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Sem 1530

Manufactured by Zeiss

The SEM Zeiss 1530 is a scanning electron microscope designed for high-resolution imaging and analysis of a wide range of samples. It features a field emission gun for enhanced electron beam performance and advanced detector systems for capturing detailed surface information.

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Lab products found in correlation

2 protocols using sem 1530

1

Morphological Analysis of Composite Nanoparticles

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Scanning electron microscopy (SEM) was used to visualize the composites nanoparticles and investigate their morphology. SEM images were taken using a Zeiss LEO Supra 55VP Field Emission and SEM Zeiss 1530. For sample preparation, composite nanoparticle suspensions were diluted 10 times with their dispersion medium, and then, a drop of the diluted nanoparticle suspension was directly deposited on a polished aluminum sample holder. Samples were dried under a vacuum. Samples were then coated in gold using EMITECH K450X sputter coater48 (link).
On the other hand, the investigation of the surface morphology was performed on the aged un-treated, treated, and aged treated dyed paper samples by scanning electron microscope (SEM) in order to examine the changes in the surface morphology of the treated samples before and after artificial accelerated thermal aging and to evaluate the changes in the paper fibers which occurred as a result of the accelerated artificial aging process.
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2

TEM and SEM Imaging of Nanoparticle Dispersions

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TEM images were obtained using
a TEM Zeiss CEM 902 (Carl Zeiss AG) with an accelerating voltage of
80 kV. SEM images were obtained using a SEM Zeiss 1530 (Carl Zeiss
AG) equipped with a field-emission cathode with an operating voltage
of 3 kV. Samples were prepared by spin-coating (2000 rpm, 30 s) of
the NP dispersions on silicon wafers (Sigma-Aldrich), cleaned with
Milli-Q water before use, and mounted on SEM aluminum pin stubs (Plano
GmbH).
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