IRC and IFRC powdered samples were spread evenly on a 2 cm circular aluminium stud with double-sided sticky tape and sputter-coated with gold using sputter coater SCD 005 (BAL-TEC, Pfäffikon, Switzerland). Then, the surface morphology of samples was examined and photographed using a field emission scanning electron microscope, (FESEM) Supra 40VP (ZEISS, Oberkochen, Germany), at an accelerating voltage of 5 kV [33 (link)].
Fesem supra 40vp
Manufactured by Zeiss
Sourced in Germany
The FeSEM SUPRA 40VP is a field emission scanning electron microscope (FE-SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging of a wide range of samples. The FeSEM SUPRA 40VP utilizes a field emission electron source to generate a focused electron beam that interacts with the sample surface, producing signals that can be detected and used to create detailed images.
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Lab products found in correlation
5 protocols using fesem supra 40vp
1
Scanning Electron Microscopy of Powdered Samples
2
SEM Imaging of EMF-Exposed PC 12 Cells
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The scanning electron microscope FeSEM SUPRA 40VP (Carl Zeiss, Jena, Germany) with a primary beam energy of 3 kV was used. A 100 µl aliquot of cells in PBS was placed on a glass coverslip (ProSciTech, Kirwan, Australia) in duplicate. The glass coverslips were then washed with nanopure H2O (resistivity of 18.2 MW cm−1) and dried with 99.99% purity nitrogen gas. The PC 12 cells exposed to EMF of 18 GHz were fixed in a mixture of 2.0% paraformaldehyde and 2.5% glutaraldehyde for 30 min. The cells were then dehydrated by passing through a graded ethanol series (20%, 40%, 60%, 80% and 100%) for 15 min. Before imaging, the fixed cells were subjected to gold sputtering (7 nm thick) using a NeoCoater MP-19020NCTR (JEOL, Tokyo, Japan). The same procedure was applied to controls, non-exposed PC 12 cells.
3
SEM Imaging of THz-Exposed PC12 Cells
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The scanning electron microscope FeSEM SUPRA 40VP (Carl Zeiss, Jena, Germany) with a primary beam energy of 3 kV was used. A 100 µL aliquot of cells in PBS were placed on a glass cover slip (ProSciTech, Kirwan, Australia) in duplicate. The glass cover slips were then washed with nanopure H2O (resistivity of 18.2 MW cm−1) and dried with 99.99% purity nitrogen gas. The PC 12 cells exposed to 10 min of SS THz radiation were fixed in a cocktail of 2.0% paraformaldehyde and 2.5% glutaraldehyde for 30 min. The cells were then dehydrated by passing through a graded ethanol series (20%, 40%, 60%, 80% and 100%) for 15 min. Before imaging, the fixed cells were subjected to gold sputtering (7 nm thick) using a NeoCoater MP-19020NCTR (Jeol, Tokyo, Japan). The same procedure was applied to non-treated PC 12 cells.
4
Imaging Microbial Cells with FeSEM
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A field emission scanning electron microscope FeSEM–SUPRA 40VP (Carl Zeiss, Jena, Germany) with a primary beam energy of 3 kV was used to obtain high-resolution images of the cell samples. A 100 μL aliquot of EMF-exposed suspension was placed on a glass cover slip (ProSciTech, Kirwan, Australia) in duplicate for each EMF exposure experiment. After 20 min, the glass cover slips were washed with nanopure H2O (with a resistivity of 18.2 MΩ cm-1), dried with 99.99% purity nitrogen gas, then subjected to gold sputtering (6 nm thick gold film) using a NeoCoater MP-19020NCTR (JEOL, Frenchs Forest, Australia). Approximately ten SEM images were obtained at 5,000× (yeast) and 70,000× (bacteria) magnifications for subsequent analysis.
5
Ultrastructural Analysis of EMF-Exposed Cells
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A scanning electron microscope, FeSEM SUPRA 40VP (Carl Zeiss Meditec AG, Jena, Germany), with a primary beam energy of 3 kV was used. A 100-µL aliquot of cells in PBS was placed on a glass cover slip (ProSciTech, Kirwan, Australia) in duplicate. The glass cover slips were then washed with nanopure H2O (resistivity of 18.2 MW/cm) and dried with 99.99% purity nitrogen gas. The PC 12 cells exposed to EMF of 18 GHz were fixed in a cocktail of 4.0% paraformaldehyde and 2.5% glutaraldehyde for 30 minutes. The cells were then dehydrated by passing through a graded ethanol series (20%, 40%, 60%, 80%, and 100%) for 15 minutes. Before imaging, the fixed cells were subjected to gold sputtering (6 nm thick) using a NeoCoater MP-19020NCTR (JEOL). The same procedure was applied to non-treated and heat-treated PC 12 cells. Scanning electron microscopy (SEM) images (10) of different magnifications were captured and analyzed.
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