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Prestige 2 spectrometer

Manufactured by Shimadzu

The PRESTIGE-2 is a Fourier Transform Infrared (FT-IR) spectrometer manufactured by Shimadzu. It is a versatile analytical instrument used for the identification and characterization of a wide range of materials, including organic and inorganic compounds. The PRESTIGE-2 utilizes infrared radiation to obtain detailed information about the molecular structure and composition of samples, enabling researchers and analysts to gather valuable data for various applications.

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2 protocols using prestige 2 spectrometer

1

Characterization of rGO/Fe3O4 Nanocomposites

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The UV-visible absorption spectra were recorded using a (UNICAM UV 500, Thermo Electron Corporation) spectrophotometer in the range of 200–800 nm. FT-IR spectrum was recorded over the range of 4000–400 cm−1 using a SHIMADZU-IR PRESTIGE-2 spectrometer. Raman spectrum was obtained using FT-Raman spectroscopy (Bruker RFS 27, USA) with laser source Nd (YAG 1064 nm) at 2 cm−1 resolution. 16+ mW laser power was irradiated on rGO/Fe3O4 NCs to collect Raman spectrum over the wide range 4000–50 cm−1. XRD patterns were recorded by PANalytical X'pert pro diffractometer at 0.02 degree per sec scan rate using Cu Kα1 radiation (λ = 1.5406 Å, 45 kV, 40 mA). TEM images were acquired through (TEM model FEI TECNAI G2 S-Twin) at an accelerating voltage of 200 kV. The morphology of the sample was characterized using FE-SEM (FE-SEM, Zeiss Ultra-60) equipped with EDX. VSM was used to examine the magnetic property of rGO/Fe3O4 NCs (Lakeshore Cryotronics, Inc., Idea-VSM, model 7410, USA).
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2

Characterization of ZnO Nanostructures

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Optical properties were analyzed using UV-Vis spectrophotometers (UV-2600 SHIMADZU) and (UV-500, Thermo Electron Corporation) in the wavelength range of 200–800 nm. FT-IR spectra were recorded over the range of 4000–400 cm−1 using a SHIMADZU-IR PRESTIGE-2 spectrometer. Powder XRD patterns were recorded on a PANalytical X'pert Pro diffractometer at 0.02 degree per second scan rate using CuKα1 radiation (λ = 1.5406 Å). The morphology and elemental composition were characterized using FE-SEM (JEOL, JSM-7600F) at an accelerating voltage of 0.1 to 30 kV, equipped with EDX. The size and shape of the ZnO nanostructures were investigated by TEM (TEM model FEI TECNAI G2 S-Twin).
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