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Spectrum bx ftir spectroscope

Manufactured by PerkinElmer
Sourced in United States

The Spectrum BX FTIR spectroscope is a Fourier-transform infrared (FTIR) spectroscopy instrument designed for analytical applications. It measures the absorption and emission of infrared radiation by materials, providing information about their molecular composition and structure.

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2 protocols using spectrum bx ftir spectroscope

1

Characterization of QDs Nanocomposites

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Fourier transform infrared spectra (FTIR) were recorded with a Spectrum BX FTIR spectroscope (PerkinElmer, Waltham, MA, USA). The morphology of TGA-capped CdTe QDs and hybrid MIP-coated QDs nanocomposites were observed with a JEM-2010 transmission electron microscope (TEM) (JEOL, Tokyo, Japan) and by scanning electron microscopy (JSM-5200, JEOL, Tokyo, Japan). UV spectra were recorded on an Avaspec 2048 spectrometer (Avantes, Apeldoorn, The Netherlands). Fluorescence intensity was measured using a RF-5310 spectrofluorometer (Shimadzu, Tokyo, Japan). BET surface areas of hybrid MIP-coated QDs and NIP-coated QDs were determined using a ASAP2460 (Micromeritics, USA).
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2

Comprehensive Spectroscopic Characterization

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Fluorescence spectra were recorded using a RF-5301 spectrofluorometer (Shimadzu, Tokyo, Japan). An Avaspec 2048 spectrometer (Apeldoorn, The Netherlands) was used to record ultraviolet-visible absorption spectra and Fourier transform infrared (FT-IR) spectra were obtained using a Spectrum BX FTIR spectroscope (PerkinElmer, Waltham, MA, USA) on solid samples dispersed within KBr discs. Scanning electron microscope (SEM) images were obtained using a JSM-5200 microscope (JEOL, Tokyo, Japan). Transmission electron micrograph (TEM) images were obtained using a JEM-2010 microscope (JEOL, Tokyo, Japan). The surface areas were measured with an ASAP 2460 surface area and porosity analyzer (Micromeritics, Norcross, USA).
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