Quanta 600 feg sem
The Quanta 600 FEG SEM is a field emission scanning electron microscope (FEG SEM) designed for high-resolution imaging and analysis of a wide range of materials. It features a Schottky field emission gun that provides a stable, high-brightness electron beam for enhanced resolution and contrast. The Quanta 600 FEG SEM is capable of operating under high-vacuum, low-vacuum, and environmental SEM (ESEM) conditions, making it suitable for examining both conductive and non-conductive samples.
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7 protocols using quanta 600 feg sem
Cuticle Structure Changes in C. elegans
Characterizing VPP Polymer Films
SERS Analysis of Diatomaceous Earth Plates
Nanoparticle Characterization by UV-Vis, SEM, and Raman
Quantifying Mineral Composition by SEM
Multimodal Characterization of Diatoms
Bacterial Sample Preparation for SEM
prepared with deionised water. Then the samples were dried in a critical point dryer (Balzers 030 Critical Point Dryer) and coated with a thin layer of gold (Edwards S150B Sputter Coater). The scanning electron micrographs were obtained using a FEI Quanta 600 FEG SEM equipped with the xTm user interface (version 2.4).
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