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The surface morphologies of GO and SMOFs were investigated using a field emission SEM (LEO 1530 VP) operating at 10.0 kV for imaging. Before SEM imaging, all samples were coated with a layer of AuPd (<1 nm). Surface morphology and thickness of GO nanosheets were also characterized by AFM (Asylum MFP-3D Origin) operating in alternating contact mode. TEM and SAED were performed using a JEOL 2100F TEM/STEM at an acceleration voltage of 200 kV, equipped with an energy dispersive X-ray spectrometer for elemental analysis. All samples were suspended in ethanol for 30 min of sonication, then dropped on lacey carbon grids for observation. TGA were carried out on a METTLER TOLEDO TGA/DSC 1 STARe system, with heating rate of 10 °C min⁻¹, air flow of 80 mL min⁻¹, and sample mass of ∼1 mg. The compositions and phases of as-prepared metal oxide products were identified by XRD on a Bruker D8 Discovery 2D X-ray Diffractometer with Cu Kα radiation (λ = 1.5418 Å). Magnetic measurements were carried out using a Quantum Design® Physical Property Measurement System (PPMS).