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Evo 40 xvp sem

Manufactured by Zeiss
Sourced in Germany

The EVO-40 XVP SEM is a scanning electron microscope (SEM) designed and manufactured by Zeiss. It is a versatile instrument capable of high-resolution imaging and analysis of a wide range of materials and samples. The EVO-40 XVP SEM is equipped with various advanced features and functionalities to support diverse research and industrial applications.

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2 protocols using evo 40 xvp sem

1

Stomatal Aperture and Trichome Analysis

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Fresh leaf samples were obtained and prepared for scanning electron microscopy (SEM) to observe the stomatal aperture and trichome morphology. The leaf samples were exposed to sunlight for 30 min and then frozen at −45 °C and lyophilized by a Freeze Dryer LZ-9 “Frigera Ltd.,” Brno–Chernivice, (Czech Republic). The adaxial surface was sprayed with a gold/palladium target using a Mini Sputter Coater SC7620 vacuum deposition unit (Quorum Technologies, Laughton, East Sussex, UK) with a 30 s spraying mode at 18 mA. The samples were analyzed using an EVO-40 XVP SEM, Carl Zeiss, Oberkochen, Germany at an accelerating voltage of 10–15 kV. The stomatal density was counted by encircling the similar area of all the samples and presented as average. The stomatal openings and trichome areas were measured by ImageJ software.
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2

Composite Membrane Surface Morphology

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Scanning Electron Microscopy (SEM) of the composite membranes was performed to examine the surface morphology by using ZEISS EVO 40XVP SEM (Oberkochen, Baden-Württemberg, Germany). It is a variable pressure scanning electron microscope (VP-SEM). The microscope is suitable for a general-purpose microstructural analysis at high vacuuming.
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