Low-angle X-ray diffraction (XRD) investigation was carried out in the low-angle range (2θ = 0.5° to 6°) utilizing a Bruker AXN analyzer. N2 sorption analysis was performed by using the Nova 4000e surface area instrument. Fourier transform infrared (FTIR; JASCO FTIR 4100) spectra with a frequency ranging from 4000 to 400 cm−1, were recorded using the KBr pellet technique. The surface morphology was studied by scanning electron microscopy (SEM, S4800). Transmission electron microscopy (TEM) images were collected on a JEOL 2010 operating at an acceleration voltage of 200 kV. Scanning electron microscopy (SEM) images were recorded with a JEOL 6400 microscope operating at 20 kV. Thermogravimetric analysis (TGA) was performed on a Perkin-Elmer Pyris Diamond thermogravimetric analyzer with a heating rate of 10 °C/min under N2 atm. Particle size and zeta potential measurements were performed on the Malvern Zetasizer Nano-ZS. UV-vis spectral analysis was performed using an Agilent Inc. UV-Vis spectrophotometer.
Pyris diamond thermogravimetric analyzer
Manufactured by PerkinElmer
Sourced in United States
The Pyris Diamond thermogravimetric analyzer is a laboratory instrument used to measure the change in the mass of a sample as a function of temperature or time. It provides data on the thermal stability and composition of materials by precisely tracking weight changes during controlled heating or cooling in a controlled atmosphere.
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Lab products found in correlation
Nicolet 6700, by Thermo Fisher Scientific (3 mentions)
Ft ir 4100, by Jasco (2 mentions)
Zetasizer nano z, by Malvern Panalytical (1 mentions)
Uv vis spectrophotometer, by Agilent Technologies (1 mentions)
Tcs sp2 fluorescence microscope, by Leica (1 mentions)
Malvern zetasizer nano z, by Malvern Panalytical (1 mentions)
Tecnai g2 f20 s twin, by Thermo Fisher Scientific (1 mentions)
Su8010, by Hitachi (1 mentions)
5 protocols using pyris diamond thermogravimetric analyzer
1
Comprehensive Characterization of Materials
2
Comprehensive Nanomaterial Characterization Protocol
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X-ray diffraction (XRD) pattern was recorded on a Bruker AXN X-ray diffractometer using Cu Kα radiation (λ = 1.5418 Å). Images of scanning electron microscopy (SEM) were obtained using a JEOL 6400 microscope set to 20 kV. Fourier transform infrared (FTIR) spectra were obtained using the KBr pellet technique on a JASCO FTIR 4100 apparatus at 5000 psi hydraulic pressure. Field emission transmission electron microscopy (FETEM, JEOL 2010) images were obtained at an accelerating voltage of 200 kV. A Nova 4000 e surface area analyzer was used to perform N2 adsorption-desorption studies. The Barrett–Joyner–Halenda (BJH) technique was used to calculate the pore size from the adsorption branch. On a Malvern Zetasizer Nano-ZS (Malvern Instruments), the surface charge and particle size in suspension were measured. Thermogravimetric analysis (TGA) was performed on a Perkin-Elmer Pyris Diamond thermogravimetric analyzer with a heating rate of 10 °C/min under N2 atmosphere. Images of fluorescence microscopy were captured using a Leica (TCS-SP2) fluorescence microscope.
3
Thermogravimetric Analysis of Samples
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Thermogravimetric analyses were carried out with a Perkin-Elmer Pyris Diamond thermogravimetric analyzer (TGA/DTA), equipped with a gas station. An amount of 3–4 mg of each sample was placed in an open ceramic crucible and heated from 30 °C up to 600 °C at a rate of 10 °C/min, under nitrogen at 30 mL/min.
4
Comprehensive Characterization of Functionalized Silica Nanoparticles
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The morphological and structural characteristics of FL-SiO2 NPs were determined by transmission and scanning electron microscopy (TEM, Tecnai G2, F20 S-TWIN, FEI, Hillsboro, OR, USA, accelerated at 200 kV and SEM, SU8010, Hitachi Ltd., Tokyo, Japan, operated at 10 kV voltages).
Spectrophotometer NICOLET 6700 (Thermo Scientific, Waltham, MA, USA) was used to analyze the Fourier transform infrared (FTIR) of methoxyfenozide, FL-SiO2 NPs, and Me@FL-SiO2 NPs using potassium bromide pellets within spectral regions of 4000–400 cm−1.
Thermogravimetric analysis (TGA) was performed on a Perkin Elmer Pyris Diamond thermogravimetric analyzer (Woodland, CA, USA) within a 20 °C to 550 °C temperature range in the presence of a N2 atmosphere.
The particular characteristics such as pore size and surface areas of the samples were measured by the nitrogen adsorption using pore size and a specific surface area analyzer (TriStarII 3020, Micromeritics Instruments Crop, Norcross, GA, USA) at −196 °C. The specific surface area was determined using equation of Brunauer–Emmett–Teller (BET) [34 (link)], while the pore size was calculated from the Barrett–Joyner–Halenda (BJH) [35 (link)] model using the adsorption data of isotherms.
Spectrophotometer NICOLET 6700 (Thermo Scientific, Waltham, MA, USA) was used to analyze the Fourier transform infrared (FTIR) of methoxyfenozide, FL-SiO2 NPs, and Me@FL-SiO2 NPs using potassium bromide pellets within spectral regions of 4000–400 cm−1.
Thermogravimetric analysis (TGA) was performed on a Perkin Elmer Pyris Diamond thermogravimetric analyzer (Woodland, CA, USA) within a 20 °C to 550 °C temperature range in the presence of a N2 atmosphere.
The particular characteristics such as pore size and surface areas of the samples were measured by the nitrogen adsorption using pore size and a specific surface area analyzer (TriStarII 3020, Micromeritics Instruments Crop, Norcross, GA, USA) at −196 °C. The specific surface area was determined using equation of Brunauer–Emmett–Teller (BET) [34 (link)], while the pore size was calculated from the Barrett–Joyner–Halenda (BJH) [35 (link)] model using the adsorption data of isotherms.
5
Thermogravimetric Analysis of Samples
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TGA analyses were conducted using a Pyris Diamond Thermogravimetric analyzer (Perkin Elmer, Waltham, MA, USA). The samples (3 mg) were heated from 25 to 800 • C at the rate of 10 • C/min under a nitrogen atmosphere.
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