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High resolution transmission electron microscope

Manufactured by JEOL
Sourced in Japan

The JEOL high-resolution transmission electron microscope (HRTEM) is a powerful tool that enables the observation and analysis of materials at the atomic scale. It utilizes a focused electron beam to produce high-resolution images of samples, providing detailed information about their internal structure and composition.

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3 protocols using high resolution transmission electron microscope

1

Synthesis and Characterization of Green ZnO Nanoparticles

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The leaves extracts (50 g/l) were mixed to 5 g/l of zinc acetate in a conical flask and very well shacked. After 30 min, the reaction mixture was heated overnight at 60°C, and the ZnO NPs powder is obtained.
A measurement of synthesized gZnNPs was done by using a high-resolution transmission electron microscope (JEOL Inc., Tokyo, Japan) at an accelerating voltage 120 kV. The size of gZnNPs in water and culture medium were determined by DLS (Nano-Zeta Sizer-HT, Malvern, UK) as described by Alarifi et al. [9 (link)]. We have used 35 μg/ml for DLS measurement because this is the maximum treatment concentration used to evaluate cell viability.
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2

Transmission Electron Microscopy of Hippocampus DG

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To perform transmission electron microscopy, 1 mm3 hippocampus DG region tissues were fixed overnight in electron microscope fixation solution (Servicebio, China) and dehydrated with 1% osmium tetroxide (v/v) for 2 h. After acetone penetration, the tissues were stained with 4.8% uranyl acetate, rinsed, and sliced with a lead-uranium double dyed copper mesh. The microphotographs were acquired using a high-resolution transmission electron microscope (JEOL, Japan).
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3

Comprehensive Material Characterization

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Field emission scanning electron microscope (FEI, Hillsboro, OR, USA) and high-resolution transmission electron microscope (JEOL, Tokyo, Japan)were applied to observe the modified material. Raman spectroscopy (Renishaw PLC, Wotton-under-Edge, UK) with a laser wavelength of 532 nm and X-ray photoelectron spectroscopy (XPS, Kratos Analytical, Manchester, UK) were used to characterize the chemical compositions and element chemical states. All the electrochemical experiments were carried out by a CHI660e electrochemical workstation (Shanghai Chenhua, Shanghai, China).
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