Hitachi,
Regulus8100, Japan) and transmission electron microscopy (FEI, FEI
Tecnai G2 F20, America). Energy-dispersive X-ray spectroscopy (EDAX
Octane Elect, America) was used to observe the elemental distribution
of the samples. Fourier transform infrared spectra (FT-IR) of the
samples were recorded on a Nicolet iS50 FT-IR spectrometer (Thermo,
America) in the scan range of 4000 to 400 cm–1.
UV–vis diffused reflectance spectra (DRS) of samples were registered
on a Lambda 650 spectrometer (PerkinElmer, America) in the UV–vis
region of 200–800 nm. The photoluminescence (PL) measurements
were performed on an iHR320 spectrometer (Edinburgh Instruments, England)
at room temperature. The particle size was obtained from Mastersizer
2000 (Malvern, England).
Differential scanning calorimetry (DSC)
and thermogravimetric (TG) analysis (Mettler Toledo, Columbus, OH)
were used to determine the reactions of the alloy powder in air or
oxygen. Approximately 2.0 mg of the sample was heated at a rate of
20 °C/min from 50 to 1100 °C in a ceramic crucible. The
flow rate of the air or oxygen was kept at 50 mL/min.
5
Comprehensive Material Characterization
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The structure and morphology were observed using scanning electron microscopy (SEM, Regulus 8100) and high-resolution transmission electron microscopy (HRTEM, FEI Tecnai G2 F20). The in-situ Raman spectra were collected by RENISHAW at an excitation wavelength of 633 nm. X-ray diffraction (XRD) data obtained from Bruker D8 Advance equipment was used to analyze the crystal structure. X-ray photoelectron spectrometer (XPS) with Al Kα X-rays was performed to study the surface composition of the samples. Bruker ENX-500 device was used to measure electron paramagnetic resonance (EPR) data. The Brunauer-Emmetand-Teller (BET) surface area was determined using the instrument V-Sorb 2008P. X-ray absorption fine structure spectra were measured under room temperature using the transmission mode of the XAFCA beamline in the Singapore Synchrotron Light Source. Extended X-ray absorption fine structure data were interpreted utilizing WINXAS 3.1 code, where it was normalized and then transformed to momentum space (k) from the initial energy space. The chemical states of the materials were studied by X-ray photoelectron spectroscopy (Thermo ESCALAB 250). The water contact angle was measured using a contact angle analyzer (DO4010 Easy drop, KRUSS), dropping 10 μL of water droplets from a height of 2.8 cm. The contact angle was recorded when the elapsed time after the water drop reached 1 min.
6
Comprehensive Characterization of Materials
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X-ray diffraction (XRD) patterns were collected by a SmartLab X-ray diffractometer (Cu Kα, Rigaku, Japan). Raman spectra were acquired using a confocal Raman microscope (inVia™, Renishaw, UK) with 532 nm laser excitation. Morphology and nanostructure were characterized by a field emission scanning electron microscopy (FESEM, Regulus8100, Japan) and a high-resolution transmission electron microscopy (HR-TEM, FEI Talos-F200S, USA). The chemical states were analyzed by an X-ray photoelectron spectroscopy (XPS, Thermo Fisher Scientific, USA) technique. Nitrogen adsorption and desorption isotherms were measured by a Micromeritics Instruments ASAP 2020 nitrogen adsorption apparatus. The Barrett–Joyner–Halenda (BJH) method was utilized to determine the pore size distribution. The component analysis of as-prepared solution was detected by the gas chromatography-mass spectrometry (GC-MS, Agilent 7890B, USA).
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