Evo 40xvp
The EVO 40XVP is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It is a versatile instrument that provides high-resolution imaging and analytical capabilities for a wide range of materials and applications. The EVO 40XVP is equipped with a tungsten filament electron source and offers a range of imaging modes, including secondary electron, backscattered electron, and variable pressure imaging.
Lab products found in correlation
25 protocols using evo 40xvp
Morphological Analysis of Lyophilized HA and HA-Arg
Scanning Electron Microscopy of HA Samples
Morphological Analysis of HA and HA-CL MS
Characterizing Particulate Matter Morphology
Microstructural and Rheological Analysis
The crystal structure of the samples was analyzed by X-ray diffractometry (XRD), for which a DRON-4-07 X-ray Diffractometer (Bourevestnik JSC, Saint Petersburg, Russia) was used. Irradiating lamps with a copper anode and Ni-filter were used. The studies were carried out in the range of 2Θ from 4 to 360°.
The melt flow index (MFI) was obtained on the device IIRT-AM (ASMA-Pribor, Svitlovodsk, Ukraine) at a temperature of 190 °C and load of 5 kg.
Microscopic Examination of Insect Elytra
Scanning Electron Microscopy of Bacterial Cells
Hydrogel 3D Structure and Porosity Analysis
SEM Analysis of Fiber Morphology
Microscopic Analysis of ZnO NPs and Biopolymer Films
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